{"id":"https://openalex.org/W4388561655","doi":"https://doi.org/10.1109/tr.2023.3324896","title":"Reliability Assessment for Aeroengine Blisks Under Low Cycle Fatigue With Ensemble Generalized Constraint Neural Network","display_name":"Reliability Assessment for Aeroengine Blisks Under Low Cycle Fatigue With Ensemble Generalized Constraint Neural Network","publication_year":2023,"publication_date":"2023-11-10","ids":{"openalex":"https://openalex.org/W4388561655","doi":"https://doi.org/10.1109/tr.2023.3324896"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2023.3324896","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2023.3324896","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011082686","display_name":"Chao Huang","orcid":"https://orcid.org/0000-0001-7313-581X"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":true,"raw_author_name":"Chao Huang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Kowloon, Hong Kong","Centre for Advances in Reliability and Safety (CAiRS), Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Kowloon, Hong Kong","institution_ids":["https://openalex.org/I14243506"]},{"raw_affiliation_string":"Centre for Advances in Reliability and Safety (CAiRS), Hong Kong, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086445784","display_name":"Siqi Bu","orcid":"https://orcid.org/0000-0002-1047-2568"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Siqi Bu","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Shenzhen Research Institute, Centre for Grid Modernisation, International Centre of Urban Energy Nexus, Centre for Advances in Reliability and Safety (CAiRS), Research Institute for Smart Energy, and Policy Research Centre for Innovation and Technology, The Hong Kong Polytechnic University, Kowloon, Hong Kong"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Shenzhen Research Institute, Centre for Grid Modernisation, International Centre of Urban Energy Nexus, Centre for Advances in Reliability and Safety (CAiRS), Research Institute for Smart Energy, and Policy Research Centre for Innovation and Technology, The Hong Kong Polytechnic University, Kowloon, Hong Kong","institution_ids":["https://openalex.org/I14243506"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024196950","display_name":"Cheng\u2010Wei Fei","orcid":"https://orcid.org/0000-0001-5333-1055"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Cheng-Wei Fei","raw_affiliation_strings":["Department of Aeronautics and Astronautics, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Aeronautics and Astronautics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088683986","display_name":"Namkyoung Lee","orcid":"https://orcid.org/0000-0001-5938-6292"},"institutions":[{"id":"https://openalex.org/I4210156197","display_name":"Life Cycle Engineering (United States)","ror":"https://ror.org/056hm0802","country_code":"US","type":"company","lineage":["https://openalex.org/I4210156197"]},{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Namkyoung Lee","raw_affiliation_strings":["Center for Advanced Life Cycle Engineering, University of Maryland, College Park, MD, USA"],"affiliations":[{"raw_affiliation_string":"Center for Advanced Life Cycle Engineering, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I4210156197","https://openalex.org/I66946132"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009564705","display_name":"Shu Wa Kong","orcid":"https://orcid.org/0009-0006-7375-4526"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Shu Wa Kong","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Kowloon, Hong Kong","Centre for Advances in Reliability and Safety (CAiRS), Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Kowloon, Hong Kong","institution_ids":["https://openalex.org/I14243506"]},{"raw_affiliation_string":"Centre for Advances in Reliability and Safety (CAiRS), Hong Kong, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5011082686"],"corresponding_institution_ids":["https://openalex.org/I14243506"],"apc_list":null,"apc_paid":null,"fwci":1.82,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.86867621,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"73","issue":"2","first_page":"922","last_page":"936"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12560","display_name":"Nuclear Engineering Thermal-Hydraulics","score":0.9894000291824341,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10396","display_name":"Fatigue and fracture mechanics","score":0.98580002784729,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interpretability","display_name":"Interpretability","score":0.8495265245437622},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.7629079222679138},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7585418820381165},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.637080192565918},{"id":"https://openalex.org/keywords/constraint","display_name":"Constraint (computer-aided