{"id":"https://openalex.org/W7123359004","doi":"https://doi.org/10.1109/tr.2025.3648586","title":"A Novel Diagnostic Measurement of Structural Faults in Multiprocessor Systems: Based on Component Quantity Analysis","display_name":"A Novel Diagnostic Measurement of Structural Faults in Multiprocessor Systems: Based on Component Quantity Analysis","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7123359004","doi":"https://doi.org/10.1109/tr.2025.3648586"},"language":null,"primary_location":{"id":"doi:10.1109/tr.2025.3648586","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2025.3648586","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5092721881","display_name":"Nengjin Zhuo","orcid":"https://orcid.org/0009-0006-7720-2876"},"institutions":[{"id":"https://openalex.org/I20616075","display_name":"Qinghai Normal University","ror":"https://ror.org/03az1t892","country_code":"CN","type":"education","lineage":["https://openalex.org/I20616075"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Nengjin Zhuo","raw_affiliation_strings":["School of Mathematics and Statistics, Qinghai Normal University, Xining, China"],"raw_orcid":"https://orcid.org/0009-0006-7720-2876","affiliations":[{"raw_affiliation_string":"School of Mathematics and Statistics, Qinghai Normal University, Xining, China","institution_ids":["https://openalex.org/I20616075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100681909","display_name":"Shumin Zhang","orcid":"https://orcid.org/0000-0002-1148-056X"},"institutions":[{"id":"https://openalex.org/I20616075","display_name":"Qinghai Normal University","ror":"https://ror.org/03az1t892","country_code":"CN","type":"education","lineage":["https://openalex.org/I20616075"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shumin Zhang","raw_affiliation_strings":["School of Mathematics and Statistics, Qinghai Normal University, Xining, China"],"raw_orcid":"https://orcid.org/0000-0002-1148-056X","affiliations":[{"raw_affiliation_string":"School of Mathematics and Statistics, Qinghai Normal University, Xining, China","institution_ids":["https://openalex.org/I20616075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049607435","display_name":"Jou\u2013Ming Chang","orcid":"https://orcid.org/0000-0002-9542-7968"},"institutions":[{"id":"https://openalex.org/I43566213","display_name":"National Taipei University of Business","ror":"https://ror.org/029hrv109","country_code":"TW","type":"education","lineage":["https://openalex.org/I43566213"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jou-Ming Chang","raw_affiliation_strings":["Institute of Information and Decision Sciences, National Taipei University of Business, Taipei, Taiwan"],"raw_orcid":"https://orcid.org/0000-0002-9542-7968","affiliations":[{"raw_affiliation_string":"Institute of Information and Decision Sciences, National Taipei University of Business, Taipei, Taiwan","institution_ids":["https://openalex.org/I43566213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5122868294","display_name":"Bo Zhu","orcid":null},"institutions":[{"id":"https://openalex.org/I20616075","display_name":"Qinghai Normal University","ror":"https://ror.org/03az1t892","country_code":"CN","type":"education","lineage":["https://openalex.org/I20616075"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Zhu","raw_affiliation_strings":["School of Mathematics and Statistics, Qinghai Normal University, Xining, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mathematics and Statistics, Qinghai Normal University, Xining, China","institution_ids":["https://openalex.org/I20616075"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":99.834,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.99916857,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"75","issue":null,"first_page":"612","last_page":"623"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.27140000462532043,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.27140000462532043,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.20319999754428864,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.12370000034570694,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/multiprocessing","display_name":"Multiprocessing","score":0.7372999787330627},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.6836000084877014},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5795000195503235},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5379999876022339},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4300999939441681},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.35850000381469727}],"concepts":[{"id":"https://openalex.org/C4822641","wikidata":"https://www.wikidata.org/wiki/Q846651","display_name":"Multiprocessing","level":2,"score":0.7372999787330627},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.6836000084877014},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5795000195503235},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5735999941825867},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5379999876022339},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5112000107765198},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4758000075817108},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4300999939441681},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.35850000381469727},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.35040000081062317},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.32499998807907104},{"id":"https://openalex.org/C23725684","wikidata":"https://www.wikidata.org/wiki/Q616377","display_name":"Maintenance