{"id":"https://openalex.org/W2900929163","doi":"https://doi.org/10.1109/tr.2018.2874459","title":"A Sequential Bayesian Approach for Remaining Useful Life Prediction of Dependent Competing Failure Processes","display_name":"A Sequential Bayesian Approach for Remaining Useful Life Prediction of Dependent Competing Failure Processes","publication_year":2018,"publication_date":"2018-11-12","ids":{"openalex":"https://openalex.org/W2900929163","doi":"https://doi.org/10.1109/tr.2018.2874459","mag":"2900929163"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2018.2874459","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2018.2874459","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.science/hal-01988945/document","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035728477","display_name":"Mengfei Fan","orcid":"https://orcid.org/0000-0002-7713-7625"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Mengfei Fan","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016477281","display_name":"Zhiguo Zeng","orcid":"https://orcid.org/0000-0003-4937-4380"},"institutions":[{"id":"https://openalex.org/I102475099","display_name":"Sup\u00e9lec","ror":"https://ror.org/00n7gwn90","country_code":"FR","type":"education","lineage":["https://openalex.org/I102475099"]},{"id":"https://openalex.org/I277688954","display_name":"Universit\u00e9 Paris-Saclay","ror":"https://ror.org/03xjwb503","country_code":"FR","type":"education","lineage":["https://openalex.org/I277688954"]},{"id":"https://openalex.org/I280199911","display_name":"Bouygues (France)","ror":"https://ror.org/056185y51","country_code":"FR","type":"company","lineage":["https://openalex.org/I280199911"]},{"id":"https://openalex.org/I4210107720","display_name":"CentraleSup\u00e9lec","ror":"https://ror.org/019tcpt25","country_code":"FR","type":"facility","lineage":["https://openalex.org/I277688954","https://openalex.org/I4210107720"]},{"id":"https://openalex.org/I4210134356","display_name":"Laboratoire G\u00e9nie Industriel","ror":"https://ror.org/0455wwj08","country_code":"FR","type":"facility","lineage":["https://openalex.org/I277688954","https://openalex.org/I277688954","https://openalex.org/I4210107720","https://openalex.org/I4210134356"]},{"id":"https://openalex.org/I4210143116","display_name":"\u00c9lectricit\u00e9 de France (France)","ror":"https://ror.org/03wb8xz10","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210143116"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Zhiguo Zeng","raw_affiliation_strings":["Chair on System Science and the Energy Challenge, Fondation Electricite de France, Laboratoire Genie Industriel, CentraleSupelec, Universite Paris-Saclay, Gif-sur-Yvette, France","LGI - Laboratoire G\u00e9nie Industriel - EA 2606 (CentraleSup\u00e9lec - B\u00e2timent Bouygues\r\n3 rue Joliot Curie\r\n91190 GIF-SUR-YVETTE - France)","SSEC - Chaire Sciences des Syst\u00e8mes et D\u00e9fis Energ\u00e9tiques EDF/ECP/Sup\u00e9lec (France)","CentraleSup\u00e9lec (3, rue Joliot Curie,\r\nPlateau de Moulon,\r\n91192 GIF-SUR-YVETTE Cedex - France)"],"affiliations":[{"raw_affiliation_string":"Chair on System Science and the Energy Challenge, Fondation Electricite de France, Laboratoire Genie Industriel, CentraleSupelec, Universite Paris-Saclay, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I4210107720","https://openalex.org/I4210143116","https://openalex.org/I4210134356","https://openalex.org/I277688954"]},{"raw_affiliation_string":"LGI - Laboratoire G\u00e9nie Industriel - EA 2606 (CentraleSup\u00e9lec - B\u00e2timent Bouygues\r\n3 rue Joliot Curie\r\n91190 GIF-SUR-YVETTE - France)","institution_ids":["https://openalex.org/I4210134356","https://openalex.org/I4210107720","https://openalex.org/I280199911"]},{"raw_affiliation_string":"SSEC - Chaire Sciences des Syst\u00e8mes et D\u00e9fis Energ\u00e9tiques EDF/ECP/Sup\u00e9lec (France)","institution_ids":["https://openalex.org/I102475099"]},{"raw_affiliation_string":"CentraleSup\u00e9lec (3, rue Joliot Curie,\r\nPlateau de Moulon,\r\n91192 GIF-SUR-YVETTE Cedex - France)","institution_ids":["https://openalex.org/I4210107720"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012431211","display_name":"Enrico Zio","orcid":"https://orcid.org/0000-0002-7108-637X"},"institutions":[{"id":"https://openalex.org/I102475099","display_name":"Sup\u00e9lec","ror":"https://ror.org/00n7gwn90","country_code":"FR","type":"education","lineage":["https://openalex.org/I102475099"]},{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["FR","IT"],"is_corresponding":false,"raw_author_name":"Enrico Zio","raw_affiliation_strings":["Energy Department, Politecnico di Milano, Milano, Italy","SSEC - Chaire Sciences des Syst\u00e8mes et D\u00e9fis