{"id":"https://openalex.org/W4390807490","doi":"https://doi.org/10.1109/tr.2023.3345899","title":"A History of Editorship of the IEEE Transactions on Reliability","display_name":"A History of Editorship of the IEEE Transactions on Reliability","publication_year":2024,"publication_date":"2024-01-11","ids":{"openalex":"https://openalex.org/W4390807490","doi":"https://doi.org/10.1109/tr.2023.3345899"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2023.3345899","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2023.3345899","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083864231","display_name":"Phillip A. Laplante","orcid":"https://orcid.org/0000-0002-0415-271X"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Phillip A. Laplante","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD, USA","institution_ids":["https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5083864231"],"corresponding_institution_ids":["https://openalex.org/I1321296531"],"apc_list":null,"apc_paid":null,"fwci":0.3647,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.52729885,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"73","issue":"1","first_page":"15","last_page":"16"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.7368000149726868,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.7368000149726868,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.663100004196167,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6765176057815552},{"id":"https://openalex.org/keywords/portfolio","display_name":"Portfolio","score":0.6428168416023254},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5282185077667236},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.4594067633152008},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.42578941583633423},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.32583385705947876},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2887563109397888},{"id":"https://openalex.org/keywords/financial-economics","display_name":"Financial economics","score":0.07870614528656006},{"id":"https://openalex.org/keywords/economics","display_name":"Economics","score":0.07138368487358093},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.05737397074699402},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.054551661014556885}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6765176057815552},{"id":"https://openalex.org/C2780821815","wikidata":"https://www.wikidata.org/wiki/Q5340806","display_name":"Portfolio","level":2,"score":0.6428168416023254},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5282185077667236},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4594067633152008},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.42578941583633423},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.32583385705947876},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2887563109397888},{"id":"https://openalex.org/C106159729","wikidata":"https://www.wikidata.org/wiki/Q2294553","display_name":"Financial economics","level":1,"score":0.07870614528656006},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.07138368487358093},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.05737397074699402},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.054551661014556885},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2023.3345899","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2023.3345899","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W4238963939","https://openalex.org/W4246734461","https://openalex.org/W4249985131"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2994319598","https://openalex.org/W2369695847","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":{"Launched":[0],"in":[1,15],"1952":[2],"the":[3,12,16],"<italic":[4],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[5],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">Transactions":[6],"on":[7],"Reliability</i>":[8],"is":[9,41],"one":[10],"of":[11,29,36,38],"oldest":[13],"publications":[14],"IEEE":[17],"portfolio.":[18],"Throughout":[19],"its":[20],"history,":[21],"it":[22],"has":[23],"been":[24],"led":[25],"by":[26],"a":[27],"series":[28],"outstanding":[30],"editors.":[31],"The":[32],"lineage":[33],"and":[34],"evolution":[35],"editorship":[37],"this":[39],"periodical":[40],"presented.":[42]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}