{"id":"https://openalex.org/W3171725232","doi":"https://doi.org/10.1109/tr.2021.3083375","title":"Guest Editorial: A Retrospective of Special Sections on Software Testing and Program Analysis","display_name":"Guest Editorial: A Retrospective of Special Sections on Software Testing and Program Analysis","publication_year":2021,"publication_date":"2021-06-01","ids":{"openalex":"https://openalex.org/W3171725232","doi":"https://doi.org/10.1109/tr.2021.3083375","mag":"3171725232"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2021.3083375","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tr.2021.3083375","pdf_url":"https://ieeexplore.ieee.org/ielx7/24/9448244/09448288.pdf","source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"editorial","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/24/9448244/09448288.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049494347","display_name":"T.H. Tse","orcid":"https://orcid.org/0000-0002-0460-8377"},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":true,"raw_author_name":"T. H. Tse","raw_affiliation_strings":["Department of Computer Science, The University of Hong Kong, Pokfulam, Hong Kong"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, The University of Hong Kong, Pokfulam, Hong Kong","institution_ids":["https://openalex.org/I889458895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040574362","display_name":"Yves Le Traon","orcid":"https://orcid.org/0000-0002-1045-4861"},"institutions":[{"id":"https://openalex.org/I186903577","display_name":"University of Luxembourg","ror":"https://ror.org/036x5ad56","country_code":"LU","type":"education","lineage":["https://openalex.org/I186903577"]}],"countries":["LU"],"is_corresponding":false,"raw_author_name":"Yves Le Traon","raw_affiliation_strings":["Interdisciplinary Centre for Security, Reliability and Trust, University of Luxembourg, Esch-sur-Alzette, Luxembourg"],"affiliations":[{"raw_affiliation_string":"Interdisciplinary Centre for Security, Reliability and Trust, University of Luxembourg, Esch-sur-Alzette, Luxembourg","institution_ids":["https://openalex.org/I186903577"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100422935","display_name":"Zhenyu Chen","orcid":"https://orcid.org/0000-0002-9592-7022"},"institutions":[{"id":"https://openalex.org/I881766915","display_name":"Nanjing University","ror":"https://ror.org/01rxvg760","country_code":"CN","type":"education","lineage":["https://openalex.org/I881766915"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhenyu Chen","raw_affiliation_strings":["State Key Laboratory for Novel Software Technology, Nanjing University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Novel Software Technology, Nanjing University, Nanjing, China","institution_ids":["https://openalex.org/I881766915"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5049494347"],"corresponding_institution_ids":["https://openalex.org/I889458895"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10150068,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"70","issue":"2","first_page":"443","last_page":"445"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6541798710823059},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.5663717985153198},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5551000833511353},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.5523390173912048},{"id":"https://openalex.org/keywords/variety","display_name":"Variety (cybernetics)","score":0.5480159521102905},{"id":"https://openalex.org/keywords/software-testing","display_name":"Software testing","score":0.5204848647117615},{"id":"https://openalex.org/keywords/special-section","display_name":"Special section","score":0.5159700512886047},{"id":"https://openalex.org/keywords/software-peer-review","display_name":"Software peer review","score":0.47324639558792114},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.43586236238479614},{"id":"https://openalex.org/keywords/data-science","display_name":"Data science","score":0.40424078702926636},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.3488624095916748},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.258484423160553},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20458078384399414}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6541798710823059},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.5663717985153198},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5551000833511353},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.5523390173912048},{"id":"https://openalex.org/C136197465","wikidata":"https://www.wikidata.org/wiki/Q1729295","display_name":"Variety (cybernetics)","level":2,"score":0.5480159521102905},{"id":"https://openalex.org/C2984328558","wikidata":"https://www.wikidata.org/wiki/Q188522","display_name":"Software testing","level":3,"score":0.5204848647117615},{"id":"https://openalex.org/C2993458768","wikidata":"https://www.wikidata.org/wiki/Q3477549","display_name":"Special