{"id":"https://openalex.org/W2037924647","doi":"https://doi.org/10.1109/tse.1984.5010297","title":"Criteria for Software Reliability Model Comparisons","display_name":"Criteria for Software Reliability Model Comparisons","publication_year":1984,"publication_date":"1984-11-01","ids":{"openalex":"https://openalex.org/W2037924647","doi":"https://doi.org/10.1109/tse.1984.5010297","mag":"2037924647"},"language":"en","primary_location":{"id":"doi:10.1109/tse.1984.5010297","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tse.1984.5010297","pdf_url":null,"source":{"id":"https://openalex.org/S8351582","display_name":"IEEE Transactions on Software Engineering","issn_l":"0098-5589","issn":["0098-5589","1939-3520","2326-3881"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Software Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089290357","display_name":"A. Iannino","orcid":null},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Anthony Iannino","raw_affiliation_strings":["AT&T Bell Labaratories, Whippany, NJ, USA","AT&T Bell Laboratories, Whippany, NJ 07981"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AT&T Bell Labaratories, Whippany, NJ, USA","institution_ids":["https://openalex.org/I1283103587"]},{"raw_affiliation_string":"AT&T Bell Laboratories, Whippany, NJ 07981","institution_ids":["https://openalex.org/I1283103587"]}]},{"author_position":"middle","author":{"id":null,"display_name":"John D. Musa","orcid":null},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John D. Musa","raw_affiliation_strings":["AT and T Bell Laboratories, Whippany, NJ, USA","AT&T Bell Laboratories, Whippany, NJ 07981"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AT and T Bell Laboratories, Whippany, NJ, USA","institution_ids":["https://openalex.org/I1283103587"]},{"raw_affiliation_string":"AT&T Bell Laboratories, Whippany, NJ 07981","institution_ids":["https://openalex.org/I1283103587"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109214846","display_name":"Kazuhira Okumoto","orcid":null},"institutions":[{"id":"https://openalex.org/I1283103587","display_name":"AT&T (United States)","ror":"https://ror.org/02bbd5539","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kazuhira Okumoto","raw_affiliation_strings":["AT&T Bell Labaratories, Whippany, NJ, USA","AT&T Bell Laboratories, Whippany, NJ 07981"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AT&T Bell Labaratories, Whippany, NJ, USA","institution_ids":["https://openalex.org/I1283103587"]},{"raw_affiliation_string":"AT&T Bell Laboratories, Whippany, NJ 07981","institution_ids":["https://openalex.org/I1283103587"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016113538","display_name":"Bev Littlewood","orcid":null},"institutions":[{"id":"https://openalex.org/I180825142","display_name":"City, University of London","ror":"https://ror.org/04489at23","country_code":"GB","type":"education","lineage":["https://openalex.org/I124357947","https://openalex.org/I180825142"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Bev Littlewood","raw_affiliation_strings":["City University, London, UK","City University London, England"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"City University, London, UK","institution_ids":["https://openalex.org/I180825142"]},{"raw_affiliation_string":"City University London, England","institution_ids":["https://openalex.org/I180825142"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":10.0291,"has_fulltext":false,"cited_by_count":84,"citation_normalized_percentile":{"value":0.97909408,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"SE-10","issue":"6","first_page":"687","last_page":"691"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9901999831199646,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9848999977111816,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8407937288284302},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.6104521155357361},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.567349374294281},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.49532976746559143},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.48781612515449524},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.48408663272857666},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.4755242168903351},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4601278007030487},{"id":"https://openalex.org/keywords/presentation","display_name":"Presentation (obstetrics)","score":0.451455682516098},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.35275793075561523},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.16601544618606567}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8407937288284302},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.6104521155357361},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.567349374294281},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.49532976746559143},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.48781612515449524},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.48408663272857666},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.4755242168903351},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4601278007030487},{"id":"https://openalex.org/C2777601897","wikidata":"https://www.wikidata.org/wiki/Q3409113","display_name":"Presentation (obstetrics)","level":2,"score":0.451455682516098},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.35275793075561523},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.16601544618606567},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tse.1984.5010297","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tse.1984.5010297","pdf_url":null,"source":{"id":"https://openalex.org/S8351582","display_name":"IEEE Transactions on Software Engineering","issn_l":"0098-5589","issn":["0098-5589","1939-3520","2326-3881"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Software Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W124052719","https://openalex.org/W582592791","https://openalex.org/W1521513408","https://openalex.org/W1522169511","https://openalex.org/W1544461401","https://openalex.org/W1584903978","https://openalex.org/W1966017250","https://openalex.org/W1980595883","https://openalex.org/W1985498244","https://openalex.org/W2046451536","https://openalex.org/W2057083269","https://openalex.org/W2108498504","https://openalex.org/W2112961043","https://openalex.org/W2117455525","https://openalex.org/W6616990022","https://openalex.org/W6634844212","https://openalex.org/W6646704034"],"related_works":["https://openalex.org/W1521772560","https://openalex.org/W4238386252","https://openalex.org/W4226182203","https://openalex.org/W234065253","https://openalex.org/W3185885951","https://openalex.org/W111546663","https://openalex.org/W1966392103","https://openalex.org/W2047750899","https://openalex.org/W3088925126","https://openalex.org/W2162125807"],"abstract_inverted_index":{"A":[0],"set":[1],"of":[2,9,31],"criteria":[3],"is":[4,15,35],"proposed":[5],"for":[6,22,28,55],"the":[7,24,29,39,51,60],"comparison":[8],"software":[10,42],"reliability":[11],"models.":[12],"The":[13],"intention":[14],"to":[16,47],"provide":[17],"a":[18,41],"logically":[19],"organized":[20],"basis":[21],"determining":[23],"superior":[25],"models":[26],"and":[27],"presentation":[30],"model":[32,52],"characteristics.":[33],"It":[34],"hoped":[36],"that":[37],"in":[38],"future,":[40],"manager":[43],"will":[44],"be":[45],"able":[46],"more":[48],"easily":[49],"select":[50],"most":[53],"suitable":[54],"his/her":[56],"requirements":[57],"from":[58],"among":[59],"preferred":[61],"ones.":[62]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}