{"id":"https://openalex.org/W4415125417","doi":"https://doi.org/10.1109/tr.2025.3616633","title":"Reliability Modeling and Analysis of Digital Twin-Driven Cyber-Physical Manufacturing Systems","display_name":"Reliability Modeling and Analysis of Digital Twin-Driven Cyber-Physical Manufacturing Systems","publication_year":2025,"publication_date":"2025-10-13","ids":{"openalex":"https://openalex.org/W4415125417","doi":"https://doi.org/10.1109/tr.2025.3616633"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2025.3616633","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2025.3616633","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089323818","display_name":"Xiuwen Fu","orcid":"https://orcid.org/0000-0001-5611-3504"},"institutions":[{"id":"https://openalex.org/I96733725","display_name":"Shanghai Maritime University","ror":"https://ror.org/04z7qrj66","country_code":"CN","type":"education","lineage":["https://openalex.org/I96733725"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiuwen Fu","raw_affiliation_strings":["Logistics Engineering College, Shanghai Maritime University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-5611-3504","affiliations":[{"raw_affiliation_string":"Logistics Engineering College, Shanghai Maritime University, Shanghai, China","institution_ids":["https://openalex.org/I96733725"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102682196","display_name":"Dingyi Zheng","orcid":"https://orcid.org/0009-0000-8543-8041"},"institutions":[{"id":"https://openalex.org/I96733725","display_name":"Shanghai Maritime University","ror":"https://ror.org/04z7qrj66","country_code":"CN","type":"education","lineage":["https://openalex.org/I96733725"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dingyi Zheng","raw_affiliation_strings":["Institute of Logistics Science and Engineering, Shanghai Maritime University, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0000-8543-8041","affiliations":[{"raw_affiliation_string":"Institute of Logistics Science and Engineering, Shanghai Maritime University, Shanghai, China","institution_ids":["https://openalex.org/I96733725"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114377940","display_name":"Liudong Xing","orcid":"https://orcid.org/0000-0003-1606-1644"},"institutions":[{"id":"https://openalex.org/I100633361","display_name":"University of Massachusetts Dartmouth","ror":"https://ror.org/00fzmm222","country_code":"US","type":"education","lineage":["https://openalex.org/I100633361"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Liudong Xing","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Massachusetts, Dartmouth, MA, USA"],"raw_orcid":"https://orcid.org/0000-0003-1606-1644","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Massachusetts, Dartmouth, MA, USA","institution_ids":["https://openalex.org/I100633361"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081036659","display_name":"Rui Peng","orcid":"https://orcid.org/0000-0001-6596-0334"},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rui Peng","raw_affiliation_strings":["School of Economics and Management, Beijing University of Technology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-6596-0334","affiliations":[{"raw_affiliation_string":"School of Economics and Management, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5089323818"],"corresponding_institution_ids":["https://openalex.org/I96733725"],"apc_list":null,"apc_paid":null,"fwci":2.2251,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.90138036,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"74","issue":"4","first_page":"5175","last_page":"5189"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11741","display_name":"Flexible and Reconfigurable Manufacturing Systems","score":0.9629999995231628,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.929099977016449,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bottleneck","display_name":"Bottleneck","score":0.7603999972343445},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6463000178337097},{"id":"https://openalex.org/keywords/cyber-physical-system","display_name":"Cyber-physical system","score":0.6460999846458435},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.5460000038146973},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.5304999947547913},{"id":"https://openalex.org/keywords/data-modeling","display_name":"Data