{"id":"https://openalex.org/W2996957795","doi":"https://doi.org/10.1109/tr.2019.2957503","title":"Delayed Reporting of Faults in Warranty Claims","display_name":"Delayed Reporting of Faults in Warranty Claims","publication_year":2019,"publication_date":"2019-12-27","ids":{"openalex":"https://openalex.org/W2996957795","doi":"https://doi.org/10.1109/tr.2019.2957503","mag":"2996957795"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2019.2957503","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2019.2957503","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079399460","display_name":"Richard Arnold","orcid":"https://orcid.org/0000-0002-1238-1993"},"institutions":[{"id":"https://openalex.org/I41156924","display_name":"Victoria University of Wellington","ror":"https://ror.org/0040r6f76","country_code":"NZ","type":"education","lineage":["https://openalex.org/I41156924"]}],"countries":["NZ"],"is_corresponding":false,"raw_author_name":"Richard Arnold","raw_affiliation_strings":["School of Mathematics and Statistics, Victoria University of Wellington, Wellington, New Zealand"],"raw_orcid":"https://orcid.org/0000-0002-1238-1993","affiliations":[{"raw_affiliation_string":"School of Mathematics and Statistics, Victoria University of Wellington, Wellington, New Zealand","institution_ids":["https://openalex.org/I41156924"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060307475","display_name":"Stefanka Chukova","orcid":"https://orcid.org/0000-0003-1357-0814"},"institutions":[{"id":"https://openalex.org/I41156924","display_name":"Victoria University of Wellington","ror":"https://ror.org/0040r6f76","country_code":"NZ","type":"education","lineage":["https://openalex.org/I41156924"]}],"countries":["NZ"],"is_corresponding":false,"raw_author_name":"Stefanka Chukova","raw_affiliation_strings":["School of Mathematics and Statistics, Victoria University of Wellington, Wellington, New Zealand"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mathematics and Statistics, Victoria University of Wellington, Wellington, New Zealand","institution_ids":["https://openalex.org/I41156924"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047488692","display_name":"Yu Hayakawa","orcid":"https://orcid.org/0000-0002-6809-7262"},"institutions":[{"id":"https://openalex.org/I150744194","display_name":"Waseda University","ror":"https://ror.org/00ntfnx83","country_code":"JP","type":"education","lineage":["https://openalex.org/I150744194"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yu Hayakawa","raw_affiliation_strings":["School of International Liberal Studies, Waseda University, Tokyo, Japan"],"raw_orcid":"https://orcid.org/0000-0002-6809-7262","affiliations":[{"raw_affiliation_string":"School of International Liberal Studies, Waseda University, Tokyo, Japan","institution_ids":["https://openalex.org/I150744194"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2234,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.59346986,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"69","issue":"4","first_page":"1178","last_page":"1194"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/warranty","display_name":"Warranty","score":0.953242838382721},{"id":"https://openalex.org/keywords/poisson-process","display_name":"Poisson process","score":0.6465851068496704},{"id":"https://openalex.org/keywords/poisson-distribution","display_name":"Poisson distribution","score":0.5637692213058472},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5591492056846619},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5492933392524719},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5234400629997253},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.516755998134613},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5129251480102539},{"id":"https://openalex.org/keywords/stochastic-process","display_name":"Stochastic process","score":0.510674774646759},{"id":"https://openalex.org/keywords/preventive-maintenance","display_name":"Preventive maintenance","score":0.46703454852104187},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.4452049136161804},{"id":"https://openalex.org/keywords/counting-process","display_name":"Counting process","score":0.4420032203197479},{"id":"https://openalex.org/keywords/econometrics","display_name":"Econometrics","score":0.32975733280181885},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30086493492126465},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.22597229480743408},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16387957334518433},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.1116725504398346}],"concepts":[{"id":"https://openalex.org/C2779056723","wikidata":"https://www.wikidata.org/wiki/Q329717","display_name":"Warranty","level":2,"score":0.953242838382721},{"id":"https://openalex.org/C166144826","wikidata":"https://www.wikidata.org/wiki/Q1145117","display_name":"Poisson