{"id":"https://openalex.org/W4386737193","doi":"https://doi.org/10.1109/tr.2023.3311196","title":"A Mission-Reliability-Oriented Health Prognosis Approach for Manufacturing Systems Considering Operational Uncertainty","display_name":"A Mission-Reliability-Oriented Health Prognosis Approach for Manufacturing Systems Considering Operational Uncertainty","publication_year":2023,"publication_date":"2023-09-14","ids":{"openalex":"https://openalex.org/W4386737193","doi":"https://doi.org/10.1109/tr.2023.3311196"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2023.3311196","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2023.3311196","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028695574","display_name":"Yuqi Cai","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yuqi Cai","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060922863","display_name":"Yihai He","orcid":"https://orcid.org/0000-0002-9110-2672"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yihai He","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-9110-2672","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101454142","display_name":"Rui Shi","orcid":"https://orcid.org/0000-0002-6723-1319"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rui Shi","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100769535","display_name":"Jiayang Li","orcid":"https://orcid.org/0000-0002-5551-7424"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiayang Li","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5028695574"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":2.7643,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.89786629,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"73","issue":"1","first_page":"650","last_page":"663"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9850999712944031,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9850999712944031,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9279999732971191,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13690","display_name":"Quality and Safety in Healthcare","score":0.9164000153541565,"subfield":{"id":"https://openalex.org/subfields/3607","display_name":"Medical Laboratory Technology"},"field":{"id":"https://openalex.org/fields/36","display_name":"Health Professions"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.5956338047981262},{"id":"https://openalex.org/keywords/fuzzy-logic","display_name":"Fuzzy logic","score":0.5501188635826111},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5446389317512512},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5297502279281616},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45717695355415344},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4046246111392975},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.3569720983505249},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2295677661895752}],"concepts":[{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.5956338047981262},{"id":"https://openalex.org/C58166","wikidata":"https://www.wikidata.org/wiki/Q224821","display_name":"Fuzzy logic","level":2,"score":0.5501188635826111},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5446389317512512},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5297502279281616},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45717695355415344},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4046246111392975},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.3569720983505249},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2295677661895752},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2023.3311196","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2023.3311196","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5206662663","display_name":null,"funder_award_id":"72071007","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7979949094","display_name":null,"funder_award_id":"71971181","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W2032292266","https://openalex.org/W2122066118","https://openalex.org/W2135449931","https://openalex.org/W2523377413","https://openalex.org/W2752842273","https://openalex.org/W2803460043","https://openalex.org/W2809385588","https://openalex.org/W2810304291","https://openalex.org/W2889139199","https://openalex.org/W2891171439","https://openalex.org/W2914809915","https://openalex.org/W2971455452","https://openalex.org/W2972961893","https://openalex.org/W2981063638","https://openalex.org/W2996516003","https://openalex.org/W3037491362","https://openalex.org/W3073057564","https://openalex.org/W3091980196","https://openalex.org/W3112051552","https://openalex.org/W3115846572","https://openalex.org/W3123720983","https://openalex.org/W3132180333","https://openalex.org/W3197327252","https://openalex.org/W3211352205","https://openalex.org/W3216367135","https://openalex.org/W3216834857","https://openalex.org/W4282553105","https://openalex.org/W4283158848","https://openalex.org/W4283367104","https://openalex.org/W4283378562","https://openalex.org/W4285306189","https://openalex.org/W4293072433","https://openalex.org/W4296212420","https://openalex.org/W4300071000","https://openalex.org/W4300074502","https://openalex.org/W4312406892"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4233600955","https://openalex.org/W4322734194","https://openalex.org/W3116237489","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433"],"abstract_inverted_index":{"Considering":[0],"the":[1,7,31,45,108,146,152,157,179,181],"objective":[2,116],"of":[3,10,41,79,148,159,173],"production":[4,135],"task":[5,21],"accomplishment,":[6],"health":[8,70,93,141],"state":[9],"manufacturing":[11,98,196],"systems":[12,99],"is":[13,184],"contingent":[14],"on":[15,75,85,151],"three":[16],"key":[17],"operational":[18,57,80,109],"factors:":[19],"1)":[20,112],"requirements,":[22],"2)":[23,120],"equipment":[24],"performance,":[25],"and":[26,53,82,117,124,127],"3)":[27,129],"product":[28],"quality.":[29],"Throughout":[30],"system":[32,86],"lifecycle,":[33],"these":[34],"factors":[35],"are":[36,111],"subject":[37],"to":[38,64,115,177,186],"varying":[39],"degrees":[40],"uncertainty":[42,81],"resulting":[43],"from":[44,68,100],"5M1E":[46],"(i.e.,":[47],"men,":[48],"machine,":[49],"material,":[50],"method,":[51],"measurement,":[52],"environment)":[54],"fluctuations.":[55],"Such":[56],"uncertainties":[58,110],"pose":[59],"considerable":[60],"challenges":[61],"for":[62,96,140],"decision-makers":[63],"obtain":[65],"instructive":[66],"results":[67],"conventional":[69],"prognosis":[71,94,138],"methods.":[72],"Consequently,":[73],"based":[74],"a":[76,91,101,132,166,192],"conceptual":[77],"investigation":[78],"its":[83],"implications":[84],"health,":[87],"this":[88,106,163],"study":[89,190],"proposes":[90],"novel":[92],"approach":[95,183],"multistate":[97],"mission":[102],"reliability":[103],"perspective.":[104],"In":[105],"approach,":[107],"categorized":[113],"according":[114],"subjective":[118,149],"perspectives,":[119],"represented":[121],"in":[122,131,171],"fuzzy":[123,160],"probabilistic":[125],"metrics,":[126],"subsequently":[128],"ensembled":[130],"customized":[133],"uncertain":[134],"risk":[136],"process-based":[137],"model":[139,164],"prediction.":[142],"To":[143],"further":[144],"eliminate":[145],"influence":[147],"perturbations":[150],"results,":[153,180],"we":[154],"adaptively":[155],"assessed":[156],"boundaries":[158],"parameters":[161],"within":[162],"by":[165],"deep":[167],"reinforcement":[168],"learning":[169],"algorithm":[170],"lieu":[172],"expert":[174],"elicitations.":[175],"Finally,":[176],"validate":[178],"proposed":[182],"applied":[185],"an":[187],"industrial":[188],"case":[189],"involving":[191],"ferrite":[193],"phase":[194],"shifter":[195],"system.":[197]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
