{"id":"https://openalex.org/W4403863664","doi":"https://doi.org/10.1109/tr.2024.3465548","title":"Belief Connection Reliability Algorithm for Networks With Epistemic Uncertainty","display_name":"Belief Connection Reliability Algorithm for Networks With Epistemic Uncertainty","publication_year":2024,"publication_date":"2024-10-29","ids":{"openalex":"https://openalex.org/W4403863664","doi":"https://doi.org/10.1109/tr.2024.3465548"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2024.3465548","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2024.3465548","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021203463","display_name":"Ji Ma","orcid":"https://orcid.org/0000-0002-4228-6620"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ji Ma","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089652419","display_name":"Yu Wang","orcid":"https://orcid.org/0000-0002-6914-1536"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Wang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077376806","display_name":"Ruiying Li","orcid":"https://orcid.org/0000-0001-8044-4813"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruiying Li","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-8044-4813","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102026831","display_name":"Rui Kang","orcid":"https://orcid.org/0000-0002-4488-6574"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rui Kang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-4488-6574","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5021203463"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":1.0092,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.78621305,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"74","issue":"2","first_page":"2955","last_page":"2967"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12879","display_name":"Distributed Sensor Networks and Detection Algorithms","score":0.8361999988555908,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12879","display_name":"Distributed Sensor Networks and Detection Algorithms","score":0.8361999988555908,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11303","display_name":"Bayesian Modeling and Causal Inference","score":0.7389000058174133,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10917","display_name":"Smart Grid Security and Resilience","score":0.7111999988555908,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6953887343406677},{"id":"https://openalex.org/keywords/connection","display_name":"Connection (principal bundle)","score":0.6597300171852112},{"id":"https://openalex.org/keywords/uncertainty-quantification","display_name":"Uncertainty quantification","score":0.6553021669387817},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.5688843727111816},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5549658536911011},{"id":"https://openalex.org/keywords/uncertainty-theory","display_name":"Uncertainty theory","score":0.45510023832321167},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.43480390310287476},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3900451362133026},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.3526599407196045},{"id":"https://openalex.org/keywords/epistemology","display_name":"Epistemology","score":0.33300864696502686},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.30406123399734497},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.2638004720211029},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.19757777452468872},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16438841819763184},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.13004496693611145},{"id":"https://openalex.org/keywords/philosophy","display_name":"Philosophy","score":0.12238466739654541},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.09450289607048035}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6953887343406677},{"id":"https://openalex.org/C13355873","wikidata":"https://www.wikidata.org/wiki/Q2920850","display_name":"Connection (principal bundle)","level":2,"score":0.6597300171852112},{"id":"https://openalex.org/C32230216","wikidata":"https://www.wikidata.org/wiki/Q7882499","display_name":"Uncertainty quantification","level":2,"score":0.6553021669387817},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.5688843727111816},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5549658536911011},{"id":"https://openalex.org/C51152595","wikidata":"https://www.wikidata.org/wiki/Q7882501","display_name":"Uncertainty