{"id":"https://openalex.org/W2917291296","doi":"https://doi.org/10.1109/tr.2019.2895501","title":"Reliability Assessment of a Hierarchical System Subjected to Inconsistent Priors and Multilevel Data","display_name":"Reliability Assessment of a Hierarchical System Subjected to Inconsistent Priors and Multilevel Data","publication_year":2019,"publication_date":"2019-02-22","ids":{"openalex":"https://openalex.org/W2917291296","doi":"https://doi.org/10.1109/tr.2019.2895501","mag":"2917291296"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2019.2895501","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2019.2895501","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010967710","display_name":"Lechang Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I92403157","display_name":"University of Science and Technology Beijing","ror":"https://ror.org/02egmk993","country_code":"CN","type":"education","lineage":["https://openalex.org/I92403157"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Lechang Yang","raw_affiliation_strings":["School of Mechanical Engineering, University of Science and Technology Beijing, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-3895-0717","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, University of Science and Technology Beijing, Beijing, China","institution_ids":["https://openalex.org/I92403157"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101584360","display_name":"Yanling Guo","orcid":"https://orcid.org/0000-0001-5393-7778"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanling Guo","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100366964","display_name":"Qiang Wang","orcid":"https://orcid.org/0000-0002-2726-2081"},"institutions":[{"id":"https://openalex.org/I92403157","display_name":"University of Science and Technology Beijing","ror":"https://ror.org/02egmk993","country_code":"CN","type":"education","lineage":["https://openalex.org/I92403157"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiang Wang","raw_affiliation_strings":["School of Mechanical Engineering, University of Science and Technology Beijing, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, University of Science and Technology Beijing, Beijing, China","institution_ids":["https://openalex.org/I92403157"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5010967710"],"corresponding_institution_ids":["https://openalex.org/I92403157"],"apc_list":null,"apc_paid":null,"fwci":2.5809,"has_fulltext":false,"cited_by_count":35,"citation_normalized_percentile":{"value":0.92099511,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"69","issue":"1","first_page":"277","last_page":"292"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/prior-probability","display_name":"Prior probability","score":0.8887231349945068},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7740839719772339},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.672501802444458},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.5882775783538818},{"id":"https://openalex.org/keywords/hierarchical-database-model","display_name":"Hierarchical database model","score":0.5687201619148254},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5606873035430908},{"id":"https://openalex.org/keywords/prior-information","display_name":"Prior information","score":0.5288708806037903},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.48276486992836},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.4257124960422516},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.25106287002563477},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13534963130950928},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.12673139572143555}],"concepts":[{"id":"https://openalex.org/C177769412","wikidata":"https://www.wikidata.org/wiki/Q278090","display_name":"Prior probability","level":3,"score":0.8887231349945068},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7740839719772339},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.672501802444458},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.5882775783538818},{"id":"https://openalex.org/C144986985","wikidata":"https://www.wikidata.org/wiki/Q871236","display_name":"Hierarchical database model","level":2,"score":0.5687201619148254},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5606873035430908},{"id":"https://openalex.org/C3020402766","wikidata":"https://www.wikidata.org/wiki/Q104376712","display_name":"Prior