{"id":"https://openalex.org/W4391249262","doi":"https://doi.org/10.1109/tr.2024.3354817","title":"A New Method to Evaluate the Reliability of Multistate Information Networks","display_name":"A New Method to Evaluate the Reliability of Multistate Information Networks","publication_year":2024,"publication_date":"2024-01-26","ids":{"openalex":"https://openalex.org/W4391249262","doi":"https://doi.org/10.1109/tr.2024.3354817"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2024.3354817","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2024.3354817","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041859450","display_name":"Fei Wang","orcid":"https://orcid.org/0000-0003-3286-3399"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Fei Wang","raw_affiliation_strings":["School of Civil and Transportation Engineering, Hebei University of Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Civil and Transportation Engineering, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039306069","display_name":"Hongjun Cui","orcid":"https://orcid.org/0000-0003-4004-6460"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongjun Cui","raw_affiliation_strings":["School of Civil and Transportation Engineering, Hebei University of Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Civil and Transportation Engineering, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012456515","display_name":"Wei\u2010Chang Yeh","orcid":"https://orcid.org/0000-0001-7393-0768"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Wei-Chang Yeh","raw_affiliation_strings":["e-Integration and Collaboration Laboratory, Department of Industrial Engineering and Engineering Management, National Tsing Hua University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"e-Integration and Collaboration Laboratory, Department of Industrial Engineering and Engineering Management, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083646047","display_name":"Minqing Zhu","orcid":"https://orcid.org/0000-0001-6979-2024"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Minqing Zhu","raw_affiliation_strings":["School of Civil and Transportation Engineering, Hebei University of Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Civil and Transportation Engineering, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047583380","display_name":"Xinwei Ma","orcid":"https://orcid.org/0000-0003-4419-0187"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinwei Ma","raw_affiliation_strings":["School of Civil and Transportation Engineering, Hebei University of Technology, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Civil and Transportation Engineering, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5041859450"],"corresponding_institution_ids":["https://openalex.org/I184843921"],"apc_list":null,"apc_paid":null,"fwci":1.5475,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.79624563,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"73","issue":"3","first_page":"1410","last_page":"1417"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10917","display_name":"Smart Grid Security and Resilience","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.8057465553283691},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.738426923751831},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5315064787864685},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.46078455448150635},{"id":"https://openalex.org/keywords/tree","display_name":"Tree (set theory)","score":0.45293572545051575},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.44463637471199036},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.43162912130355835},{"id":"https://openalex.org/keywords/binary-tree","display_name":"Binary tree","score":0.4182264804840088},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.357843816280365},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.12912526726722717},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1235540509223938},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.08509635925292969}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8057465553283691},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.738426923751831},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5315064787864685},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.46078455448150635},{"id":"https://openalex.org/C113174947","wikidata":"https://www.wikidata.org/wiki/Q2859736","display_name":"Tree (set theory)","level":2,"score":0.45293572545051575},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.44463637471199036},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.43162912130355835},{"id":"https://openalex.org/C197855036","wikidata":"https://www.wikidata.org/wiki/Q380172","display_name":"Binary tree","level":2,"score":0.4182264804840088},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.357843816280365},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.12912526726722717},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1235540509223938},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.08509635925292969},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2024.3354817","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2024.3354817","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8446208975","display_name":null,"funder_award_id":"52372302","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G999168818","display_name":null,"funder_award_id":"52172304","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":43,"referenced_works":["https://openalex.org/W651391931","https://openalex.org/W1601712886","https://openalex.org/W1965529703","https://openalex.org/W1982976761","https://openalex.org/W1984987698","https://openalex.org/W1996824380","https://openalex.org/W1996878589","https://openalex.org/W1997283329","https://openalex.org/W2008525610","https://openalex.org/W2018382053","https://openalex.org/W2027165440","https://openalex.org/W2030246750","https://openalex.org/W2030826072","https://openalex.org/W2035561370","https://openalex.org/W2043264322","https://openalex.org/W2046682436","https://openalex.org/W2064123903","https://openalex.org/W2102375886","https://openalex.org/W2108384800","https://openalex.org/W2114126595","https://openalex.org/W2143320415","https://openalex.org/W2155533555","https://openalex.org/W2163045919","https://openalex.org/W2168057190","https://openalex.org/W2175940139","https://openalex.org/W2552896552","https://openalex.org/W2755531855","https://openalex.org/W2799411664","https://openalex.org/W2912539634","https://openalex.org/W2981220705","https://openalex.org/W2984345813","https://openalex.org/W2990796063","https://openalex.org/W2995185210","https://openalex.org/W2999316083","https://openalex.org/W3000733072","https://openalex.org/W3119687213","https://openalex.org/W3126774150","https://openalex.org/W3214065999","https://openalex.org/W4206045213","https://openalex.org/W4212774121","https://openalex.org/W4283448506","https://openalex.org/W4295650004","https://openalex.org/W4313400252"],"related_works":["https://openalex.org/W2902549273","https://openalex.org/W1985727224","https://openalex.org/W2981001626","https://openalex.org/W2357738827","https://openalex.org/W1966383678","https://openalex.org/W4300939757","https://openalex.org/W2486717996","https://openalex.org/W2962655934","https://openalex.org/W3107197685","https://openalex.org/W2067279514"],"abstract_inverted_index":{"Multistate":[0],"information":[1],"networks":[2,26],"(MINs)":[3],"are":[4],"the":[5,13,22,30,37,40,54,81,85,91,95,106],"basis":[6],"of":[7,16,25,32,39,42,57,94,105],"many":[8],"modern":[9,33],"communication":[10,34],"networks,":[11],"and":[12,90],"reliability":[14,41,59,88],"evaluation":[15,38],"MINs":[17,43],"not":[18],"only":[19],"contributes":[20],"to":[21],"structural":[23],"design":[24],"but":[27],"also":[28],"facilitates":[29],"development":[31],"technologies.":[35],"However,":[36],"in":[44,61],"studies":[45],"so":[46],"far":[47],"always":[48],"requires":[49],"massive":[50],"calculations.":[51],"To":[52],"improve":[53],"calculation":[55],"efficiency":[56],"MIN":[58,87],"evaluation,":[60],"this":[62],"article,":[63],"a":[64],"new":[65],"algorithm":[66,83,97],"with":[67],"lower":[68],"time":[69,93],"complexity":[70],"than":[71,103],"traditional":[72],"algorithms":[73],"is":[74,98],"proposed.":[75],"The":[76],"comparative":[77],"experiments":[78],"show":[79],"that":[80,104],"proposed":[82,96],"outperforms":[84],"existing":[86],"algorithms,":[89],"running":[92],"at":[99],"least":[100],"31.96%":[101],"less":[102],"node-based":[107],"binary-addition":[108],"tree":[109],"algorithm.":[110]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}