design)","score":0.5690417289733887},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5657033920288086},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5332400798797607},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.31489741802215576},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29522398114204407},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2851508855819702}],"concepts":[{"id":"https://openalex.org/C2781067378","wikidata":"https://www.wikidata.org/wiki/Q17027399","display_name":"Interpretability","level":2,"score":0.8495265245437622},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.7629079222679138},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7585418820381165},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.637080192565918},{"id":"https://openalex.org/C2776036281","wikidata":"https://www.wikidata.org/wiki/Q48769818","display_name":"Constraint (computer-aided design)","level":2,"score":0.5690417289733887},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5657033920288086},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5332400798797607},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.31489741802215576},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29522398114204407},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2851508855819702},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2023.3324896","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2023.3324896","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.49000000953674316,"id":"https://metadata.un.org/sdg/12","display_name":"Responsible consumption and production"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":60,"referenced_works":["https://openalex.org/W1877953595","https://openalex.org/W1975519982","https://openalex.org/W2040055947","https://openalex.org/W2154316540","https://openalex.org/W2175473154","https://openalex.org/W2207320530","https://openalex.org/W2592887437","https://openalex.org/W2606195371","https://openalex.org/W2626215932","https://openalex.org/W2747743000","https://openalex.org/W2791875084","https://openalex.org/W2895206136","https://openalex.org/W2898030211","https://openalex.org/W2907108380","https://openalex.org/W2935779091","https://openalex.org/W2944140915","https://openalex.org/W2947339940","https://openalex.org/W2952694534","https://openalex.org/W2966999527","https://openalex.org/W2975504946","https://openalex.org/W2978497776","https://openalex.org/W2979387230","https://openalex.org/W2982493260","https://openalex.org/W2987160620","https://openalex.org/W2989261586","https://openalex.org/W2990794960","https://openalex.org/W2992077865","https://openalex.org/W3002053017","https://openalex.org/W3025605929","https://openalex.org/W3034444489","https://openalex.org/W3034878177","https://openalex.org/W3035533773","https://openalex.org/W3045774042","https://openalex.org/W3082758367","https://openalex.org/W3098653169","https://openalex.org/W3108173890","https://openalex.org/W3145877409","https://openalex.org/W3172167762","https://openalex.org/W3183870624","https://openalex.org/W3201268225","https://openalex.org/W3202675557","https://openalex.org/W3206819196","https://openalex.org/W3217291690","https://openalex.org/W4220764014","https://openalex.org/W4223917210","https://openalex.org/W4225858660","https://openalex.org/W4283167106","https://openalex.org/W4285156299","https://openalex.org/W4285297333","https://openalex.org/W4294691168","https://openalex.org/W4309200495","https://openalex.org/W4309333726","https://openalex.org/W4320487231","https://openalex.org/W4320515715","https://openalex.org/W4322761693","https://openalex.org/W4360854425","https://openalex.org/W4382936872","https://openalex.org/W4385254962","https://openalex.org/W4387581673","https://openalex.org/W4391088459"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4233600955","https://openalex.org/W4322734194","https://openalex.org/W3116237489","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433"],"abstract_inverted_index":{"Aeroengine":[0],"blisks":[1],"operate":[2],"in":[3],"a":[4,43,120],"harsh":[5],"working":[6],"environment":[7],"and":[8,88,98,116],"are":[9],"prone":[10],"to":[11,26,113],"low":[12],"cycle":[13],"fatigue":[14],"(LCF)":[15],"failure.":[16],"The":[17,78,102],"probabilistic":[18,60],"LCF":[19],"life":[20],"prediction":[21],"considering":[22],"multiple":[23],"uncertainties":[24,51],"needs":[25],"be":[27,111],"performed":[28],"for":[29],"reliability":[30,45,75,90,106],"assessment.":[31],"To":[32,53],"consider":[33],"the":[34,50,55],"combined":[35],"effects":[36],"of":[37,59],"heterogeneous":[38],"uncertainties,":[39],"this":[40,64],"article":[41,65],"employs":[42],"unified":[44,74,105],"assessment":[46,76,107],"method":[47,108],"by":[48],"processing":[49],"simultaneously.":[52],"overcome":[54],"extremely":[56],"time-consuming":[57],"limitation":[58],"finite-element":[61],"model":[62,82],"simulation,":[63],"develops":[66],"an":[67],"ensemble":[68],"generalized":[69],"constraint":[70],"neural":[71],"network":[72],"(EGCNN)-based":[73],"method.":[77],"developed":[79,103],"EGCNN":[80],"surrogate":[81],"can":[83,109],"conduct":[84],"efficient,":[85],"accurate,":[86],"interpretable,":[87],"robust":[89],"assessments":[91],"with":[92],"nonlinear":[93],"fitting":[94],"capability,":[95],"knowledge":[96],"interpretability,":[97],"premature":[99],"avoidance":[100],"ability.":[101],"EGCNN-based":[104],"also":[110],"applied":[112],"other":[114],"assets":[115],"failure":[117],"mechanisms,":[118],"providing":[119],"new":[121],"reliability-based":[122],"design":[123],"optimization":[124],"tool.":[125]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}