information","level":2,"score":0.5288708806037903},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.48276486992836},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4257124960422516},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.25106287002563477},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13534963130950928},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.12673139572143555},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2019.2895501","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2019.2895501","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1263301287","display_name":null,"funder_award_id":"FRF-TP-17-056A1","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G7735471054","display_name":null,"funder_award_id":"2018M630073","funder_id":"https://openalex.org/F4320321543","funder_display_name":"China Postdoctoral Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320321543","display_name":"China Postdoctoral Science Foundation","ror":"https://ror.org/0426zh255"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":47,"referenced_works":["https://openalex.org/W1985551543","https://openalex.org/W2008202990","https://openalex.org/W2014441733","https://openalex.org/W2018815923","https://openalex.org/W2023516230","https://openalex.org/W2023967157","https://openalex.org/W2037355783","https://openalex.org/W2040011853","https://openalex.org/W2049588492","https://openalex.org/W2065641649","https://openalex.org/W2087204158","https://openalex.org/W2093095043","https://openalex.org/W2095430756","https://openalex.org/W2108135300","https://openalex.org/W2110699330","https://openalex.org/W2132005547","https://openalex.org/W2135551557","https://openalex.org/W2158303746","https://openalex.org/W2158840489","https://openalex.org/W2160541109","https://openalex.org/W2169730590","https://openalex.org/W2284946334","https://openalex.org/W2329664639","https://openalex.org/W2462462151","https://openalex.org/W2490212014","https://openalex.org/W2510667177","https://openalex.org/W2526681767","https://openalex.org/W2551671969","https://openalex.org/W2617325738","https://openalex.org/W2646615378","https://openalex.org/W2652378624","https://openalex.org/W2757676281","https://openalex.org/W2765435778","https://openalex.org/W2766092236","https://openalex.org/W2775097868","https://openalex.org/W2777598554","https://openalex.org/W2810156351","https://openalex.org/W2842350340","https://openalex.org/W4232685182","https://openalex.org/W4242360587","https://openalex.org/W4246386643","https://openalex.org/W4388319802","https://openalex.org/W6683591789","https://openalex.org/W6695655084","https://openalex.org/W6722888406","https://openalex.org/W6725788948","https://openalex.org/W6857876722"],"related_works":["https://openalex.org/W2562263695","https://openalex.org/W2123454964","https://openalex.org/W2135187896","https://openalex.org/W2767026009","https://openalex.org/W2795035211","https://openalex.org/W2017034551","https://openalex.org/W4386501972","https://openalex.org/W2160108762","https://openalex.org/W2015518264","https://openalex.org/W2147201983"],"abstract_inverted_index":{"The":[0,107],"reliability":[1,105,119,140],"assessment":[2,120,141],"for":[3,74],"a":[4,18,37,47,97,143],"system":[5,51],"with":[6,52,96,122,129],"multiple":[7],"prior":[8,28,159],"information":[9,160],"can":[10],"be":[11],"challenging.":[12],"In":[13],"this":[14],"paper,":[15],"we":[16],"propose":[17],"novel":[19],"Bayesian":[20],"melding":[21],"(BM)":[22],"approach":[23,31,111,136],"to":[24,35,46,83,100],"combine":[25],"the":[26,85,90,151,158],"inconsistent":[27],"distributions.":[29],"This":[30,135],"is":[32,69,81,154,161],"first":[33],"investigated":[34],"address":[36],"flaw":[38],"in":[39,104,115,145],"traditional":[40],"BM":[41],"methods":[42],"and":[43,55,71,89,118,132,157],"then":[44],"extended":[45],"general":[48],"multilevel":[49],"hierarchical":[50],"biased":[53,130],"priors":[54,131],"limited":[56,133,156],"data.":[57,134],"We":[58],"realize":[59],"our":[60,93,110],"method":[61],"via":[62],"an":[63],"improved":[64],"importance":[65],"sampling":[66],"technique,":[67],"which":[68],"intuitive":[70],"especially":[72],"convenient":[73],"routine":[75],"program.":[76],"A":[77],"simple":[78],"numerical":[79],"case":[80,99],"presented":[82],"illustrate":[84],"problem":[86],"at":[87],"stake":[88],"idea":[91],"behind":[92],"approach,":[94],"followed":[95],"practical":[98],"demonstrate":[101],"its":[102,146],"usefulness":[103],"engineering.":[106],"results":[108],"show":[109],"has":[112],"some":[113],"superiorities":[114],"parameter":[116],"estimation":[117],"compared":[121],"existing":[123],"studies":[124],"under":[125],"nonideal":[126],"circumstances,":[127],"i.e.,":[128],"provides":[137],"insights":[138],"into":[139],"of":[142],"system/product":[144],"early":[147],"usage":[148],"period,":[149],"where":[150],"test":[152],"data":[153],"usually":[155],"always":[162],"inaccurate.":[163]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2}],"updated_date":"2026-05-23T08:51:43.019350","created_date":"2025-10-10T00:00:00"}