engineering","level":2,"score":0.3165999948978424},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.314300000667572},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2782000005245209},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.271699994802475},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.26660001277923584},{"id":"https://openalex.org/C2984822820","wikidata":"https://www.wikidata.org/wiki/Q1123036","display_name":"Processor scheduling","level":3,"score":0.26170000433921814},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.26100000739097595},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.25270000100135803}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2025.3648586","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2025.3648586","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4649061791","display_name":null,"funder_award_id":"114-2221-E-141-011","funder_id":"https://openalex.org/F2461203286","funder_display_name":"National Science and Technology Council"},{"id":"https://openalex.org/G6372693338","display_name":null,"funder_award_id":"12461065","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7471968010","display_name":null,"funder_award_id":"12261074","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F2461203286","display_name":"National Science and Technology Council","ror":"https://ror.org/02kv4zf79"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W1923396242","https://openalex.org/W1964602554","https://openalex.org/W1989741444","https://openalex.org/W2033449646","https://openalex.org/W2037529689","https://openalex.org/W2079290705","https://openalex.org/W2101573191","https://openalex.org/W2113615756","https://openalex.org/W2122056736","https://openalex.org/W2148045188","https://openalex.org/W2338928843","https://openalex.org/W2766447205","https://openalex.org/W2895829868","https://openalex.org/W3111983428","https://openalex.org/W4206447675","https://openalex.org/W4296240971","https://openalex.org/W4317209835","https://openalex.org/W4378212795","https://openalex.org/W4385945541","https://openalex.org/W4387514785","https://openalex.org/W4389252700","https://openalex.org/W4391582690","https://openalex.org/W4401246422","https://openalex.org/W4402452082","https://openalex.org/W4405287420","https://openalex.org/W4406047685","https://openalex.org/W4407948973","https://openalex.org/W4408521216","https://openalex.org/W4408707060","https://openalex.org/W4408733593","https://openalex.org/W4408738611","https://openalex.org/W4408805378","https://openalex.org/W4409126217","https://openalex.org/W4409310655","https://openalex.org/W4410029767","https://openalex.org/W4413478425","https://openalex.org/W4413947078","https://openalex.org/W4415220798","https://openalex.org/W7085671809"],"related_works":[],"abstract_inverted_index":{"Fault":[0],"diagnosis":[1],"is":[2,78,91],"essential":[3],"for":[4],"maintaining":[5],"the":[6,26,41,45,53,59,72,83,89,96],"regular":[7],"operation":[8],"of":[9,44,86],"multiprocessor":[10],"systems.":[11],"In":[12],"this":[13,81],"paper,":[14],"we":[15,48],"introduce":[16],"a":[17],"novel":[18],"concept":[19],"of$r$-component$H$-structure":[20,29],"diagnosability,":[21],"denoted":[22],"as$t_{s}^{r}(G;H)$,":[23],"which":[24],"represents":[25],"maximum":[27,84],"number":[28,85,98],"faults":[30],"that":[31,51,70],"system$G$can":[32],"precisely":[33],"detect.":[34],"This":[35],"parameter":[36],"enables":[37],"us":[38],"to":[39,93],"assess":[40],"overall":[42],"diagnosability":[43],"system.":[46],"Furthermore,":[47],"strictly":[49],"prove":[50],"under":[52],"PMC":[54],"and":[55,77],"MM*":[56],"diagnostic":[57],"models,":[58],"following":[60],"results":[61,68],"hold:":[62],"for$n\\geq":[63,65],"7$,$t_{s}^{2}(Q_{n};K_{1,1})=2n-4$;":[64],"6$,$t_{s}^{2}(Q_{n};K_{1,2})=n-2$.":[66],"These":[67],"confirm":[69],"when":[71],"system":[73,90],"experiences":[74],"a$K_{1,1}$-structural":[75],"fault":[76],"disconnected":[79],"at":[80],"time,":[82],"detectable$K_{1,1}$-structures":[87],"within":[88],"guaranteed":[92],"be":[94],"twice":[95],"original":[97],"in":[99],"previous":[100],"studies.":[101]},"counts_by_year":[{"year":2026,"cited_by_count":5}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2026-01-14T00:00:00"}