{"id":"https://openalex.org/W4407097989","doi":"https://doi.org/10.1109/tr.2025.3530983","title":"Analytical Calculation Method for Power Supply Reliability of Distribution Systems With Multiple Tie Lines","display_name":"Analytical Calculation Method for Power Supply Reliability of Distribution Systems With Multiple Tie Lines","publication_year":2025,"publication_date":"2025-02-03","ids":{"openalex":"https://openalex.org/W4407097989","doi":"https://doi.org/10.1109/tr.2025.3530983"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2025.3530983","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2025.3530983","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023747664","display_name":"Fengzhang Luo","orcid":"https://orcid.org/0000-0001-7136-6200"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fengzhang Luo","raw_affiliation_strings":["Key Laboratory of Smart Grid of Ministry of Education, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0001-7136-6200","affiliations":[{"raw_affiliation_string":"Key Laboratory of Smart Grid of Ministry of Education, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051875955","display_name":"Nan Ge","orcid":"https://orcid.org/0009-0000-1445-1038"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Nan Ge","raw_affiliation_strings":["State Grid Suzhou Power Supply Company, Suzhou, China"],"raw_orcid":"https://orcid.org/0009-0000-1445-1038","affiliations":[{"raw_affiliation_string":"State Grid Suzhou Power Supply Company, Suzhou, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5107558099","display_name":"Jing Xu","orcid":"https://orcid.org/0000-0003-2156-4115"},"institutions":[{"id":"https://openalex.org/I4210097143","display_name":"Tianjin Research Institute of Electric Science (China)","ror":"https://ror.org/010ryc044","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210097143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Xu","raw_affiliation_strings":["State Grid Tianjin Electric Power Company, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Grid Tianjin Electric Power Company, Tianjin, China","institution_ids":["https://openalex.org/I4210097143"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.5002,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.86345619,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"74","issue":"3","first_page":"3180","last_page":"3191"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9847000241279602,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9847000241279602,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12451","display_name":"Smart Grid and Power Systems","score":0.9825000166893005,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14276","display_name":"Power Systems and Technologies","score":0.9789000153541565,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7351151704788208},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6761729717254639},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.5466393828392029},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.43892377614974976},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42833754420280457},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4035716950893402},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.23335200548171997},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.128956139087677}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7351151704788208},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6761729717254639},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.5466393828392029},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.43892377614974976},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42833754420280457},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4035716950893402},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.23335200548171997},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.128956139087677},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2025.3530983","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2025.3530983","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7699999809265137,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G6266584456","display_name":null,"funder_award_id":"51977140","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1502876580","https://openalex.org/W1976401600","https://openalex.org/W1977887480","https://openalex.org/W2066787887","https://openalex.org/W2119169328","https://openalex.org/W2122955556","https://openalex.org/W2132664787","https://openalex.org/W2133062475","https://openalex.org/W2136103630","https://openalex.org/W2142007572","https://openalex.org/W2164261710","https://openalex.org/W2168524134","https://openalex.org/W2171596692","https://openalex.org/W2172339876","https://openalex.org/W2802644148","https://openalex.org/W2802887772","https://openalex.org/W4247323064","https://openalex.org/W4248129407"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4233600955","https://openalex.org/W4322734194","https://openalex.org/W3116237489","https://openalex.org/W4404996554","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935"],"abstract_inverted_index":{"The":[0,176,192],"existing":[1],"methods":[2,34],"for":[3,68,78,131,225],"distribution":[4,79,108,162,230],"system":[5,80,109,163,220],"reliability":[6,53,81,126,164,227],"assessment":[7,54],"mainly":[8],"adopt":[9],"the":[10,26,41,45,52,58,69,85,100,107,129,133,152,161,171,182,196,201,206,209,226],"multiple":[11],"iteration":[12],"calculation":[13,76,167],"modes":[14],"of":[15,18,47,99,104,106,208,229],"traversal":[16],"search":[17],"failure":[19,27,48,87,155],"scenarios":[20],"one":[21,23],"by":[22],"to":[24,40,125,149],"get":[25],"effect":[28,49,88],"area":[29],"and":[30,37,44,118,157,187,222],"degree.":[31],"However,":[32],"these":[33],"are":[35,122,139],"time-consuming":[36],"low-efficiency,":[38],"due":[39],"repeated":[42],"searches":[43],"complexity":[46],"analysis.":[50,127],"Meanwhile,":[51],"results":[55,193],"only":[56],"representing":[57],"system's":[59],"average":[60],"level":[61],"always":[62],"cannot":[63],"provide":[64,215],"weak":[65,223],"link":[66],"information":[67,218],"operators.":[70],"In":[71],"this":[72],"article,":[73],"an":[74,95,143],"analytical":[75,166],"method":[77,168,178,197],"index":[82,165],"based":[83,169],"on":[84,170,219],"improved":[86,144,172],"incidence":[89,96],"matrix":[90,138],"(FEIM)":[91],"is":[92,110,147,174,179],"proposed.":[93],"First,":[94],"matrix-based":[97],"modeling":[98],"complete":[101],"topological":[102],"association":[103,137],"source-network-load":[105],"conducted,":[111],"including":[112],"node-branch":[113],"relationships,":[114],"segment":[115],"switch's":[116],"locations,":[117,120],"fuse":[119],"which":[121],"closely":[123],"related":[124],"And":[128],"rules":[130],"calculating":[132],"source-load":[134],"power":[135],"supply":[136],"also":[140],"provided.":[141],"Next,":[142],"FEIM":[145,173],"model":[146],"established":[148],"analytically":[150],"express":[151],"correlation":[153],"between":[154],"components":[156],"affected":[158],"loads.":[159],"Finally,":[160],"presented.":[175],"proposed":[177],"validated":[180],"using":[181],"IEEE":[183],"RBTS":[184],"bus-6":[185],"case":[186],"a":[188],"modified":[189],"96-node":[190],"case.":[191],"demonstrate":[194],"that":[195],"can":[198,213],"significantly":[199],"improve":[200],"computation":[202],"efficiency":[203],"while":[204],"ensuring":[205],"accuracy":[207],"results.":[210],"Additionally,":[211],"it":[212],"conveniently":[214],"more":[216],"efficient":[217],"bottlenecks":[221],"points":[224],"improvement":[228],"systems.":[231]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2}],"updated_date":"2025-12-21T01:58:51.020947","created_date":"2025-10-10T00:00:00"}