{"id":"https://openalex.org/W3178835401","doi":"https://doi.org/10.1109/tr.2021.3087531","title":"Measuring Conflicts of Multisource Imprecise Information in Multistate System Reliability Assessment","display_name":"Measuring Conflicts of Multisource Imprecise Information in Multistate System Reliability Assessment","publication_year":2021,"publication_date":"2021-07-09","ids":{"openalex":"https://openalex.org/W3178835401","doi":"https://doi.org/10.1109/tr.2021.3087531","mag":"3178835401"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2021.3087531","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2021.3087531","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.science/hal-03464076","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052063173","display_name":"Tangfan Xiahou","orcid":"https://orcid.org/0000-0001-7359-1129"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Tangfan Xiahou","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-7359-1129","affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016477281","display_name":"Zhiguo Zeng","orcid":"https://orcid.org/0000-0003-4937-4380"},"institutions":[{"id":"https://openalex.org/I4210134356","display_name":"Laboratoire G\u00e9nie Industriel","ror":"https://ror.org/0455wwj08","country_code":"FR","type":"facility","lineage":["https://openalex.org/I277688954","https://openalex.org/I277688954","https://openalex.org/I4210107720","https://openalex.org/I4210134356"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Zhiguo Zeng","raw_affiliation_strings":["Chaire on Risk and Resilience of Complex Systems, CentraleSupélec, Laboratoire Genie Industriel, Université Paris Saclay, Gif-sur-Yvette, France"],"raw_orcid":"https://orcid.org/0000-0003-4937-4380","affiliations":[{"raw_affiliation_string":"Chaire on Risk and Resilience of Complex Systems, CentraleSupélec, Laboratoire Genie Industriel, Université Paris Saclay, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I4210134356"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002498810","display_name":"Yu Liu","orcid":"https://orcid.org/0000-0002-4367-5097"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Liu","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-4367-5097","affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069596116","display_name":"Hong\u2010Zhong Huang","orcid":"https://orcid.org/0000-0003-4478-8349"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hong-Zhong Huang","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-4478-8349","affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5052063173"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":null,"apc_paid":null,"fwci":1.1305,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.8981715,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"71","issue":"4","first_page":"1417","last_page":"1434"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7629006505012512},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6787673234939575},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.6651869416236877},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5501752495765686},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27873915433883667},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.19168931245803833},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08643263578414917}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7629006505012512},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6787673234939575},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.6651869416236877},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5501752495765686},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27873915433883667},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.19168931245803833},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08643263578414917},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tr.2021.3087531","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2021.3087531","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-03464076v1","is_oa":true,"landing_page_url":"https://hal.science/hal-03464076","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Reliability, 2021, pp.1-18. ⟨10.1109/TR.2021.3087531⟩","raw_type":"Journal articles"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-03464076v1","is_oa":true,"landing_page_url":"https://hal.science/hal-03464076","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Reliability, 