{"id":"https://openalex.org/W4407736656","doi":"https://doi.org/10.1109/tr.2025.3528074","title":"A Deep-Learning-Based Framework to Predict the Reliability of Multicomponent Repairable Systems in a Closed-Loop Supply Chain","display_name":"A Deep-Learning-Based Framework to Predict the Reliability of Multicomponent Repairable Systems in a Closed-Loop Supply Chain","publication_year":2025,"publication_date":"2025-02-19","ids":{"openalex":"https://openalex.org/W4407736656","doi":"https://doi.org/10.1109/tr.2025.3528074"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2025.3528074","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2025.3528074","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.science/hal-04973288","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091443073","display_name":"Abdelhamid Boujarif","orcid":"https://orcid.org/0000-0003-0641-9470"},"institutions":[{"id":"https://openalex.org/I277688954","display_name":"Universit\u00e9 Paris-Saclay","ror":"https://ror.org/03xjwb503","country_code":"FR","type":"education","lineage":["https://openalex.org/I277688954"]},{"id":"https://openalex.org/I4210107720","display_name":"CentraleSup\u00e9lec","ror":"https://ror.org/019tcpt25","country_code":"FR","type":"facility","lineage":["https://openalex.org/I277688954","https://openalex.org/I4210107720"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Abdelhamid Boujarif","raw_affiliation_strings":["Industrial Engineering Laboratory (LGI) CentraleSupélec, Paris-Saclay University, Gif-sur-Yvette, France"],"raw_orcid":"https://orcid.org/0000-0003-0641-9470","affiliations":[{"raw_affiliation_string":"Industrial Engineering Laboratory (LGI) CentraleSupélec, Paris-Saclay University, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I4210107720","https://openalex.org/I277688954"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013847446","display_name":"David W. Coit","orcid":"https://orcid.org/0000-0002-5825-2548"},"institutions":[{"id":"https://openalex.org/I102322142","display_name":"Rutgers, The State University of New Jersey","ror":"https://ror.org/05vt9qd57","country_code":"US","type":"education","lineage":["https://openalex.org/I102322142"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David W. Coit","raw_affiliation_strings":["Department of Industrial, Systems Engineering, Rutgers University, Piscataway, NJ, USA"],"raw_orcid":"https://orcid.org/0000-0002-5825-2548","affiliations":[{"raw_affiliation_string":"Department of Industrial, Systems Engineering, Rutgers University, Piscataway, NJ, USA","institution_ids":["https://openalex.org/I102322142"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046267369","display_name":"Oualid Jouini","orcid":"https://orcid.org/0000-0002-9498-165X"},"institutions":[{"id":"https://openalex.org/I277688954","display_name":"Universit\u00e9 Paris-Saclay","ror":"https://ror.org/03xjwb503","country_code":"FR","type":"education","lineage":["https://openalex.org/I277688954"]},{"id":"https://openalex.org/I4210107720","display_name":"CentraleSup\u00e9lec","ror":"https://ror.org/019tcpt25","country_code":"FR","type":"facility","lineage":["https://openalex.org/I277688954","https://openalex.org/I4210107720"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Oualid Jouini","raw_affiliation_strings":["Industrial Engineering Laboratory (LGI) CentraleSupélec, Paris-Saclay University, Gif-sur-Yvette, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Engineering Laboratory (LGI) CentraleSupélec, Paris-Saclay University, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I4210107720","https://openalex.org/I277688954"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016477281","display_name":"Zhiguo Zeng","orcid":"https://orcid.org/0000-0003-4937-4380"},"institutions":[{"id":"https://openalex.org/I277688954","display_name":"Universit\u00e9 Paris-Saclay","ror":"https://ror.org/03xjwb503","country_code":"FR","type":"education","lineage":["https://openalex.org/I277688954"]},{"id":"https://openalex.org/I4210107720","display_name":"CentraleSup\u00e9lec","ror":"https://ror.org/019tcpt25","country_code":"FR","type":"facility","lineage":["https://openalex.org/I277688954","https://openalex.org/I4210107720"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Zhiguo Zeng","raw_affiliation_strings":["Industrial Engineering Laboratory (LGI) CentraleSupélec, Paris-Saclay University, Gif-sur-Yvette, France"],"raw_orcid":"https://orcid.org/0000-0003-4937-4380","affiliations":[{"raw_affiliation_string":"Industrial Engineering Laboratory (LGI) CentraleSupélec, Paris-Saclay University, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I4210107720","https://openalex.org/I277688954"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044812540","display_name":"Robert Heidsieck","orcid":"https://orcid.org/0009-0006-0639-7581"},"institutions":[{"id":"https://openalex.org/I4210153881","display_name":"General Electric (France)","ror":"https://ror.org/04q26jh72","country_code":"FR","type":"company","lineage":["https://openalex.org/I1332737386","https://openalex.org/I4210153881"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Robert Heidsieck","raw_affiliation_strings":["General Electric Healthcare, Buc, France"],"raw_orcid":"https://orcid.org/0009-0006-0639-7581","affiliations":[{"raw_affiliation_string":"General Electric Healthcare, Buc, France","institution_ids":["https://openalex.org/I4210153881"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.4028,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.79577434,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":"74","issue":"3","first_page":"3809","last_page":"3823"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12017","display_name":"Recycling and Waste Management Techniques","score":0.7206000089645386,"subfield":{"id":"https://openalex.org/subfields/2311","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12017","display_name":"Recycling and Waste Management Techniques","score":0.7206000089645386,"subfield":{"id":"https://openalex.org/subfields/2311","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.6668999791145325,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6995142698287964},{"id":"https://openalex.org/keywords/supply-chain","display_name":"Supply