section","level":2,"score":0.5159700512886047},{"id":"https://openalex.org/C74579156","wikidata":"https://www.wikidata.org/wiki/Q7554342","display_name":"Software peer review","level":5,"score":0.47324639558792114},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.43586236238479614},{"id":"https://openalex.org/C2522767166","wikidata":"https://www.wikidata.org/wiki/Q2374463","display_name":"Data science","level":1,"score":0.40424078702926636},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.3488624095916748},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.258484423160553},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20458078384399414},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2021.3083375","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tr.2021.3083375","pdf_url":"https://ieeexplore.ieee.org/ielx7/24/9448244/09448288.pdf","source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tr.2021.3083375","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tr.2021.3083375","pdf_url":"https://ieeexplore.ieee.org/ielx7/24/9448244/09448288.pdf","source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.6000000238418579}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3171725232.pdf","grobid_xml":"https://content.openalex.org/works/W3171725232.grobid-xml"},"referenced_works_count":27,"referenced_works":["https://openalex.org/W2789020245","https://openalex.org/W2791836928","https://openalex.org/W2793681838","https://openalex.org/W2793931479","https://openalex.org/W2794860422","https://openalex.org/W2804800426","https://openalex.org/W2806519974","https://openalex.org/W2806832999","https://openalex.org/W2808060402","https://openalex.org/W2809059567","https://openalex.org/W2809761809","https://openalex.org/W2810065972","https://openalex.org/W2811310887","https://openalex.org/W2814638054","https://openalex.org/W2884652599","https://openalex.org/W2890086692","https://openalex.org/W2891488249","https://openalex.org/W2892578092","https://openalex.org/W2898385488","https://openalex.org/W2903603888","https://openalex.org/W2921013737","https://openalex.org/W2964064379","https://openalex.org/W3036311602","https://openalex.org/W3120492914","https://openalex.org/W3121312380","https://openalex.org/W3133782093","https://openalex.org/W6756879134"],"related_works":["https://openalex.org/W2051591137","https://openalex.org/W2798306226","https://openalex.org/W4386970213","https://openalex.org/W2964704886","https://openalex.org/W886427026","https://openalex.org/W3125292927","https://openalex.org/W1494025131","https://openalex.org/W2209071826","https://openalex.org/W2921131395","https://openalex.org/W1602996893"],"abstract_inverted_index":{"Software":[0,64],"plays":[1],"an":[2],"integral":[3],"part":[4],"in":[5,37,115,124],"our":[6,15,167],"lives":[7],"today":[8],"because":[9],"of":[10,27,35,118,142,153],"its":[11],"near-ubiquitous":[12],"influence":[13],"on":[14,63,122],"increasingly":[16],"technological":[17],"society.":[18],"Taking":[19],"appropriate":[20],"steps":[21],"to":[22,56,82,155],"improve":[23],"software":[24,58],"quality":[25],"is":[26],"paramount":[28],"importance.":[29],"This":[30],"has":[31],"fueled":[32],"a":[33,138,150,171],"surge":[34],"techniques":[36,44,76],"program":[38],"testing":[39,143],"and":[40,49,66,107,127,132,144,170],"analysis.":[41],"Unfortunately,":[42],"these":[43],"still":[45],"suffer":[46],"from":[47],"immaturity":[48],"impracticality,":[50],"which":[51],"have":[52,111],"hindered":[53],"truthful":[54],"benefits":[55],"the":[57,119],"industry.":[59],"The":[60,135,158],"Special":[61],"Sections":[62],"Testing":[65],"Program":[67],"Analysis":[68],"solicited":[69],"original":[70],"work":[71],"that":[72],"would":[73],"provide":[74],"novel":[75],"and/or":[77],"comprehensive":[78,139],"empirical":[79],"validation":[80],"applicable":[81],"real-world":[83],"software.":[84],"We":[85],"successfully":[86],"attracted":[87],"more":[88],"than":[89],"70":[90],"submissions":[91],"covering":[92],"diverse":[93],"hot":[94],"topics.":[95],"After":[96],"rigorous":[97],"evaluations":[98],"by":[99],"hard-working":[100],"reviewers,":[101],"possibly":[102],"with":[103,163],"recommendations":[104],"for":[105],"major":[106],"minor":[108],"revisions,":[109],"we":[110],"published":[112],"26":[113],"articles":[114,136],"five":[116],"issues":[117],"IEEE":[120],"Transactions":[121],"Reliability":[123],"June,":[125],"September,":[126],"December":[128],"2018,":[129],"January":[130],"2019,":[131],"June":[133],"2021.":[134],"represent":[137],"cross":[140],"section":[141],"analysis":[145],"techniques,":[146],"as":[147,149],"well":[148],"wide":[151],"variety":[152],"applications":[154],"practical":[156],"projects.":[157],"present":[159],"retrospective":[160],"provides":[161],"readers":[162],"interesting":[164],"details":[165],"about":[166],"great":[168],"success":[169],"small":[172],"challenge.":[173]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}