process","level":3,"score":0.6465851068496704},{"id":"https://openalex.org/C100906024","wikidata":"https://www.wikidata.org/wiki/Q205692","display_name":"Poisson distribution","level":2,"score":0.5637692213058472},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5591492056846619},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5492933392524719},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5234400629997253},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.516755998134613},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5129251480102539},{"id":"https://openalex.org/C8272713","wikidata":"https://www.wikidata.org/wiki/Q176737","display_name":"Stochastic process","level":2,"score":0.510674774646759},{"id":"https://openalex.org/C24090081","wikidata":"https://www.wikidata.org/wiki/Q1043452","display_name":"Preventive maintenance","level":2,"score":0.46703454852104187},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4452049136161804},{"id":"https://openalex.org/C2781104640","wikidata":"https://www.wikidata.org/wiki/Q11827313","display_name":"Counting process","level":2,"score":0.4420032203197479},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.32975733280181885},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30086493492126465},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.22597229480743408},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16387957334518433},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.1116725504398346},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2019.2957503","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2019.2957503","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320814","display_name":"Fulbright New Zealand","ror":"https://ror.org/0567eg765"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1978290336","https://openalex.org/W1981868680","https://openalex.org/W2000690934","https://openalex.org/W2012615076","https://openalex.org/W2020700747","https://openalex.org/W2037394443","https://openalex.org/W2044422786","https://openalex.org/W2048676509","https://openalex.org/W2061238521","https://openalex.org/W2066313412","https://openalex.org/W2086518625","https://openalex.org/W2092188435","https://openalex.org/W2129599550","https://openalex.org/W2164528605","https://openalex.org/W2166904177","https://openalex.org/W2178153083","https://openalex.org/W2348332123","https://openalex.org/W2386620489","https://openalex.org/W2481119534","https://openalex.org/W2799087070","https://openalex.org/W2996957795","https://openalex.org/W4254602002","https://openalex.org/W6772390394","https://openalex.org/W7071089241"],"related_works":["https://openalex.org/W3134847121","https://openalex.org/W2038933813","https://openalex.org/W1930979820","https://openalex.org/W1969038949","https://openalex.org/W2902941443","https://openalex.org/W2086239044","https://openalex.org/W2103425710","https://openalex.org/W1974977590","https://openalex.org/W2045189619","https://openalex.org/W3091978896"],"abstract_inverted_index":{"In":[0],"this":[1],"article,":[2],"we":[3],"present":[4],"a":[5,29,65,70,107,111,118],"model":[6,99],"for":[7],"delayed":[8],"reporting":[9,24,48],"of":[10,46,52,72,114],"faults:":[11],"multiple":[12,79],"nonfatal":[13],"faults":[14,62],"are":[15],"accumulated":[16],"and":[17,21,50,58,84,89,100,110],"then":[18],"simultaneously":[19],"reported":[20,53],"repaired.":[22],"The":[23],"process":[25,31,37],"is":[26],"modeled":[27],"as":[28],"stochastic":[30,36],"dependent":[32],"on":[33],"the":[34,39,43,47,75,98],"underlying":[35],"generating":[38],"faults.":[40],"We":[41,68,92],"derive":[42],"joint":[44],"distribution":[45],"times":[49],"numbers":[51],"faults,":[54],"giving":[55],"general":[56],"results":[57,59],"specific":[60],"to":[61,74,95],"generated":[63],"by":[64],"Poisson":[66],"process.":[67],"investigate":[69],"number":[71],"extensions":[73],"basic":[76],"model,":[77],"including":[78],"fault":[80],"types":[81],"(including":[82],"invisible":[83],"fatal":[85],"faults),":[86],"preventative":[87],"maintenance,":[88],"customer":[90],"rush.":[91],"show":[93],"how":[94],"simulate":[96],"from":[97,117],"implement":[101],"maximum":[102],"likelihood":[103],"parameter":[104],"estimation":[105],"in":[106],"simulated":[108],"dataset":[109,113],"real":[112],"warranty":[115],"claims":[116],"car":[119],"manufacturer.":[120]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2019,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}