2021, pp.1-18. ⟨10.1109/TR.2021.3087531⟩","raw_type":"Journal articles"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/17","score":0.4099999964237213,"display_name":"Partnerships for the goals"}],"awards":[{"id":"https://openalex.org/G8319310471","display_name":null,"funder_award_id":"71771039","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G842747056","display_name":null,"funder_award_id":"71922006","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1975650154","https://openalex.org/W1978222731","https://openalex.org/W1984987698","https://openalex.org/W1993853885","https://openalex.org/W2020526086","https://openalex.org/W2037355783","https://openalex.org/W2037363404","https://openalex.org/W2040833276","https://openalex.org/W2044783355","https://openalex.org/W2051159673","https://openalex.org/W2053597171","https://openalex.org/W2070264454","https://openalex.org/W2072348410","https://openalex.org/W2079690285","https://openalex.org/W2095167324","https://openalex.org/W2099432182","https://openalex.org/W2136159456","https://openalex.org/W2149667642","https://openalex.org/W2151903074","https://openalex.org/W2154127879","https://openalex.org/W2165990543","https://openalex.org/W2406470551","https://openalex.org/W2791790628","https://openalex.org/W2803460043","https://openalex.org/W2886540171","https://openalex.org/W2891171439","https://openalex.org/W2918884343","https://openalex.org/W2945896883","https://openalex.org/W2952694534","https://openalex.org/W2981063638","https://openalex.org/W2999235804","https://openalex.org/W3017241401","https://openalex.org/W3030109419","https://openalex.org/W3087847882","https://openalex.org/W4301347335","https://openalex.org/W6783200753"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"In":[0,130],"engineering":[1,224],"scenarios,":[2],"expert":[3,138,155],"judgments":[4],"play":[5],"an":[6,223],"essential":[7],"role":[8],"in":[9,35,97,122,171],"reliability":[10,150,216],"assessment,":[11],"especially":[12],"for":[13,152],"those":[14],"systems":[15],"with":[16,222],"few":[17],"historical":[18],"data.":[19],"To":[20,100],"achieve":[21],"a":[22,78,103,126,198],"rational":[23],"result,":[24],"experts":[25,62],"from":[26,125,136,188],"different":[27,61,65],"areas":[28],"should":[29,38],"be":[30,39],"involved,":[31],"and":[32,53,67,89,118,168,194],"the":[33,71,74,82,93,98,112,120,123,131,134,143,149,153,157,165,178,181,207,214,230,233],"uncertainties":[34],"their":[36],"assessments":[37],"properly":[40],"addressed.":[41],"Such":[42],"information":[43,51],"is":[44,107,139,186,202,226],"often":[45],"referred":[46],"to":[47,116,141,176,204,213,228],"as":[48,60,81],"multisource":[49],"imprecise":[50],"(MSII)":[52],"might":[54],"contain":[55],"high":[56],"degree":[57,94],"of":[58,85,95,128,148,209,232],"conflicts,":[59],"usually":[63],"have":[64],"expertise":[66],"knowledge.":[68],"Properly":[69],"quantifying":[70],"conflicts":[72],"among":[73],"MSII,":[75],"then,":[76,174],"becomes":[77],"critical":[79],"issue,":[80],"subsequent":[83],"processing":[84],"MSII":[86,124,135,212],"(e.g.,":[87],"combination":[88],"calibration),":[90],"depends":[91],"on":[92,111],"conflict":[96,105,121,161,166,179,185,193],"MSII.":[99],"this":[101],"end,":[102],"new":[104],"measure":[106,177],"put":[108],"forth":[109],"based":[110],"Dempster\u2013Shafer":[113],"theory":[114],"(DST)":[115],"quantify":[117,206],"visualize":[119],"group":[127],"experts.":[129],"first":[132],"place,":[133],"each":[137,210],"used":[140,227],"construct":[142],"basic":[144],"belief":[145],"assignment":[146],"(BBA)":[147],"estimates":[151],"corresponding":[154],"under":[156],"DST.":[158],"A":[159,218],"2-D":[160],"measure,":[162],"which":[163],"combines":[164],"factor":[167],"Jousselme":[169],"distance":[170],"DST,":[172],"is,":[173],"proposed":[175,234],"between":[180],"experts\u2019":[182],"BBAs.":[183],"The":[184],"quantified":[187],"two":[189],"perspectives,":[190],"viz.,":[191],"mutual":[192],"total":[195],"conflict.":[196],"Finally,":[197],"Bhattacharyya":[199],"distance-based":[200],"method":[201],"developed":[203],"further":[205],"informativeness":[208],"expert's":[211],"system":[215],"estimate.":[217],"numerical":[219],"example":[220],"along":[221],"case":[225],"validate":[229],"effectiveness":[231],"approach.":[235]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":5}],"updated_date":"2026-05-05T08:41:31.759640","created_date":"2025-10-10T00:00:00"}