{"id":"https://openalex.org/W4414349321","doi":"https://doi.org/10.1109/tr.2025.3607784","title":"Adaptive Random Testing of Deep Learning Systems Using Image Hashing","display_name":"Adaptive Random Testing of Deep Learning Systems Using Image Hashing","publication_year":2025,"publication_date":"2025-09-19","ids":{"openalex":"https://openalex.org/W4414349321","doi":"https://doi.org/10.1109/tr.2025.3607784"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2025.3607784","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2025.3607784","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103629722","display_name":"L. H. Yi","orcid":null},"institutions":[{"id":"https://openalex.org/I111950717","display_name":"Macau University of Science and Technology","ror":"https://ror.org/03jqs2n27","country_code":"MO","type":"education","lineage":["https://openalex.org/I111950717","https://openalex.org/I4391767947"]}],"countries":["MO"],"is_corresponding":true,"raw_author_name":"Linwei Yi","raw_affiliation_strings":["School of Computer Science and Engineering, Macau University of Science and Technology, Taipa, Macau"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Macau University of Science and Technology, Taipa, Macau","institution_ids":["https://openalex.org/I111950717"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101806088","display_name":"Chenhui Cui","orcid":"https://orcid.org/0009-0004-8746-316X"},"institutions":[{"id":"https://openalex.org/I111950717","display_name":"Macau University of Science and Technology","ror":"https://ror.org/03jqs2n27","country_code":"MO","type":"education","lineage":["https://openalex.org/I111950717","https://openalex.org/I4391767947"]}],"countries":["MO"],"is_corresponding":false,"raw_author_name":"Chenhui Cui","raw_affiliation_strings":["School of Computer Science and Engineering, Macau University of Science and Technology, Taipa, Macau"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Macau University of Science and Technology, Taipa, Macau","institution_ids":["https://openalex.org/I111950717"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053562000","display_name":"Rubing Huang","orcid":"https://orcid.org/0000-0002-1769-6126"},"institutions":[{"id":"https://openalex.org/I111950717","display_name":"Macau University of Science and Technology","ror":"https://ror.org/03jqs2n27","country_code":"MO","type":"education","lineage":["https://openalex.org/I111950717","https://openalex.org/I4391767947"]}],"countries":["MO"],"is_corresponding":false,"raw_author_name":"Rubing Huang","raw_affiliation_strings":["School of Computer Science and Engineering, Macau University of Science and Technology, Taipa, Macau"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Macau University of Science and Technology, Taipa, Macau","institution_ids":["https://openalex.org/I111950717"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049154334","display_name":"Dave Towey","orcid":"https://orcid.org/0000-0003-0877-4353"},"institutions":[{"id":"https://openalex.org/I13591777","display_name":"University of Nottingham Ningbo China","ror":"https://ror.org/03y4dt428","country_code":"CN","type":"education","lineage":["https://openalex.org/I13591777","https://openalex.org/I142263535"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dave Towey","raw_affiliation_strings":["School of Computer Science, University of Nottingham Ningbo China, Ningbo, China"],"affiliations":[{"raw_affiliation_string":"School of Computer Science, University of Nottingham Ningbo China, Ningbo, China","institution_ids":["https://openalex.org/I13591777"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062482669","display_name":"Rongcun Wang","orcid":"https://orcid.org/0000-0002-9685-9893"},"institutions":[{"id":"https://openalex.org/I25757504","display_name":"China University of Mining and Technology","ror":"https://ror.org/01xt2dr21","country_code":"CN","type":"education","lineage":["https://openalex.org/I25757504"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rongcun Wang","raw_affiliation_strings":["School of Computer Science and Technology, China University of Mining and Technology, Xuzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, China University of Mining and Technology, Xuzhou, China","institution_ids":["https://openalex.org/I25757504"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5103629722"],"corresponding_institution_ids":["https://openalex.org/I111950717"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.25026023,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"74","issue":"4","first_page":"4985","last_page":"4999"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9868999719619751,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.977400004863739,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.753000020980835},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5152000188827515},{"id":"https://openalex.org/keywords/hash-function","display_name":"Hash function","score":0.4903999865055084},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.4844000041484833},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.3691999912261963},{"id":"https://openalex.org/keywords/probability-distribution","display_name":"Probability distribution","score":0.33640000224113464},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.3319000005722046},{"id":"https://openalex.org/keywords/random-testing","display_name":"Random