{"id":"https://openalex.org/W4393864486","doi":"https://doi.org/10.1109/tr.2024.3381160","title":"Subsystem Reliability Analysis of Data Center Network BCube","display_name":"Subsystem Reliability Analysis of Data Center Network BCube","publication_year":2024,"publication_date":"2024-04-03","ids":{"openalex":"https://openalex.org/W4393864486","doi":"https://doi.org/10.1109/tr.2024.3381160"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2024.3381160","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2024.3381160","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100418197","display_name":"Yihong Wang","orcid":"https://orcid.org/0000-0002-3702-4503"},"institutions":[{"id":"https://openalex.org/I3923682","display_name":"Soochow University","ror":"https://ror.org/05t8y2r12","country_code":"CN","type":"education","lineage":["https://openalex.org/I3923682"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yihong Wang","raw_affiliation_strings":["School of Computer Science and Technology, Soochow University, Suzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-3702-4503","affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Soochow University, Suzhou, China","institution_ids":["https://openalex.org/I3923682"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039941317","display_name":"Weibei Fan","orcid":"https://orcid.org/0000-0003-1255-5815"},"institutions":[{"id":"https://openalex.org/I41198531","display_name":"Nanjing University of Posts and Telecommunications","ror":"https://ror.org/043bpky34","country_code":"CN","type":"education","lineage":["https://openalex.org/I41198531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weibei Fan","raw_affiliation_strings":["College of Computer, Nanjing University of Posts and Telecommunications, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0003-1255-5815","affiliations":[{"raw_affiliation_string":"College of Computer, Nanjing University of Posts and Telecommunications, Nanjing, China","institution_ids":["https://openalex.org/I41198531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022101610","display_name":"Jianxi Fan","orcid":"https://orcid.org/0000-0002-7055-5891"},"institutions":[{"id":"https://openalex.org/I3923682","display_name":"Soochow University","ror":"https://ror.org/05t8y2r12","country_code":"CN","type":"education","lineage":["https://openalex.org/I3923682"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianxi Fan","raw_affiliation_strings":["School of Computer Science and Technology, Soochow University, Suzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-7055-5891","affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Soochow University, Suzhou, China","institution_ids":["https://openalex.org/I3923682"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102728193","display_name":"Jingya Zhou","orcid":"https://orcid.org/0000-0003-0721-7424"},"institutions":[{"id":"https://openalex.org/I3923682","display_name":"Soochow University","ror":"https://ror.org/05t8y2r12","country_code":"CN","type":"education","lineage":["https://openalex.org/I3923682"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingya Zhou","raw_affiliation_strings":["School of Computer Science and Technology, Soochow University, Suzhou, China"],"raw_orcid":"https://orcid.org/0000-0003-0721-7424","affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Soochow University, Suzhou, China","institution_ids":["https://openalex.org/I3923682"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034004697","display_name":"Baolei Cheng","orcid":"https://orcid.org/0000-0001-9479-8372"},"institutions":[{"id":"https://openalex.org/I3923682","display_name":"Soochow University","ror":"https://ror.org/05t8y2r12","country_code":"CN","type":"education","lineage":["https://openalex.org/I3923682"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Baolei Cheng","raw_affiliation_strings":["School of Computer Science and Technology, Soochow University, Suzhou, China"],"raw_orcid":"https://orcid.org/0000-0001-9479-8372","affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Soochow University, Suzhou, China","institution_ids":["https://openalex.org/I3923682"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.7877,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.91141586,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"73","issue":"4","first_page":"1946","last_page":"1957"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.6962000131607056,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.6962000131607056,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13832","display_name":"Advanced Decision-Making Techniques","score":0.6527000069618225,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14474","display_name":"Industrial Technology and Control Systems","score":0.6370000243186951,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6283301115036011},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6255124807357788},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.6142742037773132},{"id":"https://openalex.org/keywords/data-center","display_name":"Data center","score":0.6012067198753357},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5544534921646118},{"id":"https://openalex.org/keywords/center","display_name":"Center (category