{"id":"https://openalex.org/W2118665578","doi":"https://doi.org/10.1109/tse.2002.1041055","title":"Better reliability assessment and prediction through data clustering","display_name":"Better reliability assessment and prediction through data clustering","publication_year":2002,"publication_date":"2002-10-01","ids":{"openalex":"https://openalex.org/W2118665578","doi":"https://doi.org/10.1109/tse.2002.1041055","mag":"2118665578"},"language":"en","primary_location":{"id":"doi:10.1109/tse.2002.1041055","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tse.2002.1041055","pdf_url":null,"source":{"id":"https://openalex.org/S8351582","display_name":"IEEE Transactions on Software Engineering","issn_l":"0098-5589","issn":["0098-5589","1939-3520","2326-3881"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Software Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103047392","display_name":"Jie Tian","orcid":"https://orcid.org/0000-0002-2736-6227"},"institutions":[{"id":"https://openalex.org/I178169726","display_name":"Southern Methodist University","ror":"https://ror.org/042tdr378","country_code":"US","type":"education","lineage":["https://openalex.org/I178169726"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"J. Tian","raw_affiliation_strings":["Department of Computer Science and Engineering, Southern Methodist University, Dallas, TX, USA","[Dept. of Comput. Sci. & Eng., Southern Methodist Univ., Dallas, TX, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Southern Methodist University, Dallas, TX, USA","institution_ids":["https://openalex.org/I178169726"]},{"raw_affiliation_string":"[Dept. of Comput. Sci. & Eng., Southern Methodist Univ., Dallas, TX, USA]","institution_ids":["https://openalex.org/I178169726"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5103047392"],"corresponding_institution_ids":["https://openalex.org/I178169726"],"apc_list":null,"apc_paid":null,"fwci":0.6321,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.68239437,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"28","issue":"10","first_page":"997","last_page":"1007"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9830999970436096,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7981657385826111},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6506071090698242},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.64417964220047},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.5060598254203796},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.4919399917125702},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.48796290159225464},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.4697936773300171},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4687633216381073},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.4196709394454956},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.2312820851802826},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.22238299250602722},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.07843348383903503}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7981657385826111},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6506071090698242},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.64417964220047},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5060598254203796},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.4919399917125702},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.48796290159225464},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.4697936773300171},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4687633216381073},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.4196709394454956},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.2312820851802826},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.22238299250602722},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.07843348383903503},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tse.2002.1041055","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tse.2002.1041055","pdf_url":null,"source":{"id":"https://openalex.org/S8351582","display_name":"IEEE Transactions on Software Engineering","issn_l":"0098-5589","issn":["0098-5589","1939-3520","2326-3881"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Software Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W124052719","https://openalex.org/W1511579434","https://openalex.org/W1544461401","https://openalex.org/W1554758995","https://openalex.org/W1783557462","https://openalex.org/W1975372980","https://openalex.org/W1980595883","https://openalex.org/W1993855671","https://openalex.org/W2018136058","https://openalex.org/W2036138637","https://openalex.org/W2061464740","https://openalex.org/W2105654718","https://openalex.org/W2117039703","https://openalex.org/W2136326323","https://openalex.org/W2143372503","https://openalex.org/W2152433792","https://openalex.org/W2162553153","https://openalex.org/W2168479209","https://openalex.org/W2171242934","https://openalex.org/W2314788995","https://openalex.org/W2611599402","https://openalex.org/W2611912525","https://openalex.org/W2767396501","https://openalex.org/W2913964471","https://openalex.org/W3005169049","https://openalex.org/W4251822976","https://openalex.org/W4254700318","https://openalex.org/W6684845054","https://openalex.org/W6759203923"],"related_works":["https://openalex.org/W1521772560","https://openalex.org/W3115616613","https://openalex.org/W4243433089","https://openalex.org/W2094857701","https://openalex.org/W1527244756","https://openalex.org/W1842066208","https://openalex.org/W1988771990","https://openalex.org/W860459550","https://openalex.org/W2092089120","https://openalex.org/W2157631060"],"abstract_inverted_index":{"This":[0,19],"paper":[1],"presents":[2],"a":[3,34],"new":[4],"approach":[5],"to":[6,64,68,94],"software":[7,59,85],"reliability":[8,39,60,71,111],"modeling":[9],"by":[10],"grouping":[11],"data":[12,22,67],"into":[13],"clusters":[14,23],"of":[15,21,82],"homogeneous":[16],"failure":[17],"intensities.":[18],"series":[20],"associated":[24],"with":[25,90],"different":[26],"time":[27,104],"segments":[28],"can":[29,45],"be":[30],"directly":[31],"used":[32],"as":[33],"piecewise":[35],"linear":[36],"model":[37,56],"for":[38],"assessment":[40],"and":[41,73,105,109,113],"problem":[42],"identification,":[43],"which":[44],"produce":[46,106],"meaningful":[47],"results":[48],"early":[49],"in":[50,79],"the":[51,80],"testing":[52,81],"process.":[53],"The":[54],"dual":[55],"fits":[57],"traditional":[58],"growth":[61],"models":[62,76,98],"(SRGMs)":[63],"these":[65],"grouped":[66],"provide":[69],"long-term":[70],"assessments":[72,112],"predictions.":[74,114],"These":[75],"were":[77],"evaluated":[78],"two":[83],"large":[84],"systems":[86],"from":[87],"IBM.":[88],"Compared":[89],"existing":[91],"SRGMs":[92],"fitted":[93],"raw":[95],"data,":[96],"our":[97],"are":[99],"generally":[100],"more":[101,107],"stable":[102],"over":[103],"consistent":[108],"accurate":[110]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}