modeling","score":0.45890000462532043},{"id":"https://openalex.org/keywords/interdependence","display_name":"Interdependence","score":0.40560001134872437},{"id":"https://openalex.org/keywords/physical-layer","display_name":"Physical layer","score":0.4027000069618225},{"id":"https://openalex.org/keywords/digital-manufacturing","display_name":"Digital manufacturing","score":0.4020000100135803}],"concepts":[{"id":"https://openalex.org/C2780513914","wikidata":"https://www.wikidata.org/wiki/Q18210350","display_name":"Bottleneck","level":2,"score":0.7603999972343445},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6463000178337097},{"id":"https://openalex.org/C179768478","wikidata":"https://www.wikidata.org/wiki/Q1120057","display_name":"Cyber-physical system","level":2,"score":0.6460999846458435},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6126999855041504},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5460000038146973},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.5304999947547913},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5235000252723694},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.45890000462532043},{"id":"https://openalex.org/C185874996","wikidata":"https://www.wikidata.org/wiki/Q269699","display_name":"Interdependence","level":2,"score":0.40560001134872437},{"id":"https://openalex.org/C19247436","wikidata":"https://www.wikidata.org/wiki/Q192727","display_name":"Physical layer","level":3,"score":0.4027000069618225},{"id":"https://openalex.org/C2780841897","wikidata":"https://www.wikidata.org/wiki/Q25349015","display_name":"Digital manufacturing","level":2,"score":0.4020000100135803},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.4000999927520752},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3752000033855438},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3425999879837036},{"id":"https://openalex.org/C17500928","wikidata":"https://www.wikidata.org/wiki/Q959968","display_name":"Control system","level":2,"score":0.33000001311302185},{"id":"https://openalex.org/C47822265","wikidata":"https://www.wikidata.org/wiki/Q854457","display_name":"Complex system","level":2,"score":0.328900009393692},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.322299987077713},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.3172999918460846},{"id":"https://openalex.org/C23725684","wikidata":"https://www.wikidata.org/wiki/Q616377","display_name":"Maintenance engineering","level":2,"score":0.3156000077724457},{"id":"https://openalex.org/C110963975","wikidata":"https://www.wikidata.org/wiki/Q12070446","display_name":"Systems modeling","level":2,"score":0.3154999911785126},{"id":"https://openalex.org/C199845137","wikidata":"https://www.wikidata.org/wiki/Q145490","display_name":"Network topology","level":2,"score":0.27889999747276306},{"id":"https://openalex.org/C107645828","wikidata":"https://www.wikidata.org/wiki/Q12070446","display_name":"System model","level":2,"score":0.2775000035762787},{"id":"https://openalex.org/C104122410","wikidata":"https://www.wikidata.org/wiki/Q1416406","display_name":"Network model","level":2,"score":0.2750999927520752},{"id":"https://openalex.org/C35280785","wikidata":"https://www.wikidata.org/wiki/Q559486","display_name":"System lifecycle","level":4,"score":0.2676999866962433},{"id":"https://openalex.org/C116672817","wikidata":"https://www.wikidata.org/wiki/Q1454986","display_name":"Physical system","level":2,"score":0.2671999931335449},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.262800008058548},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.2599000036716461},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.2581000030040741},{"id":"https://openalex.org/C190793597","wikidata":"https://www.wikidata.org/wiki/Q189768","display_name":"Application