{"id":"https://openalex.org/W4396782785","doi":"https://doi.org/10.1109/tr.2024.3393734","title":"Adjusted Trust Score: A Novel Approach for Estimating the Trustworthiness of Software Defect Prediction Models","display_name":"Adjusted Trust Score: A Novel Approach for Estimating the Trustworthiness of Software Defect Prediction Models","publication_year":2024,"publication_date":"2024-05-09","ids":{"openalex":"https://openalex.org/W4396782785","doi":"https://doi.org/10.1109/tr.2024.3393734"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2024.3393734","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2024.3393734","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091107012","display_name":"Xiaohui Wan","orcid":"https://orcid.org/0000-0001-6498-8570"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiaohui Wan","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100459073","display_name":"Zheng Zheng","orcid":"https://orcid.org/0000-0001-7922-9067"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zheng Zheng","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072209187","display_name":"Fangyun Qin","orcid":"https://orcid.org/0000-0002-3407-5161"},"institutions":[{"id":"https://openalex.org/I96852419","display_name":"Capital Normal University","ror":"https://ror.org/005edt527","country_code":"CN","type":"education","lineage":["https://openalex.org/I96852419"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fangyun Qin","raw_affiliation_strings":["College of Information Engineering, Capital Normal University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"College of Information Engineering, Capital Normal University, Beijing, China","institution_ids":["https://openalex.org/I96852419"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016581367","display_name":"Xuhui Lu","orcid":"https://orcid.org/0000-0001-6839-5633"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuhui Lu","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5040278378","display_name":"Kun Qiu","orcid":"https://orcid.org/0000-0002-4121-3665"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kun Qiu","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5091107012"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":1.4811,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.82679739,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":"73","issue":"4","first_page":"1877","last_page":"1891"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9243999719619751,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9243999719619751,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11614","display_name":"Cloud Data Security Solutions","score":0.909500002861023,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/trustworthiness","display_name":"Trustworthiness","score":0.6225581169128418},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6074066758155823},{"id":"https://openalex.org/keywords/software-bug","display_name":"Software bug","score":0.5423144102096558},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.5376812815666199},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5267871022224426},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5118574500083923},{"id":"https://openalex.org/keywords/predictive-modelling","display_name":"Predictive modelling","score":0.44791117310523987},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3587722182273865},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.3390125036239624},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.2684418559074402},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.19027310609817505},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1849035620689392},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.17506253719329834},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15819033980369568},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.09680384397506714}],"concepts":[{"id":"https://openalex.org/C153701036","wikidata":"https://www.wikidata.org/wiki/Q659974","display_name":"Trustworthiness","level":2,"score":0.6225581169128418},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6074066758155823},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.5423144102096558},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.5376812815666199},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5267871022224426},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5118574500083923},{"id":"https://openalex.org/C45804977","wikidata":"https://www.wikidata.org/wiki/Q7239673","display_name":"Predictive