{"id":"https://openalex.org/W4312406892","doi":"https://doi.org/10.1109/tr.2022.3224170","title":"Mission Reliability Modeling of Multistation Manufacturing Systems Considering Cascading Functional Failure","display_name":"Mission Reliability Modeling of Multistation Manufacturing Systems Considering Cascading Functional Failure","publication_year":2022,"publication_date":"2022-12-02","ids":{"openalex":"https://openalex.org/W4312406892","doi":"https://doi.org/10.1109/tr.2022.3224170"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2022.3224170","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2022.3224170","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100411190","display_name":"Yao Li","orcid":"https://orcid.org/0000-0001-5696-7825"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yao Li","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060922863","display_name":"Yihai He","orcid":"https://orcid.org/0000-0002-9110-2672"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yihai He","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-9110-2672","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024610847","display_name":"Ruoyu Liao","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruoyu Liao","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101980660","display_name":"Xin Zheng","orcid":"https://orcid.org/0000-0001-5186-2282"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Zheng","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081209439","display_name":"Wei Dai","orcid":"https://orcid.org/0000-0002-7376-6977"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Dai","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-7376-6977","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":2.8677,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.90215804,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"72","issue":"4","first_page":"1556","last_page":"1568"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9230999946594238,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10539","display_name":"Sustainable Supply Chain Management","score":0.9002000093460083,"subfield":{"id":"https://openalex.org/subfields/1408","display_name":"Strategy and Management"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7273757457733154},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6360531449317932},{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.45724132657051086},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.44482970237731934},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4402894675731659},{"id":"https://openalex.org/keywords/failure-mode-and-effects-analysis","display_name":"Failure mode and effects analysis","score":0.4368308484554291},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.275147020816803}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7273757457733154},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6360531449317932},{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.45724132657051086},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.44482970237731934},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4402894675731659},{"id":"https://openalex.org/C66283442","wikidata":"https://www.wikidata.org/wiki/Q1389268","display_name":"Failure mode and effects analysis","level":2,"score":0.4368308484554291},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.275147020816803},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2022.3224170","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2022.3224170","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5206662663","display_name":"\u57fa\u4e8e\u8fd0\u884c\u8d28\u91cf\u6570\u636e\u7684\u5236\u9020\u7cfb\u7edf\u4efb\u52a1\u53ef\u9760\u6027\u5efa\u6a21\u7406\u8bba\u4e0e\u96c6\u6210\u5316\u7ef4\u62a4\u6280\u672f\u7814\u7a76","funder_award_id":"72071007","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7979949094","display_name":"\u57fa\u4e8e\u90e8\u4ef6\u76f8\u4f9d\u7684\u590d\u6742\u7cfb\u7edf\u5269\u4f59\u5bff\u547d\u5efa\u6a21\u53ca\u9884\u6d4b\u6027\u7ef4\u4fee\u7b56\u7565\u7814\u7a76","funder_award_id":"71971181","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W2025858940","https://openalex.org/W2140448201","https://openalex.org/W2152709686","https://openalex.org/W2154376069","https://openalex.org/W2182963870","https://openalex.org/W2342898371","https://openalex.org/W2487237297","https://openalex.org/W2593917636","https://openalex.org/W2731585523","https://openalex.org/W2751940269","https://openalex.org/W2768048291","https://openalex.org/W2773013922","https://openalex.org/W2809886006","https://openalex.org/W2886979164","https://openalex.org/W2921917805","https://openalex.org/W2943647433","https://openalex.org/W2943966997","https://openalex.org/W2947119929","https://openalex.org/W2954609197","https://openalex.org/W2986432779","https://openalex.org/W2996516003","https://openalex.org/W3004440491","https://openalex.org/W3037491362","https://openalex.org/W3097589920","https://openalex.org/W3105864866","https://openalex.org/W3127277747","https://openalex.org/W3132180333","https://openalex.org/W3133134712","https://openalex.org/W3163939800","https://openalex.org/W3205671243","https://openalex.org/W3211445114","https://openalex.org/W3215869758","https://openalex.org/W4221040093","https://openalex.org/W4226202535","https://openalex.org/W4307644118"],"related_works":["https://openalex.org/W2183751629","https://openalex.org/W2168011386","https://openalex.org/W1030923862","https://openalex.org/W2122592404","https://openalex.org/W4244614293","https://openalex.org/W4256332449","https://openalex.org/W2315243270","https://openalex.org/W2337334590","https://openalex.org/W2624804828","https://openalex.org/W2392800390"],"abstract_inverted_index":{"The":[0,140],"core":[1],"function":[2],"of":[3,27,48,70,80,87,96,137,146,157,172],"the":[4,30,45,66,78,83,94,105,118,122,126,135,168,173],"manufacturing":[5,72,89,149,162],"system":[6,49,90,150,163],"is":[7,74,91,102,114,131,151,164],"to":[8,37,116,166],"output":[9],"high-quality":[10],"products":[11],"at":[12],"a":[13,60,88,147,154,158],"stable":[14],"production":[15,119],"rhythm.":[16],"However,":[17],"there":[18],"are":[19],"complex":[20],"interactions":[21],"between":[22,108],"physical":[23],"and":[24,93,99,111,170],"functional":[25,68,81,97,128],"failures":[26,33],"machines":[28],"in":[29,44,57],"station.":[31],"Functional":[32],"can":[34],"be":[35],"propagated":[36],"other":[38],"stations":[39],"through":[40],"material":[41],"flow,":[42],"resulting":[43],"increasing":[46],"risk":[47],"performance":[50,110],"degradation,":[51],"which":[52],"deserves":[53],"further":[54],"study.":[55],"Therefore,":[56],"this":[58],"article,":[59],"mission":[61,100,142],"reliability":[62,101,143],"modeling":[63,144],"method":[64,145],"considering":[65,121],"cascading":[67,84,127],"failure":[69,85,98,129,138],"multistation":[71,148],"systems":[73],"presented.":[75],"First,":[76],"from":[77],"perspective":[79],"output,":[82],"mechanism":[86,136],"discussed,":[92],"connotation":[95],"proposed.":[103,152],"Second,":[104],"interaction":[106],"model":[107,130],"machine":[109],"product":[112],"quality":[113],"established":[115],"analyze":[117],"rhythm":[120],"imperfect":[123],"inspection.":[124],"Third,":[125],"constructed":[132],"based":[133],"on":[134],"propagation.":[139],"integrated":[141],"Finally,":[153],"case":[155],"study":[156],"ferrite":[159],"phase-shifting":[160],"unit":[161],"conducted":[165],"illustrate":[167],"effectiveness":[169],"advancement":[171],"proposed":[174],"method.":[175]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":14},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}