theory","level":2,"score":0.45510023832321167},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.43480390310287476},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3900451362133026},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.3526599407196045},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.33300864696502686},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.30406123399734497},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.2638004720211029},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.19757777452468872},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16438841819763184},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.13004496693611145},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.12238466739654541},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.09450289607048035},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2024.3465548","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2024.3465548","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4300000071525574,"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10"}],"awards":[{"id":"https://openalex.org/G2705136316","display_name":null,"funder_award_id":"61773044","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G389188563","display_name":null,"funder_award_id":"WDZC2019601A301","funder_id":"https://openalex.org/F4320329137","funder_display_name":"National key Laboratory of Science and Technology on Reliability and Environmental Engineering"},{"id":"https://openalex.org/G7090823840","display_name":null,"funder_award_id":"62073009","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320329137","display_name":"National key Laboratory of Science and Technology on Reliability and Environmental Engineering","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W1580809199","https://openalex.org/W1966470202","https://openalex.org/W1974173369","https://openalex.org/W1975407578","https://openalex.org/W1981747043","https://openalex.org/W1993152301","https://openalex.org/W1996824380","https://openalex.org/W2001348659","https://openalex.org/W2021171753","https://openalex.org/W2044778367","https://openalex.org/W2046903046","https://openalex.org/W2056132722","https://openalex.org/W2061938780","https://openalex.org/W2091403477","https://openalex.org/W2094388940","https://openalex.org/W2101016216","https://openalex.org/W2109165890","https://openalex.org/W2111959010","https://openalex.org/W2158116897","https://openalex.org/W2175940139","https://openalex.org/W2217611946","https://openalex.org/W2270846732","https://openalex.org/W2296044995","https://openalex.org/W2316232255","https://openalex.org/W2346233588","https://openalex.org/W2464916189","https://openalex.org/W2533534442","https://openalex.org/W2749684329","https://openalex.org/W2792540338","https://openalex.org/W2803460043","https://openalex.org/W2891596109","https://openalex.org/W2962884593","https://openalex.org/W2971380963","https://openalex.org/W3039606315","https://openalex.org/W3091799615","https://openalex.org/W4200376196","https://openalex.org/W4230588984","https://openalex.org/W4234521054","https://openalex.org/W4283448506","https://openalex.org/W4385777608"],"related_works":["https://openalex.org/W3085242784","https://openalex.org/W4300939757","https://openalex.org/W2962655934","https://openalex.org/W2334859043","https://openalex.org/W2067279514","https://openalex.org/W3144902966","https://openalex.org/W4301396966","https://openalex.org/W2127331173","https://openalex.org/W4226013350","https://openalex.org/W2049479034"],"abstract_inverted_index":{"Connection":[0],"reliability,":[1],"which":[2,40],"describes":[3],"the":[4,20,24,34,92,125,142,145,149,161],"capability":[5],"that":[6],"paths":[7],"exist":[8],"between":[9],"specified":[10],"nodes":[11,105],"in":[12],"a":[13,55,131,135,157],"network,":[14],"has":[15,109],"been":[16],"widely":[17],"studied.":[18],"However,":[19],"states":[21],"of":[22,36,144,163],"both":[23],"network":[25,137,153,165],"and":[26,38,84,106,112,120,148,167],"its":[27],"nodes/edges":[28],"have":[29],"epistemic":[30,110],"uncertainty":[31,61],"owing":[32],"to":[33,101,117,140,159],"lack":[35],"data":[37],"information,":[39],"makes":[41],"existing":[42],"connection":[43,57,64,69,75,81,87,128],"reliability":[44,58,76,82,88],"assessment":[45],"methods":[46],"unacceptable.":[47],"To":[48],"solve":[49],"this":[50,52],"problem,":[51],"article":[53],"proposes":[54],"new":[56],"based":[59,122],"on":[60,91,123,134],"theory:":[62],"Belief":[63],"reliability.":[65],"Considering":[66],"different":[67],"node":[68],"requirements,":[70],"we":[71],"define":[72],"two":[73,113],"belief":[74,80,86],"metrics":[77],"as":[78,156],"single-node-pair":[79],"(SBCR)":[83],"multi-node-pair":[85],"(MBCR).":[89],"Based":[90],"uncertain":[93,97],"graph,":[94],"an":[95],"extended":[96],"graph":[98],"is":[99,138,154],"built":[100],"model":[102,166],"networks":[103],"whose":[104],"edges'":[107],"existence":[108],"uncertainty,":[111],"algorithms":[114],"are":[115],"proposed":[116,146],"compute":[118],"SBCR":[119],"MBCR":[121],"finding":[124],"most":[126],"reliable":[127],"path.":[129],"Finally,":[130],"comparison":[132],"study":[133],"small":[136],"used":[139,155],"illustrate":[141],"correctness":[143],"method,":[147],"Belgian":[150],"telephone":[151],"interzonal":[152],"case":[158],"indicate":[160],"effectiveness":[162],"our":[164],"algorithms.":[168]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2}],"updated_date":"2025-12-21T01:58:51.020947","created_date":"2025-10-10T00:00:00"}