{"id":"https://openalex.org/W4400975568","doi":"https://doi.org/10.1109/tsc.2024.3433529","title":"AI-Generated Content-Based Edge Learning for Fast and Efficient Few-Shot Defect Detection in IIoT","display_name":"AI-Generated Content-Based Edge Learning for Fast and Efficient Few-Shot Defect Detection in IIoT","publication_year":2024,"publication_date":"2024-07-25","ids":{"openalex":"https://openalex.org/W4400975568","doi":"https://doi.org/10.1109/tsc.2024.3433529"},"language":"en","primary_location":{"id":"doi:10.1109/tsc.2024.3433529","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsc.2024.3433529","pdf_url":null,"source":{"id":"https://openalex.org/S204223317","display_name":"IEEE Transactions on Services Computing","issn_l":"1939-1374","issn":["1939-1374","2372-0204"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Services Computing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100406629","display_name":"Siyuan Li","orcid":"https://orcid.org/0000-0002-5045-9472"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Siyuan Li","raw_affiliation_strings":["School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-5045-9472","affiliations":[{"raw_affiliation_string":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106746347","display_name":"Xi Lin","orcid":"https://orcid.org/0000-0001-5303-1191"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xi Lin","raw_affiliation_strings":["School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-5303-1191","affiliations":[{"raw_affiliation_string":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063181504","display_name":"Wenchao Xu","orcid":"https://orcid.org/0000-0003-0983-387X"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Wenchao Xu","raw_affiliation_strings":["Department of Computing, The Hong Kong Polytechnic University, Hong Kong","Department of Computing, The Hong Kong Polytechnic University, Hong Kong, China"],"raw_orcid":"https://orcid.org/0000-0003-0983-387X","affiliations":[{"raw_affiliation_string":"Department of Computing, The Hong Kong Polytechnic University, Hong Kong","institution_ids":["https://openalex.org/I14243506"]},{"raw_affiliation_string":"Department of Computing, The Hong Kong Polytechnic University, Hong Kong, China","institution_ids":["https://openalex.org/I14243506"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100391361","display_name":"Jianhua Li","orcid":"https://orcid.org/0000-0002-6831-3973"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianhua Li","raw_affiliation_strings":["School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-6831-3973","affiliations":[{"raw_affiliation_string":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100406629"],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":null,"apc_paid":null,"fwci":3.5839,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.92932281,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"17","issue":"6","first_page":"3140","last_page":"3153"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9850999712944031,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9850999712944031,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9473000168800354,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9434999823570251,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8045847415924072},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.5668637752532959},{"id":"https://openalex.org/keywords/shot","display_name":"Shot (pellet)","score":0.5525370836257935},{"id":"https://openalex.org/keywords/one-shot","display_name":"One shot","score":0.5333461761474609},{"id":"https://openalex.org/keywords/content","display_name":"Content (measure theory)","score":0.4547216296195984},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.43670839071273804},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.07018321752548218}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8045847415924072},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.5668637752532959},{"id":"https://openalex.org/C2778344882","wikidata":"https://www.wikidata.org/wiki/Q278938","display_name":"Shot (pellet)","level":2,"score":0.5525370836257935},{"id":"https://openalex.org/C2992734406","wikidata":"https://www.wikidata.org/wiki/Q413267","display_name":"One shot","level":2,"score":0.5333461761474609},{"id":"https://openalex.org/C2778152352","wikidata":"https://www.wikidata.org/wiki/Q5165061","display_name":"Content (measure theory)","level":2,"score":0.4547216296195984},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.43670839071273804},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.07018321752548218},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tsc.2024.3433529","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tsc.2024.3433529","pdf_url":null,"source":{"id":"https://openalex.org/S204223317","display_name":"IEEE