theory)","score":0.5340128540992737},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2579495906829834},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.21369653940200806},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.20266208052635193}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6283301115036011},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6255124807357788},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.6142742037773132},{"id":"https://openalex.org/C153740404","wikidata":"https://www.wikidata.org/wiki/Q671224","display_name":"Data center","level":2,"score":0.6012067198753357},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5544534921646118},{"id":"https://openalex.org/C2779463800","wikidata":"https://www.wikidata.org/wiki/Q5062222","display_name":"Center (category theory)","level":2,"score":0.5340128540992737},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2579495906829834},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.21369653940200806},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.20266208052635193},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2024.3381160","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2024.3381160","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1553852706","display_name":null,"funder_award_id":"62272333","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G1872422098","display_name":null,"funder_award_id":"62372248","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G478566191","display_name":null,"funder_award_id":"62102196","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8330442010","display_name":null,"funder_award_id":"62172291","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W2079929141","https://openalex.org/W2081844189","https://openalex.org/W2109250600","https://openalex.org/W2110339720","https://openalex.org/W2117086555","https://openalex.org/W2127763310","https://openalex.org/W2131034828","https://openalex.org/W2137628484","https://openalex.org/W2346946002","https://openalex.org/W2465840948","https://openalex.org/W2521607116","https://openalex.org/W2528837298","https://openalex.org/W2585871394","https://openalex.org/W2625408416","https://openalex.org/W2792050271","https://openalex.org/W2796053336","https://openalex.org/W2953787781","https://openalex.org/W2965205070","https://openalex.org/W2979219375","https://openalex.org/W3006107763","https://openalex.org/W3008766047","https://openalex.org/W3026315868","https://openalex.org/W3095736659","https://openalex.org/W3164465569","https://openalex.org/W3175372161","https://openalex.org/W4206030905","https://openalex.org/W4206447675","https://openalex.org/W4225484006","https://openalex.org/W4232093111","https://openalex.org/W4256524787","https://openalex.org/W4281791297","https://openalex.org/W4292259348","https://openalex.org/W4293072302","https://openalex.org/W4297839564","https://openalex.org/W4298129612","https://openalex.org/W4317515973","https://openalex.org/W4323022522"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"The":[0],"efficiency":[1],"of":[2,11,21,25,57,95,113,136,143,159,197],"cloud":[3],"computing":[4],"is":[5,29,45,60,125],"significantly":[6],"impacted":[7],"by":[8],"the":[9,18,23,49,61,79,110,117,122,140,145,147,154,156,194],"capabilities":[10],"data":[12],"center":[13],"networks":[14,34,77],"(DCNs).":[15],"However,":[16],"with":[17,67],"increasing":[19],"demands":[20],"applications,":[22],"number":[24,112,142,196],"servers":[26],"in":[27,41,190],"DCNs":[28,106],"growing":[30],"exponentially.":[31],"In":[32,87,127],"general,":[33],"become":[35],"more":[36,187],"vulnerable":[37],"as":[38],"they":[39],"expand":[40],"size.":[42],"Consequently,":[43],"it":[44],"essential":[46],"to":[47,184,204],"assess":[48],"network's":[50],"reliability.":[51],"Subsystem":[52],"reliability,":[53,59],"a":[54,64,68,178,186],"crucial":[55],"parameter":[56],"network":[58],"likelihood":[62],"that":[63,108,121,138,181,192],"faultless":[65],"subsystem":[66,83,157],"specific":[69],"size":[70],"would":[71],"function":[72],"normally.":[73],"Even":[74],"though":[75],"several":[76],"have":[78,109,139,193],"same":[80,111,141,195],"order,":[81],"their":[82],"reliability":[84,123,158],"may":[85],"differ.":[86],"this":[88],"article,":[89],"we":[90,129,200],"compare":[91],"two":[92,134],"distinct":[93],"subsystems":[94,135],"<inline-formula":[96,101,149,164,170],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[97,102,150,165,171],"xmlns:xlink=\"http://www.w3.org/1999/xlink\"><tex-math":[98,103,151,166,172],"notation=\"LaTeX\">$m$</tex-math></inline-formula>":[99],"-port":[100],"notation=\"LaTeX\">$k$</tex-math></inline-formula>":[104,152],"-dimensional":[105],"BCube":[107,137,160,191],"vertices":[114],"and":[115,169],"ascertain":[116],"critical":[118],"time":[119],"so":[120],"bound":[124],"robust.":[126],"addition,":[128],"discover":[130],"that,":[131],"when":[132],"comparing":[133],"vertices,":[144],"smaller":[146],"dimension":[148],",":[153],"greater":[155],"will":[161],"be":[162],"for":[163],"notation=\"LaTeX\">$m\\geq":[167],"2$</tex-math></inline-formula>":[168],"notation=\"LaTeX\">$k\\geq":[173],"1$</tex-math></inline-formula>":[174],".":[175],"This":[176],"offers":[177],"theoretical":[179],"foundation":[180],"allows":[182],"us":[183],"choose":[185],"reliable":[188],"system":[189],"vertices.":[198],"Finally,":[199],"use":[201],"numerical":[202],"experiments":[203],"verify":[205],"our":[206],"findings.":[207]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5}],"updated_date":"2026-07-19T07:52:34.831488","created_date":"2025-10-10T00:00:00"}