{"id":"https://openalex.org/W3133567308","doi":"https://doi.org/10.1109/tr.2020.3047599","title":"Belief Availability for Repairable Systems Based on Uncertain Alternating Renewal Process","display_name":"Belief Availability for Repairable Systems Based on Uncertain Alternating Renewal Process","publication_year":2021,"publication_date":"2021-02-25","ids":{"openalex":"https://openalex.org/W3133567308","doi":"https://doi.org/10.1109/tr.2020.3047599","mag":"3133567308"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2020.3047599","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2020.3047599","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089652419","display_name":"Yu Wang","orcid":"https://orcid.org/0000-0002-6914-1536"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wang Yu","raw_affiliation_strings":["School of Reliability and Systems Engineering, Science and Technology on Reliability and Environmental Engineering Laboratory, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-6914-1536","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Science and Technology on Reliability and Environmental Engineering Laboratory, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Guo Linhan","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guo Linhan","raw_affiliation_strings":["School of Reliability and Systems Engineering, Science and Technology on Reliability and Environmental Engineering Laboratory, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Science and Technology on Reliability and Environmental Engineering Laboratory, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090658771","display_name":"Meilin Wen","orcid":"https://orcid.org/0000-0002-0819-2647"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wen Meilin","raw_affiliation_strings":["School of Reliability and Systems Engineering, Science and Technology on Reliability and Environmental Engineering Laboratory, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0819-2647","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Science and Technology on Reliability and Environmental Engineering Laboratory, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102026831","display_name":"Rui Kang","orcid":"https://orcid.org/0000-0002-4488-6574"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kang Rui","raw_affiliation_strings":["School of Reliability and Systems Engineering, Science and Technology on Reliability and Environmental Engineering Laboratory, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-4488-6574","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Science and Technology on Reliability and Environmental Engineering Laboratory, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.3653,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.78475505,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"70","issue":"3","first_page":"1242","last_page":"1254"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10050","display_name":"Multi-Criteria Decision Making","score":0.9876999855041504,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7055098414421082},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6052449941635132},{"id":"https://openalex.org/keywords/scope","display_name":"Scope (computer science)","score":0.5570905208587646},{"id":"https://openalex.org/keywords/belief-structure","display_name":"Belief structure","score":0.5557736158370972},{"id":"https://openalex.org/keywords/renewal-theory","display_name":"Renewal theory","score":0.536370038986206},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5193811058998108},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5009434223175049},{"id":"https://openalex.org/keywords/uncertainty-theory","display_name":"Uncertainty theory","score":0.4705895483493805},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.43665629625320435},{"id":"https://openalex.org/keywords/operations-research","display_name":"Operations research","score":0.3971937894821167},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.29200583696365356},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.22150328755378723},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.21012598276138306},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18682172894477844},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1511191725730896},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.12836134433746338}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7055098414421082},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6052449941635132},{"id":"https://openalex.org/C2778012447","wikidata":"https://www.wikidata.org/wiki/Q1034415","display_name":"Scope (computer science)","level":2,"score":0.5570905208587646},{"id":"https://openalex.org/C44973800","wikidata":"https://www.wikidata.org/wiki/Q4882755","display_name":"Belief structure","level":2,"score":0.5557736158370972},{"id":"https://openalex.org/C110507122","wikidata":"https://www.wikidata.org/wiki/Q1356856","display_name":"Renewal theory","level":2,"score":0.536370038986206},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5193811058998108},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5009434223175049},{"id":"https://openalex.org/C51152595","wikidata":"https://www.wikidata.org/wiki/Q7882501","display_name":"Uncertainty theory","level":2,"score":0.4705895483493805},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.43665629625320435},{"id":"https://openalex.org/C42475967","wikidata":"https://www.wikidata.org/wiki/Q194292","display_name":"Operations