Transactions on Services Computing","issn_l":"1939-1374","issn":["1939-1374","2372-0204"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Services Computing","raw_type":"journal-article"},{"id":"pmh:oai:repository.hkust.edu.hk:1783.1-149653","is_oa":false,"landing_page_url":"http://repository.hkust.edu.hk/ir/Record/1783.1-149653","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5371349539","display_name":null,"funder_award_id":"U20B2048","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8490714825","display_name":null,"funder_award_id":"62202302","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1505878979","https://openalex.org/W2112796928","https://openalex.org/W3105504538","https://openalex.org/W3112262420","https://openalex.org/W3125002451","https://openalex.org/W3161037238","https://openalex.org/W3164289800","https://openalex.org/W3207602870","https://openalex.org/W4206321341","https://openalex.org/W4226179997","https://openalex.org/W4285216649","https://openalex.org/W4285742007","https://openalex.org/W4312899080","https://openalex.org/W4321484469","https://openalex.org/W4322704128","https://openalex.org/W4327523253","https://openalex.org/W4375929055","https://openalex.org/W4386075769","https://openalex.org/W4386322075","https://openalex.org/W4387164705","https://openalex.org/W4388624545","https://openalex.org/W4389459429","https://openalex.org/W4399939859","https://openalex.org/W4401537943","https://openalex.org/W6684921986","https://openalex.org/W6685444567","https://openalex.org/W6738796088","https://openalex.org/W6743688258","https://openalex.org/W6748839928","https://openalex.org/W6755069753","https://openalex.org/W6759044181","https://openalex.org/W6759425520","https://openalex.org/W6849736153","https://openalex.org/W6866409090","https://openalex.org/W7037627998"],"related_works":["https://openalex.org/W2497720472","https://openalex.org/W4292659306","https://openalex.org/W3044321615","https://openalex.org/W4294892107","https://openalex.org/W2806221744","https://openalex.org/W2326937258","https://openalex.org/W394267150","https://openalex.org/W2773965352","https://openalex.org/W2357748469","https://openalex.org/W2392917037"],"abstract_inverted_index":{"Generative":[0],"AI":[1],"has":[2],"garnered":[3],"substantial":[4],"attention":[5,116,150],"due":[6],"to":[7,124],"the":[8,13,21,65,136,172],"limited":[9],"defect":[10,25,54,61,95,100,131,185],"samples":[11,96,132],"in":[12,27,180],"industrial":[14,28,94,163,184],"Internet":[15],"of":[16,23,67,129,138,174],"Things":[17],"(IIoT).":[18],"However,":[19],"addressing":[20],"challenge":[22],"few-shot":[24,53,60,99],"detection":[26,62],"edge":[29,46,127],"networks":[30],"remains":[31],"a":[32,41,105],"key":[33],"issue.":[34],"In":[35],"this":[36],"paper,":[37],"we":[38,77,103],"propose":[39,78,114],"ABEL,":[40],"novel":[42],"AI-generated":[43],"content":[44],"(AIGC)-based":[45],"learning":[47,121],"framework":[48,57,176],"for":[49,97],"fast":[50,59,126],"and":[51,71,113,117,141,152,166,177,187],"efficient":[52,98],"detection.":[55,101],"This":[56],"facilitates":[58],"by":[63,147],"harnessing":[64],"capabilities":[66],"realistic":[68,183],"sample":[69],"synthesis":[70,157],"edge-based":[72,189],"AIGC":[73,109,190],"task":[74,191],"execution.":[75,192],"Specifically,":[76],"an":[79,115],"energy-based":[80],"model":[81],"(EBM)-guided":[82],"Langevin":[83],"Markov":[84],"chain":[85],"Monte":[86],"Carlo":[87],"(L-MCMC)":[88],"image":[89],"generation":[90],"algorithm,":[91],"synthesizing":[92,182],"high-resolution":[93],"Then,":[102],"formulate":[104],"large-scale":[106],"mixed":[107],"cooperative-competitive":[108],"computation":[110],"offloading":[111],"problem":[112],"memory-based":[118],"multi-agent":[119],"reinforcement":[120],"(AMMARL)":[122],"algorithm":[123],"ensure":[125],"execution":[128],"heterogeneous":[130],"generative":[133],"tasks.":[134],"Particularly,":[135],"challenges":[137],"partial":[139],"observability":[140],"high-dimensional":[142],"state":[143],"space":[144],"are":[145,159],"addressed":[146],"introducing":[148],"multi-head":[149],"mechanisms":[151],"long-term":[153],"memory":[154],"modules.":[155],"Comprehensive":[156],"experiments":[158],"conducted":[160],"utilizing":[161],"real-world":[162],"datasets":[164],"NEU-CLS":[165],"DeepPCB.":[167],"The":[168],"experimental":[169],"results":[170],"demonstrate":[171],"effectiveness":[173,179],"our":[175],"algorithm's":[178],"efficiently":[181],"images":[186],"optimizing":[188]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":8}],"updated_date":"2026-05-07T13:39:58.223016","created_date":"2025-10-10T00:00:00"}