layer","level":3,"score":0.2572999894618988},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.2547999918460846}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2025.3616633","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2025.3616633","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8170088271","display_name":null,"funder_award_id":"72431008","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W2182963870","https://openalex.org/W2955505714","https://openalex.org/W2996516003","https://openalex.org/W3039095521","https://openalex.org/W3156498195","https://openalex.org/W3190840618","https://openalex.org/W3196193092","https://openalex.org/W4210866977","https://openalex.org/W4224228388","https://openalex.org/W4288391504","https://openalex.org/W4307818375","https://openalex.org/W4312406892","https://openalex.org/W4315779569","https://openalex.org/W4321484089","https://openalex.org/W4321484469","https://openalex.org/W4353027386","https://openalex.org/W4353055388","https://openalex.org/W4385444588","https://openalex.org/W4385569536","https://openalex.org/W4386316965","https://openalex.org/W4386737193","https://openalex.org/W4387842627","https://openalex.org/W4389381728","https://openalex.org/W4391065242","https://openalex.org/W4400726456","https://openalex.org/W4400760979","https://openalex.org/W4402159352","https://openalex.org/W4403211112","https://openalex.org/W4403500792","https://openalex.org/W4405599246","https://openalex.org/W4405806738","https://openalex.org/W4406329790","https://openalex.org/W4406458157","https://openalex.org/W4408958290","https://openalex.org/W4410740559","https://openalex.org/W4411019622","https://openalex.org/W4411668336","https://openalex.org/W4412067487"],"related_works":[],"abstract_inverted_index":{"With":[0],"the":[1,33,43,78,90,110,123,129,133,140,143,148,163,169,188,198,208,219,229,234],"advancement":[2],"of":[3,35,92,126,151],"digitalization":[4],"and":[5,50,73,83,104,132,155],"intelligentization":[6],"in":[7,128,139,204,211,218,233],"manufacturing":[8,13],"systems,":[9],"digital":[10],"twin-driven":[11],"cyber-physical":[12],"systems":[14],"(DT-driven":[15],"CPMSs)":[16],"have":[17,29,39],"emerged":[18],"as":[19],"a":[20,117,192],"key":[21,193],"technology":[22],"for":[23,66,195],"enabling":[24],"smart":[25],"manufacturing.":[26],"Existing":[27],"studies":[28],"primarily":[30],"focused":[31],"on":[32,109],"applications":[34],"DT":[36],"technology,":[37],"but":[38],"not":[40],"fully":[41],"addressed":[42],"reliability":[44,119,145,176,213],"challenges":[45],"arising":[46],"from":[47],"equipment":[48,138,153],"degradation":[49,154],"sudden":[51,156],"failures":[52],"during":[53],"system":[54,112,118,175,196,212],"operation.":[55],"To":[56],"address":[57],"this":[58],"challenge,":[59],"we":[60,114],"propose":[61],"an":[62],"interdependent":[63],"network":[64],"model":[65,88,146,171],"DT-driven":[67],"CPMSs":[68],"that":[69,168,186],"integrates":[70],"real-time":[71],"sensing":[72],"control":[74],"feedback":[75],"dependencies":[76,94,161],"across":[77],"cyber":[79,130,189,235],"layer,":[80,82,142],"physical":[81,141,199,220],"virtual":[84],"decision":[85],"space.":[86],"The":[87],"emphasizes":[89],"characterization":[91],"data":[93,102,127],"between":[95],"devices":[96],"under":[97,159,178],"sensing-control":[98,160],"dependencies,":[99],"including":[100],"production":[101,106],"support":[103],"collaborative":[105],"dependencies.":[107],"Based":[108],"proposed":[111,144,170],"model,":[113],"further":[115],"develop":[116],"model.":[120],"By":[121],"incorporating":[122],"routing-driven":[124],"characteristics":[125],"layer":[131,190,200,221],"material":[134],"supply-demand":[135],"relationships":[136],"among":[137],"enables":[147],"joint":[149],"modeling":[150],"long-term":[152],"failure":[157],"propagation":[158],"within":[162],"system.":[164],"Experimental":[165],"results":[166],"demonstrate":[167],"can":[172],"effectively":[173],"capture":[174],"behavior":[177],"these":[179],"challenging":[180],"operational":[181],"conditions.":[182],"Further":[183],"analysis":[184],"reveals":[185],"although":[187],"constitutes":[191],"bottleneck":[194],"reliability,":[197],"is":[201,225],"more":[202],"effective":[203],"regulating":[205],"it.":[206],"Specifically,":[207],"average":[209],"gain":[210,231],"achieved":[214,232],"through":[215],"redundancy":[216],"enhancement":[217],"reaches":[222],"0.82,":[223],"which":[224],"significantly":[226],"higher":[227],"than":[228],"0.39":[230],"layer.":[236]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-03T23:09:05.601824","created_date":"2025-10-14T00:00:00"}