testing","score":0.3314000070095062}],"concepts":[{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.753000020980835},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.734000027179718},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7246000170707703},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5152000188827515},{"id":"https://openalex.org/C99138194","wikidata":"https://www.wikidata.org/wiki/Q183427","display_name":"Hash function","level":2,"score":0.4903999865055084},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4844000041484833},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.3691999912261963},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3603000044822693},{"id":"https://openalex.org/C149441793","wikidata":"https://www.wikidata.org/wiki/Q200726","display_name":"Probability distribution","level":2,"score":0.33640000224113464},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.3319000005722046},{"id":"https://openalex.org/C106159264","wikidata":"https://www.wikidata.org/wiki/Q17146789","display_name":"Random testing","level":4,"score":0.3314000070095062},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.32499998807907104},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.3043000102043152},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.30309998989105225},{"id":"https://openalex.org/C2986577269","wikidata":"https://www.wikidata.org/wiki/Q11306265","display_name":"Random noise","level":2,"score":0.29109999537467957},{"id":"https://openalex.org/C2984842247","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep neural networks","level":3,"score":0.28519999980926514},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.27399998903274536},{"id":"https://openalex.org/C87007009","wikidata":"https://www.wikidata.org/wiki/Q210832","display_name":"Statistical hypothesis testing","level":2,"score":0.271699994802475},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.26159998774528503},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.2606000006198883},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.258899986743927},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.25859999656677246},{"id":"https://openalex.org/C8272713","wikidata":"https://www.wikidata.org/wiki/Q176737","display_name":"Stochastic process","level":2,"score":0.2522999942302704},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.2515000104904175},{"id":"https://openalex.org/C122123141","wikidata":"https://www.wikidata.org/wiki/Q176623","display_name":"Random variable","level":2,"score":0.25049999356269836}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2025.3607784","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2025.3607784","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":69,"referenced_works":["https://openalex.org/W1857789879","https://openalex.org/W1952053308","https://openalex.org/W1976365965","https://openalex.org/W1979136446","https://openalex.org/W1996118086","https://openalex.org/W2001610032","https://openalex.org/W2007339694","https://openalex.org/W2010962701","https://openalex.org/W2063689849","https://openalex.org/W2071112258","https://openalex.org/W2098639318","https://openalex.org/W2109190643","https://openalex.org/W2112796928","https://openalex.org/W2143545157","https://openalex.org/W2143998759","https://openalex.org/W2153396332","https://openalex.org/W2157083801","https://openalex.org/W2161160262","https://openalex.org/W2194775991","https://openalex.org/W2255466643","https://openalex.org/W2292289085","https://openalex.org/W2546881228","https://openalex.org/W2616028256","https://openalex.org/W2798302089","https://openalex.org/W2799225258","https://openalex.org/W2804337238","https://openalex.org/W2809254203","https://openalex.org/W2888824816","https://openalex.org/W2919115771","https://openalex.org/W2954678575","https://openalex.org/W2963327228","https://openalex.org/W2963529408","https://openalex.org/W2963913218","https://openalex.org/W2964236337","https://openalex.org/W2971622202","https://openalex.org/W2997429195","https://openalex.org/W3000466451","https://openalex.org/W3005210727","https://openalex.org/W3041931538","https://openalex.org/W3048108174","https://openalex.org/W3089756992","https://openalex.org/W3106310598","https://openalex.org/W3114523470","https://openalex.org/W3122391591","https://openalex.org/W3124977335","https://openalex.org/W3160261825","https://openalex.org/W3172835673","https://openalex.org/W3204945965","https://openalex.org/W3208708185","https://openalex.org/W4206062344","https://openalex.org/W4206882053","https://openalex.org/W4243174425","https://openalex.org/W4251988601","https://openalex.org/W4319663674","https://openalex.org/W4327782044","https://openalex.org/W4364295506","https://openalex.org/W4377694756","https://openalex.org/W4385532348","https://openalex.org/W4386294578","https://openalex.org/W4387042251","https://openalex.org/W4387805880","https://openalex.org/W4388692632","https://openalex.org/W4392470720","https://openalex.org/W4392544066","https://openalex.org/W4399728013","https://openalex.org/W4400438498","https://openalex.org/W4400527517","https://openalex.org/W4401069923","https://openalex.org/W4406333329"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}