chain","score":0.6922370195388794},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6898757815361023},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.619876503944397},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5724725723266602},{"id":"https://openalex.org/keywords/loop","display_name":"Loop (graph theory)","score":0.4536352753639221},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.2429182231426239},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2427746057510376},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13960999250411987},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.07869043946266174}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6995142698287964},{"id":"https://openalex.org/C108713360","wikidata":"https://www.wikidata.org/wiki/Q1824206","display_name":"Supply chain","level":2,"score":0.6922370195388794},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6898757815361023},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.619876503944397},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5724725723266602},{"id":"https://openalex.org/C184670325","wikidata":"https://www.wikidata.org/wiki/Q512604","display_name":"Loop (graph theory)","level":2,"score":0.4536352753639221},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.2429182231426239},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2427746057510376},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13960999250411987},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.07869043946266174},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tr.2025.3528074","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2025.3528074","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-04973288v1","is_oa":true,"landing_page_url":"https://hal.science/hal-04973288","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Reliability, 2025, pp.1-15. ⟨10.1109/TR.2025.3528074⟩","raw_type":"Journal articles"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-04973288v1","is_oa":true,"landing_page_url":"https://hal.science/hal-04973288","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Reliability, 2025, pp.1-15. ⟨10.1109/TR.2025.3528074⟩","raw_type":"Journal articles"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3535496142","display_name":"Digital Failure Twin for online reliability assessment and predictive maintenance of future manufacturing systems","funder_award_id":"ANR-22-CE10-0004","funder_id":"https://openalex.org/F4320320883","funder_display_name":"Agence Nationale de la Recherche"}],"funders":[{"id":"https://openalex.org/F4320320883","display_name":"Agence Nationale de la Recherche","ror":"https://ror.org/00rbzpz17"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":48,"referenced_works":["https://openalex.org/W930082539","https://openalex.org/W1665563134","https://openalex.org/W2017853194","https://openalex.org/W2019747896","https://openalex.org/W2020343287","https://openalex.org/W2025921730","https://openalex.org/W2072470287","https://openalex.org/W2076952689","https://openalex.org/W2096904991","https://openalex.org/W2115555060","https://openalex.org/W2124687376","https://openalex.org/W2139923370","https://openalex.org/W2152270473","https://openalex.org/W2160479567","https://openalex.org/W2263385380","https://openalex.org/W2530581966","https://openalex.org/W2591465947","https://openalex.org/W2607002408","https://openalex.org/W2807414627","https://openalex.org/W2887976372","https://openalex.org/W2895790544","https://openalex.org/W2904422658","https://openalex.org/W2918381520","https://openalex.org/W2926425062","https://openalex.org/W2939208243","https://openalex.org/W2966675498","https://openalex.org/W2981645560","https://openalex.org/W2998647565","https://openalex.org/W3008297566","https://openalex.org/W3008314309","https://openalex.org/W3013517388","https://openalex.org/W3027841272","https://openalex.org/W3036251830","https://openalex.org/W3038964916","https://openalex.org/W3047407194","https://openalex.org/W3109725889","https://openalex.org/W3131698473","https://openalex.org/W3193452307","https://openalex.org/W3202929943","https://openalex.org/W4221099311","https://openalex.org/W4233914278","https://openalex.org/W4287981142","https://openalex.org/W4290652346","https://openalex.org/W4307290295","https://openalex.org/W4317938431","https://openalex.org/W4320035247","https://openalex.org/W4384831936","https://openalex.org/W4404450244"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4233600955","https://openalex.org/W4322734194","https://openalex.org/W3116237489","https://openalex.org/W4404996554","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935"],"abstract_inverted_index":{"In":[0],"this":[1],"article,":[2],"we":[3],"develop":[4],"a":[5,44],"data-driven":[6],"approach":[7],"to":[8,39,52],"predict":[9],"the":[10,32],"reliability":[11,22,54],"of":[12,31,65,94],"multicomponent":[13],"repairable":[14],"systems,":[15,99],"considering":[16],"component":[17,21],"dependencies.":[18],"We":[19],"estimate":[20],"functions":[23],"from":[24,71,103],"system-level":[25],"time-to-failure":[26],"data":[27,42,70],"without":[28],"prior":[29],"knowledge":[30],"system":[33,53],"structure":[34],"and":[35,56,68,88],"use":[36],"these":[37],"estimates":[38],"generate":[40],"training":[41],"for":[43,97],"deep":[45],"long":[46],"short-term":[47],"memory":[48],"network.":[49],"This":[50],"leads":[51],"prediction":[55],"addresses":[57],"uncertainties":[58],"through":[59,63],"quantile":[60],"regression.":[61],"Validated":[62],"simulations":[64],"500":[66],"systems":[67],"real-world":[69],"GE":[72],"HealthCare":[73],"magnetic":[74],"resonance":[75],"imaging":[76],"(MRI)":[77],"machines,":[78],"our":[79],"model":[80,87],"outperforms":[81],"traditional":[82],"methods":[83],"(such":[84],"as":[85],"Cox":[86],"random":[89],"survival":[90],"forest)":[91],"in":[92],"terms":[93],"accuracy,":[95],"particularly":[96],"complex":[98],"by":[100],"effectively":[101],"learning":[102],"uncertainties.":[104]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-06-22T08:00:12.763002","created_date":"2025-10-10T00:00:00"}