research","level":1,"score":0.3971937894821167},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.29200583696365356},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.22150328755378723},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21012598276138306},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18682172894477844},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1511191725730896},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.12836134433746338},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2020.3047599","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2020.3047599","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3009418347","display_name":null,"funder_award_id":"61573043","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4753659803","display_name":null,"funder_award_id":"61573041","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7090823840","display_name":null,"funder_award_id":"62073009","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":46,"referenced_works":["https://openalex.org/W196589224","https://openalex.org/W586494090","https://openalex.org/W1496395723","https://openalex.org/W1574146411","https://openalex.org/W1576479006","https://openalex.org/W1980208943","https://openalex.org/W1993152301","https://openalex.org/W1999642372","https://openalex.org/W1999761865","https://openalex.org/W2018977367","https://openalex.org/W2021171753","https://openalex.org/W2027084859","https://openalex.org/W2091403477","https://openalex.org/W2109510349","https://openalex.org/W2111959010","https://openalex.org/W2127740852","https://openalex.org/W2136536301","https://openalex.org/W2136571141","https://openalex.org/W2189263388","https://openalex.org/W2274279545","https://openalex.org/W2296044995","https://openalex.org/W2510699353","https://openalex.org/W2766491475","https://openalex.org/W2773235479","https://openalex.org/W2775948036","https://openalex.org/W2790482467","https://openalex.org/W2803460043","https://openalex.org/W2809067937","https://openalex.org/W2809153559","https://openalex.org/W2810762270","https://openalex.org/W2874651802","https://openalex.org/W2893933641","https://openalex.org/W2894727405","https://openalex.org/W2898820452","https://openalex.org/W2900597024","https://openalex.org/W2900923919","https://openalex.org/W2903045656","https://openalex.org/W2904293684","https://openalex.org/W2962884593","https://openalex.org/W2985684360","https://openalex.org/W3021906789","https://openalex.org/W3107885627","https://openalex.org/W4234521054","https://openalex.org/W4285719527","https://openalex.org/W6678868654","https://openalex.org/W6687289896"],"related_works":["https://openalex.org/W2033050953","https://openalex.org/W2182381755","https://openalex.org/W2735989604","https://openalex.org/W2070775611","https://openalex.org/W3207533144","https://openalex.org/W2012113269","https://openalex.org/W2176632791","https://openalex.org/W4226013350","https://openalex.org/W2957666543","https://openalex.org/W1530007477"],"abstract_inverted_index":{"Epistemic":[0],"uncertainty":[1,27],"exists":[2],"in":[3,110,157],"system":[4,125],"availability":[5,59,78,82,159,172,194],"evaluation":[6,195],"due":[7],"to":[8,65,134],"the":[9,26,34,66,70,103,107,111,122,128,136,146,162,170,178,182,191],"lack":[10],"of":[11,23,25,36,75,138,181,193],"data":[12],"and":[13,43,85,93,142],"information.":[14],"To":[15],"address":[16],"it,":[17],"this":[18],"article":[19],"proposes":[20],"a":[21,57,154],"series":[22],"definitions":[24],"theory-based":[28],"availability,":[29,32],"called":[30],"belief":[31,37,46,58,77,81,94,148,158],"expanding":[33],"scope":[35],"reliability":[38],"by":[39],"introducing":[40],"uncertainty-measured":[41],"logistics":[42],"maintenance":[44,90,143],"into":[45],"reliability.":[47],"Based":[48],"on":[49,127,145,177],"an":[50,99],"uncertain":[51],"alternating":[52],"renewal":[53],"process,":[54],"we":[55,72,168],"construct":[56],"model":[60,112],"for":[61],"repairable":[62],"systems":[63],"subject":[64],"epistemic":[67],"uncertainty.":[68],"From":[69],"model,":[71],"derive":[73],"formulas":[74],"several":[76],"metrics,":[79],"including":[80],"(inherent,":[83],"achieved,":[84],"operational),":[86],"delay":[87],"time":[88,91,144,179],"ratio,":[89,92],"failure":[95],"frequency.":[96],"We":[97],"find":[98],"interesting":[100],"property":[101],"that":[102],"states":[104],"order":[105],"or":[106],"initial":[108],"state":[109],"will":[113],"not":[114],"influence":[115],"these":[116],"metrics.":[117],"A":[118],"case":[119],"study":[120],"about":[121],"oxygen":[123],"generation":[124],"(OGS)":[126],"international":[129],"space":[130],"station":[131],"was":[132],"conducted":[133],"analyze":[135],"impact":[137],"its":[139],"working,":[140],"logistics,":[141],"OGS":[147,183],"operational":[149],"availability.":[150],"The":[151],"results":[152],"show":[153],"potential":[155],"application":[156],"tradeoff":[160],"between":[161],"OGS's":[163],"availability-related":[164],"parameters.":[165],"In":[166],"addition,":[167],"compared":[169],"proposed":[171],"with":[173,196],"probability":[174],"one":[175],"based":[176],"distributions":[180],"states,":[184],"illustrating":[185],"our":[186],"method":[187],"can":[188],"effectively":[189],"reduce":[190],"deviation":[192],"insufficient":[197],"data.":[198]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}