{"id":"https://openalex.org/W4226066961","doi":"https://doi.org/10.1109/tr.2022.3165195","title":"A Preliminary Investigation on the Performance of SBFL Techniques and Distance Metrics in Parallel Fault Localization","display_name":"A Preliminary Investigation on the Performance of SBFL Techniques and Distance Metrics in Parallel Fault Localization","publication_year":2022,"publication_date":"2022-04-22","ids":{"openalex":"https://openalex.org/W4226066961","doi":"https://doi.org/10.1109/tr.2022.3165195"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2022.3165195","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2022.3165195","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100630214","display_name":"Yihao Li","orcid":"https://orcid.org/0000-0001-9874-0338"},"institutions":[{"id":"https://openalex.org/I182707071","display_name":"Ludong University","ror":"https://ror.org/028h95t32","country_code":"CN","type":"education","lineage":["https://openalex.org/I182707071"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yihao Li","raw_affiliation_strings":["School of Information and Electrical Engineering, Ludong University, Yantai, China"],"affiliations":[{"raw_affiliation_string":"School of Information and Electrical Engineering, Ludong University, Yantai, China","institution_ids":["https://openalex.org/I182707071"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5114949810","display_name":"Pan Liu","orcid":"https://orcid.org/0000-0003-1296-3288"},"institutions":[{"id":"https://openalex.org/I153806059","display_name":"Shanghai Business School","ror":"https://ror.org/05kf5z787","country_code":"CN","type":"education","lineage":["https://openalex.org/I153806059"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pan Liu","raw_affiliation_strings":["School of Business Information, Shanghai Business School, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Business Information, Shanghai Business School, Shanghai, China","institution_ids":["https://openalex.org/I153806059"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5100630214"],"corresponding_institution_ids":["https://openalex.org/I182707071"],"apc_list":null,"apc_paid":null,"fwci":2.7571,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.89925373,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"71","issue":"2","first_page":"803","last_page":"817"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6693694591522217},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6553704738616943},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.6398118734359741},{"id":"https://openalex.org/keywords/software-bug","display_name":"Software bug","score":0.5850251913070679},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.5593981742858887},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.48089599609375},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4359542727470398},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.43175289034843445},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.4167148172855377},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.296781450510025},{"id":"https://openalex.org/keywords/biology","display_name":"Biology","score":0.12655380368232727},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11462864279747009},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.07899495959281921}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6693694591522217},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6553704738616943},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.6398118734359741},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.5850251913070679},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.5593981742858887},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.48089599609375},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4359542727470398},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.43175289034843445},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.4167148172855377},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.296781450510025},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.12655380368232727},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11462864279747009},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.07899495959281921},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2022.3165195","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2022.3165195","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":45,"referenced_works":["https://openalex.org/W1973644552","https://openalex.org/W1977556410","https://openalex.org/W2004543041","https://openalex.org/W2010833880","https://openalex.org/W2013655083","https://openalex.org/W2033644368","https://openalex.org/W2037313416","https://openalex.org/W2038777498","https://openalex.org/W2045428103","https://openalex.org/W2047836084","https://openalex.org/W2059197810","https://openalex.org/W2070249305","https://openalex.org/W2078483536","https://openalex.org/W2084181320","https://openalex.org/W2092239677","https://openalex.org/W2101819268","https://openalex.org/W2106170638","https://openalex.org/W2119269793","https://openalex.org/W2124379907","https://openalex.org/W2137839528","https://openalex.org/W2139664301","https://openalex.org/W2146294042","https://openalex.org/W2158303854","https://openalex.org/W2159949130","https://openalex.org/W2165663378","https://openalex.org/W2167341627","https://openalex.org/W2172062914","https://openalex.org/W2172154252","https://openalex.org/W2290416502","https://openalex.org/W2768250993","https://openalex.org/W2790868221","https://openalex.org/W2802428782","https://openalex.org/W2941326118","https://openalex.org/W2942311055","https://openalex.org/W2962715466","https://openalex.org/W2978086073","https://openalex.org/W2996365183","https://openalex.org/W2998724282","https://openalex.org/W3048264264","https://openalex.org/W4213251304","https://openalex.org/W4234751211","https://openalex.org/W4237158495","https://openalex.org/W4254003945","https://openalex.org/W6677328822","https://openalex.org/W6678914141"],"related_works":["https://openalex.org/W2740264376","https://openalex.org/W4206999239","https://openalex.org/W2161928627","https://openalex.org/W4388482952","https://openalex.org/W2786113878","https://openalex.org/W2727867943","https://openalex.org/W3015562293","https://openalex.org/W4400860681","https://openalex.org/W1978161581","https://openalex.org/W2787155073"],"abstract_inverted_index":{"To":[0],"locate":[1],"multiple":[2,102],"bugs":[3],"in":[4],"parallel,":[5],"one":[6],"common":[7],"practice":[8],"is":[9,78],"to":[10,31,56,89],"generate":[11],"fault-focused":[12,33,71],"clusters":[13],"where":[14,69],"failed":[15,75],"test":[16,76],"cases":[17],"that":[18],"are":[19,26,46,83],"likely":[20],"caused":[21],"by":[22],"the":[23,32,58,70,86],"same":[24],"bug":[25],"grouped":[27],"together.":[28],"With":[29],"respect":[30],"clustering":[34],"and":[35,43,66,94],"fault":[36,39,60],"localization,":[37],"Spectrum-based":[38],"localization":[40,61],"(SBFL)":[41],"technique":[42],"distance":[44,67,96],"metric":[45],"two":[47],"critical":[48],"impact":[49],"factors.":[50],"This":[51],"article":[52],"proposes":[53],"a":[54],"method":[55,88],"evaluate":[57,90],"parallel":[59],"performance":[62],"of":[63],"SBFL":[64,92],"techniques":[65,93],"metrics":[68,97],"information":[72],"for":[73],"each":[74],"case":[77],"already":[79],"given.":[80],"Case":[81],"studies":[82],"conducted":[84],"using":[85],"proposed":[87],"five":[91,95],"on":[98],"three":[99],"programs":[100],"with":[101],"bugs.":[103]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":1}],"updated_date":"2026-03-13T16:22:10.518609","created_date":"2025-10-10T00:00:00"}