modelling","level":2,"score":0.44791117310523987},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3587722182273865},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3390125036239624},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.2684418559074402},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.19027310609817505},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1849035620689392},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.17506253719329834},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15819033980369568},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.09680384397506714}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2024.3393734","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2024.3393734","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1100003544","display_name":null,"funder_award_id":"62372021","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4815234220","display_name":null,"funder_award_id":"62202138","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":60,"referenced_works":["https://openalex.org/W1495180973","https://openalex.org/W1975040830","https://openalex.org/W2021688474","https://openalex.org/W2025700486","https://openalex.org/W2037691959","https://openalex.org/W2046830558","https://openalex.org/W2065547122","https://openalex.org/W2069569831","https://openalex.org/W2083221797","https://openalex.org/W2097883090","https://openalex.org/W2105115424","https://openalex.org/W2105776892","https://openalex.org/W2136706100","https://openalex.org/W2148143831","https://openalex.org/W2150918644","https://openalex.org/W2151666086","https://openalex.org/W2242800359","https://openalex.org/W2360967250","https://openalex.org/W2367798545","https://openalex.org/W2466963325","https://openalex.org/W2523268328","https://openalex.org/W2560646185","https://openalex.org/W2726443204","https://openalex.org/W2795013017","https://openalex.org/W2805001156","https://openalex.org/W2822474803","https://openalex.org/W2883749686","https://openalex.org/W2889179608","https://openalex.org/W2955991060","https://openalex.org/W2963548617","https://openalex.org/W2966592377","https://openalex.org/W2980853106","https://openalex.org/W2997591727","https://openalex.org/W2999752750","https://openalex.org/W3005979163","https://openalex.org/W3009290003","https://openalex.org/W3087938565","https://openalex.org/W3091176757","https://openalex.org/W3093046707","https://openalex.org/W3174086521","https://openalex.org/W4206600618","https://openalex.org/W4226082918","https://openalex.org/W4234346598","https://openalex.org/W4238859253","https://openalex.org/W4243379839","https://openalex.org/W4245807786","https://openalex.org/W4250023757","https://openalex.org/W4252684946","https://openalex.org/W4285490379","https://openalex.org/W4313142332","https://openalex.org/W4380084958","https://openalex.org/W4392157755","https://openalex.org/W6636501900","https://openalex.org/W6640425456","https://openalex.org/W6686550307","https://openalex.org/W6730042731","https://openalex.org/W6735443497","https://openalex.org/W6748774907","https://openalex.org/W6751800415","https://openalex.org/W6801412436"],"related_works":["https://openalex.org/W2076536433","https://openalex.org/W90316445","https://openalex.org/W4327743613","https://openalex.org/W82714704","https://openalex.org/W1519020487","https://openalex.org/W2382583096","https://openalex.org/W147463599","https://openalex.org/W3158675493","https://openalex.org/W3216967183","https://openalex.org/W2022585969"],"abstract_inverted_index":{"Software":[0],"defect":[1],"prediction":[2,139],"(SDP)":[3],"techniques":[4],"play":[5],"a":[6,21,63,87,135,144,152],"crucial":[7],"role":[8],"in":[9,114,168],"identifying":[10,115],"defective":[11],"code":[12],"regions":[13],"and":[14,46,99,142,173,189],"improving":[15],"testing":[16],"efficiency.":[17],"Over":[18],"recent":[19],"decades,":[20],"plethora":[22],"of":[23,138,150,175],"SDP":[24,91,156,176],"approaches":[25],"has":[26],"emerged,":[27],"with":[28,141],"machine":[29],"learning":[30],"(ML)":[31],"models":[32,157],"being":[33],"the":[34,67,130,148,171],"most":[35],"widely":[36],"employed.":[37],"Despite":[38],"their":[39,43,55],"superior":[40],"predictive":[41],"performance,":[42,140],"black-box":[44],"nature":[45],"uncertainties":[47],"make":[48],"it":[49,179],"challenging":[50],"for":[51,90,155,184],"developers":[52,167,188],"to":[53,76,85],"trust":[54,69,186],"predictions.":[56,80,119],"To":[57],"address":[58],"this":[59],"issue,":[60],"we":[61,82],"propose":[62],"novel":[64],"trustworthiness":[65],"score,":[66],"adjusted":[68],"score":[70],"(ATS),":[71],"which":[72],"helps":[73],"determine":[74],"when":[75],"rely":[77],"on":[78,95],"classifier":[79],"Furthermore,":[81,134],"employ":[83],"ATS":[84,108,120,164],"develop":[86],"reject":[88,145,153],"option":[89,154],"models.":[92,177],"Comprehensive":[93],"experiments":[94],"32":[96],"benchmark":[97],"datasets":[98],"six":[100],"prevalent":[101],"ML":[102],"classifiers":[103],"reveal":[104],"that":[105,163],"high":[106,112],"(low)":[107],"values":[109],"successfully":[110],"yield":[111],"precision":[113],"correct":[116],"(or":[117],"incorrect)":[118],"also":[121],"demonstrates":[122],"superiority":[123],"over":[124],"its":[125],"counterparts,":[126],"as":[127],"evidenced":[128],"by":[129],"Wilcoxon":[131],"signed-rank":[132],"test.":[133],"comparative":[136],"analysis":[137],"without":[143],"option,":[146],"confirms":[147],"feasibility":[149],"designing":[151],"utilizing":[158],"ATS.":[159],"Our":[160],"work":[161],"highlights":[162],"can":[165],"assist":[166],"better":[169],"comprehending":[170],"strengths":[172],"weaknesses":[174],"Therefore,":[178],"is":[180],"an":[181],"essential":[182],"component":[183],"guaranteeing":[185],"from":[187],"deserves":[190],"further":[191],"investigation.":[192]},"counts_by_year":[{"year":2025,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}