{"id":"https://openalex.org/W4409014865","doi":"https://doi.org/10.1109/tr.2025.3550972","title":"FNS-CATF-CAC: An Efficient Crosstalk Avoidance Code to Reduce the Switching Activity in TSV Arrays","display_name":"FNS-CATF-CAC: An Efficient Crosstalk Avoidance Code to Reduce the Switching Activity in TSV Arrays","publication_year":2025,"publication_date":"2025-03-31","ids":{"openalex":"https://openalex.org/W4409014865","doi":"https://doi.org/10.1109/tr.2025.3550972"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2025.3550972","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2025.3550972","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103652842","display_name":"Chen Wei","orcid":"https://orcid.org/0000-0002-1374-555X"},"institutions":[{"id":"https://openalex.org/I4210128628","display_name":"Peking University Shenzhen Hospital","ror":"https://ror.org/03kkjyb15","country_code":"CN","type":"healthcare","lineage":["https://openalex.org/I4210128628"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chen Wei","raw_affiliation_strings":["Peking University Shenzhen Graduate School, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Peking University Shenzhen Graduate School, Shenzhen, China","institution_ids":["https://openalex.org/I4210128628"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050097039","display_name":"Xiaole Cui","orcid":"https://orcid.org/0000-0002-3382-3703"},"institutions":[{"id":"https://openalex.org/I4210128628","display_name":"Peking University Shenzhen Hospital","ror":"https://ror.org/03kkjyb15","country_code":"CN","type":"healthcare","lineage":["https://openalex.org/I4210128628"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaole Cui","raw_affiliation_strings":["Peking University Shenzhen Graduate School, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Peking University Shenzhen Graduate School, Shenzhen, China","institution_ids":["https://openalex.org/I4210128628"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5103652842"],"corresponding_institution_ids":["https://openalex.org/I4210128628"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06207684,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"74","issue":"3","first_page":"3856","last_page":"3870"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/crosstalk","display_name":"Crosstalk","score":0.737739086151123},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47979098558425903},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4450414478778839},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42889177799224854},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.411574125289917},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2264266014099121}],"concepts":[{"id":"https://openalex.org/C169822122","wikidata":"https://www.wikidata.org/wiki/Q230187","display_name":"Crosstalk","level":2,"score":0.737739086151123},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47979098558425903},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4450414478778839},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42889177799224854},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.411574125289917},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2264266014099121}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2025.3550972","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2025.3550972","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4484392832","display_name":null,"funder_award_id":"92373206","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W610124573","https://openalex.org/W1999816809","https://openalex.org/W2003631910","https://openalex.org/W2019327813","https://openalex.org/W2044056844","https://openalex.org/W2061325516","https://openalex.org/W2115468262","https://openalex.org/W2118186082","https://openalex.org/W2130923737","https://openalex.org/W2148691930","https://openalex.org/W2153731436","https://openalex.org/W2162454039","https://openalex.org/W2176596933","https://openalex.org/W2318606705","https://openalex.org/W2339835718","https://openalex.org/W2506857935","https://openalex.org/W2529574553","https://openalex.org/W2562958946","https://openalex.org/W2589056695","https://openalex.org/W2744231193","https://openalex.org/W2768390315","https://openalex.org/W2775751014","https://openalex.org/W2801180791","https://openalex.org/W2896973942","https://openalex.org/W2897164320","https://openalex.org/W2904932589","https://openalex.org/W3000646767","https://openalex.org/W3187922740","https://openalex.org/W4250450018","https://openalex.org/W4285255508","https://openalex.org/W4313546932","https://openalex.org/W4385977568"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2622826586","https://openalex.org/W2167472940","https://openalex.org/W2390279801","https://openalex.org/W4280525841","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345"],"abstract_inverted_index":{"The":[0,39,103],"through":[1],"silicon":[2],"via":[3],"(TSV)":[4],"arrays":[5],"play":[6],"the":[7,14,20,24,28,33,47,53,60,66,72,84,92,97,108,112,115,120,123,135,140,147],"role":[8],"of":[9,58,114],"vertical":[10],"electrical":[11],"interconnections":[12],"in":[13,36,62,111,131,150],"3-D":[15],"stacked":[16],"integrated":[17],"circuits.":[18],"However,":[19],"coupling":[21],"crosstalk":[22,40,61,75,109],"between":[23],"adjacent":[25,87],"TSVs":[26],"increases":[27],"interconnection":[29],"delay":[30],"and":[31,78,99],"deteriorates":[32],"signal":[34],"integrity":[35],"TSV":[37,63,101,151],"arrays.":[38,102,133,152],"avoidance":[41],"code":[42],"(CAC)":[43],"techniques":[44],"based":[45],"on":[46,143],"Fibonacci":[48],"numeral":[49],"system":[50],"(FNS)":[51],"or":[52],"improved":[54],"FNS":[55],"are":[56,69],"capable":[57],"mitigating":[59],"arrays,":[64],"but":[65],"existing":[67],"schemes":[68],"hindered":[70],"by":[71],"hardware":[73,129],"overhead,":[74],"suppression":[76],"ability":[77],"switching":[79,141],"activity.":[80],"This":[81],"article":[82],"proposes":[83],"FNS-based":[85],"cyclic":[86],"transition":[88],"free":[89],"CAC":[90],"with":[91,119],"ouroboros":[93],"mapping":[94],"rule":[95],"for":[96],"rectangular":[98],"hexagonal":[100],"proposed":[104,124,136],"scheme":[105,125],"can":[106,138],"reduce":[107,139],"even":[110],"presence":[113],"edge":[116],"effect.":[117],"Compared":[118],"previous":[121],"methods,":[122],"consumes":[126],"significantly":[127],"small":[128],"overhead":[130],"large-scale":[132],"And":[134],"method":[137],"activity":[142],"TSVs,":[144],"thereby":[145],"alleviating":[146],"power":[148],"consumption":[149]},"counts_by_year":[],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}