{"id":"https://openalex.org/W1965035308","doi":"https://doi.org/10.1109/tse.1986.6313052","title":"Extensions to an approach to the modeling of software testing with some performance comparisons","display_name":"Extensions to an approach to the modeling of software testing with some performance comparisons","publication_year":1986,"publication_date":"1986-09-01","ids":{"openalex":"https://openalex.org/W1965035308","doi":"https://doi.org/10.1109/tse.1986.6313052","mag":"1965035308"},"language":"en","primary_location":{"id":"doi:10.1109/tse.1986.6313052","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tse.1986.6313052","pdf_url":null,"source":{"id":"https://openalex.org/S8351582","display_name":"IEEE Transactions on Software Engineering","issn_l":"0098-5589","issn":["0098-5589","1939-3520","2326-3881"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Software Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109934027","display_name":"T. Downs","orcid":null},"institutions":[{"id":"https://openalex.org/I165143802","display_name":"University of Queensland","ror":"https://ror.org/00rqy9422","country_code":"AU","type":"education","lineage":["https://openalex.org/I165143802"]}],"countries":["AU"],"is_corresponding":true,"raw_author_name":"Thomas Downs","raw_affiliation_strings":["Department of Electrical Engineering, University of Queensland, St Lucia, QLD, Australia","Dept. of Electr. Eng., Queensland Univ., St. Lucia, Qld., Australia"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Queensland, St Lucia, QLD, Australia","institution_ids":["https://openalex.org/I165143802"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Queensland Univ., St. Lucia, Qld., Australia","institution_ids":["https://openalex.org/I165143802"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5109934027"],"corresponding_institution_ids":["https://openalex.org/I165143802"],"apc_list":null,"apc_paid":null,"fwci":0.4354,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.74327957,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"SE-12","issue":"9","first_page":"979","last_page":"987"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8628197908401489},{"id":"https://openalex.org/keywords/software-performance-testing","display_name":"Software performance testing","score":0.7033825516700745},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.6111265420913696},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5043884515762329},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.4949185252189636},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.44405075907707214},{"id":"https://openalex.org/keywords/software-testing","display_name":"Software testing","score":0.43589097261428833},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.35475456714630127},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.34685730934143066},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.3360782265663147},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.31952810287475586}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8628197908401489},{"id":"https://openalex.org/C178059732","wikidata":"https://www.wikidata.org/wiki/Q1982529","display_name":"Software performance testing","level":5,"score":0.7033825516700745},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.6111265420913696},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5043884515762329},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.4949185252189636},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.44405075907707214},{"id":"https://openalex.org/C2984328558","wikidata":"https://www.wikidata.org/wiki/Q188522","display_name":"Software testing","level":3,"score":0.43589097261428833},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.35475456714630127},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.34685730934143066},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.3360782265663147},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.31952810287475586},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tse.1986.6313052","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tse.1986.6313052","pdf_url":null,"source":{"id":"https://openalex.org/S8351582","display_name":"IEEE Transactions on Software Engineering","issn_l":"0098-5589","issn":["0098-5589","1939-3520","2326-3881"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Software Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6200000047683716,"id":"https://metadata.un.org/sdg/1","display_name":"No poverty"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1707101138","https://openalex.org/W1494025131","https://openalex.org/W2209071826","https://openalex.org/W2353261385","https://openalex.org/W2798306226","https://openalex.org/W2376559135","https://openalex.org/W2051591137","https://openalex.org/W2017291030","https://openalex.org/W3051764461","https://openalex.org/W1991342156"],"abstract_inverted_index":{"It":[0],"is":[1,40,57,65,83],"shown":[2,67],"how":[3],"a":[4,10,27,58],"major":[5],"(and":[6],"questionable)":[7],"assumption":[8,33,56],"underlying":[9],"previously":[11],"reported":[12],"approach":[13],"to":[14,25,42,68,75,86],"the":[15,32,37,48,53,87,91],"modeling":[16],"of":[17,34,78,89,93],"software":[18,79],"testing":[19],"can":[20],"be":[21],"relaxed":[22],"in":[23,99],"order":[24],"provide":[26],"more":[28],"realistic":[29],"model.":[30],"Under":[31],"uniform":[35,54],"execution":[36,55,63],"new":[38],"model":[39,64],"found":[41],"perform":[43],"only":[44],"marginally":[45],"better":[46],"than":[47],"previous":[49],"model,":[50],"indicating":[51],"that":[52],"poor":[59],"one.":[60],"A":[61],"nonuniform":[62],"then":[66],"give":[69],"very":[70],"good":[71],"performance":[72,92],"on":[73],"application":[74],"three":[76],"sets":[77],"reliability":[80],"data.":[81],"Attention":[82],"also":[84],"devoted":[85],"problem":[88],"comparing":[90],"different":[94],"models,":[95],"and":[96],"some":[97],"difficulties":[98],"this":[100],"area":[101],"are":[102],"noted.":[103]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}