{"id":"https://openalex.org/W3092071367","doi":"https://doi.org/10.1109/tr.2020.3023032","title":"Availability Analysis of Systems Deploying Sequences of Environmental-Diversity-Based Recovery Methods","display_name":"Availability Analysis of Systems Deploying Sequences of Environmental-Diversity-Based Recovery Methods","publication_year":2020,"publication_date":"2020-10-06","ids":{"openalex":"https://openalex.org/W3092071367","doi":"https://doi.org/10.1109/tr.2020.3023032","mag":"3092071367"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2020.3023032","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2020.3023032","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040278378","display_name":"Kun Qiu","orcid":"https://orcid.org/0000-0002-4121-3665"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Kun Qiu","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100459073","display_name":"Zheng Zheng","orcid":"https://orcid.org/0000-0001-7922-9067"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zheng Zheng","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036851432","display_name":"Kishor S. Trivedi","orcid":"https://orcid.org/0000-0001-7396-6330"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kishor S. Trivedi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076828229","display_name":"Iv\u00e1n Mura","orcid":"https://orcid.org/0000-0001-5549-0324"},"institutions":[{"id":"https://openalex.org/I4210159968","display_name":"Duke Kunshan University","ror":"https://ror.org/04sr5ys16","country_code":"CN","type":"education","lineage":["https://openalex.org/I170897317","https://openalex.org/I37461747","https://openalex.org/I4210159968"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ivan Mura","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Duke Kunshan University, Kunshan, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke Kunshan University, Kunshan, China","institution_ids":["https://openalex.org/I4210159968"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5040278378"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":0.9115,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.76361416,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"70","issue":"3","first_page":"1126","last_page":"1142"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6612750291824341},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6456480622291565},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.590203583240509},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5598545670509338},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.533180296421051},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5220592021942139},{"id":"https://openalex.org/keywords/diversity","display_name":"Diversity (politics)","score":0.5147266387939453},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5016298294067383},{"id":"https://openalex.org/keywords/software-system","display_name":"Software system","score":0.4854326844215393},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.4328908324241638},{"id":"https://openalex.org/keywords/critical-system","display_name":"Critical system","score":0.4241909384727478},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.3565792441368103},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21024739742279053}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6612750291824341},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6456480622291565},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.590203583240509},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5598545670509338},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.533180296421051},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5220592021942139},{"id":"https://openalex.org/C2781316041","wikidata":"https://www.wikidata.org/wiki/Q1230584","display_name":"Diversity (politics)","level":2,"score":0.5147266387939453},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5016298294067383},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.4854326844215393},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.4328908324241638},{"id":"https://openalex.org/C2780074322","wikidata":"https://www.wikidata.org/wiki/Q28130043","display_name":"Critical system","level":2,"score":0.4241909384727478},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3565792441368103},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21024739742279053},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C19165224","wikidata":"https://www.wikidata.org/wiki/Q23404","display_name":"Anthropology","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2020.3023032","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2020.3023032","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/15","display_name":"Life in Land","score":0.6700000166893005}],"awards":[{"id":"https://openalex.org/G2896924447","display_name":null,"funder_award_id":"61772055","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7682846489","display_name":null,"funder_award_id":"61872169","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W34141764","https://openalex.org/W1661930086","https://openalex.org/W1714865987","https://openalex.org/W1979868167","https://openalex.org/W1988202416","https://openalex.org/W1992580876","https://openalex.org/W1996165017","https://openalex.org/W2030895849","https://openalex.org/W2035602304","https://openalex.org/W2045129218","https://openalex.org/W2069013681","https://openalex.org/W2073554508","https://openalex.org/W2086907488","https://openalex.org/W2136054925","https://openalex.org/W2145071552","https://openalex.org/W2161060677","https://openalex.org/W2181567306","https://openalex.org/W2295172418","https://openalex.org/W2624133308","https://openalex.org/W2743635440","https://openalex.org/W2768656507","https://openalex.org/W2774568581","https://openalex.org/W2901530949","https://openalex.org/W2908928665","https://openalex.org/W2913006997","https://openalex.org/W2949009804","https://openalex.org/W2962202409","https://openalex.org/W2988950135","https://openalex.org/W3000162811","https://openalex.org/W3008797115","https://openalex.org/W3011315577","https://openalex.org/W3139860299","https://openalex.org/W4238085304","https://openalex.org/W4238097735","https://openalex.org/W6601368268","https://openalex.org/W6774112282","https://openalex.org/W6843174137","https://openalex.org/W6980993111"],"related_works":["https://openalex.org/W4236583520","https://openalex.org/W2165143308","https://openalex.org/W2734736160","https://openalex.org/W2409468626","https://openalex.org/W4206863193","https://openalex.org/W4387158780","https://openalex.org/W2914540327","https://openalex.org/W2319821665","https://openalex.org/W4205351689","https://openalex.org/W2942166615"],"abstract_inverted_index":{"Mandelbug-caused":[0],"software":[1,28],"failures":[2,54],"are":[3],"significant":[4],"threats":[5],"to":[6,50,68,133,141],"system":[7,103,145,169],"availability,":[8],"especially":[9],"in":[10,92,163,180,195],"the":[11,27,36,53,70,87,102,113,120,129,135,143,149,164,167,173,176],"context":[12],"of":[13,38,72,78,99,115,122,131,137,151,166,175,207],"mission-critical":[14],"and":[15,63,119,198],"safety-critical":[16],"systems.":[17],"However,":[18],"there":[19],"is":[20,104,108],"still":[21],"no":[22],"systematic":[23],"method":[24],"for":[25,96,191,203],"keeping":[26],"free":[29],"from":[30,41,52],"Mandelbugs":[31],"before":[32],"release.":[33],"To":[34],"guarantee":[35],"availability":[37,71,88],"systems":[39,73,193],"suffering":[40],"Mandelbugs,":[42],"environmental-diversity-based":[43,79],"fault":[44],"tolerance":[45],"techniques":[46],"have":[47],"been":[48],"proposed":[49,177],"recover":[51],"caused":[55],"by":[56,184,199],"them.":[57],"In":[58,125],"this":[59,93],"article,":[60],"we":[61,90,127,154],"develop":[62,155],"study":[64],"an":[65,156],"analytic":[66],"model":[67],"assess":[69],"that":[74],"utilize":[75],"a":[76],"sequence":[77],"recovery":[80,100,117,139],"methods.":[81],"Improving":[82],"over":[83],"previous":[84],"relevant":[85,196],"studies,":[86],"formula":[89],"obtain":[91],"article":[94],"works":[95],"any":[97],"number":[98],"methods":[101,118,140],"equipped":[105],"with;":[106],"it":[107],"also":[109],"independent":[110],"on":[111,148],"both":[112],"nature":[114],"those":[116,189],"order":[121],"their":[123],"utilization.":[124],"addition,":[126],"consider":[128],"problem":[130],"how":[132],"arrange":[134],"set":[136],"available":[138],"achieve":[142],"largest":[144],"availability.":[146,170],"Based":[147],"results":[150,187],"our":[152,186],"analysis,":[153],"open-source":[157],"tool,":[158],"called":[159],"OPENS,":[160],"which":[161],"assists":[162],"calculation":[165],"optimal":[168],"We":[171],"validate":[172],"effectiveness":[174],"modeling":[178],"approach":[179],"two":[181],"ways,":[182],"namely":[183],"comparing":[185],"with":[188],"obtained":[190],"specific":[192],"considered":[194],"studies":[197],"conducting":[200],"numerical":[201],"analyses":[202],"more":[204],"general":[205],"scenarios":[206],"its":[208],"application.":[209]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}