{"id":"https://openalex.org/W7164563679","doi":"https://doi.org/10.1109/tr.2026.3703142","title":"A Diagnosis Method of Rail-to-Earth Insulation Based on Circuit-Field Coupling Model","display_name":"A Diagnosis Method of Rail-to-Earth Insulation Based on Circuit-Field Coupling Model","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7164563679","doi":"https://doi.org/10.1109/tr.2026.3703142"},"language":null,"primary_location":{"id":"doi:10.1109/tr.2026.3703142","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2026.3703142","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5138498143","display_name":"Wei Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Liu","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-5654-9719","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5121576699","display_name":"Zhuoxin Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhuoxin Yang","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0004-3121-9002","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054576361","display_name":"Feilong Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feilong Liu","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0001-8216-7677","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023454895","display_name":"Shuangrui Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuangrui Yang","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001477434","display_name":"Hongji Wang","orcid":"https://orcid.org/0000-0003-3246-8583"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongji Wang","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101403336","display_name":"Qingan Ma","orcid":"https://orcid.org/0000-0003-2367-4668"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qingan Ma","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4800084"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.73367818,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"75","issue":null,"first_page":"2274","last_page":"2288"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":0.22550000250339508,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":0.22550000250339508,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11568","display_name":"Railway Systems and Energy Efficiency","score":0.18520000576972961,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.17659999430179596,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/coupling","display_name":"Coupling (piping)","score":0.508899986743927},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.47850000858306885},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.39649999141693115},{"id":"https://openalex.org/keywords/probability-density-function","display_name":"Probability density function","score":0.3330000042915344},{"id":"https://openalex.org/keywords/mathematical-model","display_name":"Mathematical model","score":0.31299999356269836},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.3034999966621399}],"concepts":[{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.508899986743927},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.47850000858306885},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.42080000042915344},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.39649999141693115},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34700000286102295},{"id":"https://openalex.org/C197055811","wikidata":"https://www.wikidata.org/wiki/Q207522","display_name":"Probability density function","level":2,"score":0.3330000042915344},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32280001044273376},{"id":"https://openalex.org/C76969082","wikidata":"https://www.wikidata.org/wiki/Q486902","display_name":"Mathematical model","level":2,"score":0.31299999356269836},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.3034999966621399},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.29670000076293945},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2946000099182129},{"id":"https://openalex.org/C2984221369","wikidata":"https://www.wikidata.org/wiki/Q422584","display_name":"Electric breakdown","level":3,"score":0.29280000925064087},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.28540000319480896},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.28349998593330383},{"id":"https://openalex.org/C2986605239","wikidata":"https://www.wikidata.org/wiki/Q925667","display_name":"Numerical models","level":3,"score":0.27970001101493835},{"id":"https://openalex.org/C167928553","wikidata":"https://www.wikidata.org/wiki/Q1376021","display_name":"Estimation theory","level":2,"score":0.267300009727478},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2644999921321869},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.25130000710487366},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25029999017715454}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2026.3703142","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2026.3703142","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.42404434084892273,"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11"}],"awards":[{"id":"https://openalex.org/G694393487","display_name":null,"funder_award_id":"52477125","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"A":[0,60],"rail-to-earth":[1,48],"insulation":[2,87,151],"diagnostic":[3,123],"method":[4],"is":[5,95],"proposed":[6],"for":[7],"subway":[8],"systems,":[9],"leveraging":[10],"a":[11,102],"computationally":[12],"efficient":[13],"improved":[14,22],"field-circuit":[15],"coupling":[16],"model":[17,28],"(IFCM)":[18],"combined":[19],"with":[20,52,122,142],"an":[21],"Minkowski":[23],"distance":[24],"(IMD)":[25],"metric.":[26],"The":[27],"innovatively":[29],"excludes":[30],"rail":[31,65],"electric":[32],"field":[33],"effects":[34],"and":[35,68,81,149],"relocates":[36],"leakage":[37],"sources":[38],"to":[39,57,85,108],"the":[40,98,127],"stray":[41],"current":[42],"collection":[43],"network":[44],"(SCCN),":[45],"achieving":[46],"dynamic":[47,90],"resistance":[49],"(RE)":[50],"simulations":[51],"deviations":[53],"below":[54],"5.47%":[55],"compared":[56,107],"experimental":[58],"measurements.":[59],"multi-signal":[61],"fusion":[62],"approach":[63],"combines":[64],"potential":[66,71],"(RP)":[67],"SCCN":[69],"polarization":[70],"(PP),":[72],"employing":[73],"time-varying":[74],"filtered":[75],"empirical":[76],"mode":[77],"decomposition":[78],"(TVF-EMD)":[79],"denoising":[80],"IMD-based":[82],"feature":[83],"extraction":[84],"quantify":[86],"degradation.":[88],"In":[89],"simulations,":[91],"high":[92],"computational":[93],"efficiency":[94],"maintained":[96],"by":[97],"IFCM,":[99],"which":[100],"shows":[101],"relative":[103],"error":[104],"of":[105],"8.09%":[106],"CDEGS":[109],"results.":[110],"Rigorous":[111],"metrological":[112],"validation":[113],"using":[114],"5,000":[115],"defect":[116],"samples":[117],"demonstrates":[118],"98.09%":[119],"classification":[120],"accuracy,":[121],"thresholds":[124],"optimized":[125],"via":[126],"Youden":[128],"index.":[129],"Statistical":[130],"bootstrapping":[131],"confirms":[132],"robustness,":[133],"while":[134],"sensitivity":[135],"analyses":[136],"validate":[137],"performance":[138],"under":[139],"noise":[140],"interference,":[141],"energy":[143],"feedback":[144],"system":[145],"(EFS)":[146],"in":[147],"operation,":[148],"localized":[150],"variations.":[152]},"counts_by_year":[],"updated_date":"2026-07-04T06:09:54.619538","created_date":"2026-06-13T00:00:00"}