Energ\u00e9tiques EDF/ECP/Sup\u00e9lec (France)"],"affiliations":[{"raw_affiliation_string":"Energy Department, Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"SSEC - Chaire Sciences des Syst\u00e8mes et D\u00e9fis Energ\u00e9tiques EDF/ECP/Sup\u00e9lec (France)","institution_ids":["https://openalex.org/I102475099"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102026831","display_name":"Rui Kang","orcid":"https://orcid.org/0000-0002-4488-6574"},"institutions":[{"id":"https://openalex.org/I170201317","display_name":"University of Pittsburgh","ror":"https://ror.org/01an3r305","country_code":"US","type":"education","lineage":["https://openalex.org/I170201317"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN","US"],"is_corresponding":false,"raw_author_name":"Rui Kang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China","PITT - University of Pittsburgh (4200 Fifth Avenue Pittsburgh, PA 15260 - United States)"],"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"PITT - University of Pittsburgh (4200 Fifth Avenue Pittsburgh, PA 15260 - United States)","institution_ids":["https://openalex.org/I170201317"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100700519","display_name":"Ying Chen","orcid":"https://orcid.org/0000-0002-6527-4251"},"institutions":[{"id":"https://openalex.org/I2279609970","display_name":"Universit\u00e9 de Lille","ror":"https://ror.org/02kzqn938","country_code":"FR","type":"education","lineage":["https://openalex.org/I2279609970"]},{"id":"https://openalex.org/I4210145948","display_name":"Laboratoire Paul Painlev\u00e9","ror":"https://ror.org/043n4fm24","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I2279609970","https://openalex.org/I4210141950","https://openalex.org/I4210145948"]},{"id":"https://openalex.org/I4210151406","display_name":"Laboratoire de Physique des Plasmas","ror":"https://ror.org/05c95bg36","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I142476485","https://openalex.org/I2746051580","https://openalex.org/I277688954","https://openalex.org/I2800004676","https://openalex.org/I39804081","https://openalex.org/I4210095849","https://openalex.org/I4210145102","https://openalex.org/I4210151406"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN","FR"],"is_corresponding":false,"raw_author_name":"Ying Chen","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China","LPP - Laboratoire Paul Painlev\u00e9 - UMR 8524 (Universit\u00e9 de Lille - Sciences et technologies - U.F.R. de Math\u00e9matiques - 59655 Villeneuve d'Ascq Cedex - France)"],"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"LPP - Laboratoire Paul Painlev\u00e9 - UMR 8524 (Universit\u00e9 de Lille - Sciences et technologies - U.F.R. de Math\u00e9matiques - 59655 Villeneuve d'Ascq Cedex - France)","institution_ids":["https://openalex.org/I2279609970","https://openalex.org/I4210145948","https://openalex.org/I4210151406"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5035728477"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":6.0261,"has_fulltext":true,"cited_by_count":39,"citation_normalized_percentile":{"value":0.96315628,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"68","issue":"1","first_page":"317","last_page":"329"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/unobservable","display_name":"Unobservable","score":0.8383175134658813},{"id":"https://openalex.org/keywords/dependency","display_name":"Dependency (UML)","score":0.683473527431488},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5821059942245483},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.5573769211769104},{"id":"https://openalex.org/keywords/shock","display_name":"Shock (circulatory)","score":0.5533522963523865},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5291916131973267},{"id":"https://openalex.org/keywords/particle-filter","display_name":"Particle filter","score":0.45646512508392334},{"id":"https://openalex.org/keywords/stochastic-process","display_name":"Stochastic process","score":0.4244103729724884},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3825734257698059},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.358828604221344},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24223628640174866},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.21876651048660278},{"id":"https://openalex.org/keywords/kalman-filter","display_name":"Kalman filter","score":0.2040589451789856},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.19545426964759827},{"id":"https://openalex.org/keywords/econometrics","display_name":"Econometrics","score":0.18375274538993835},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.1539098024368286}],"concepts":[{"id":"https://openalex.org/C2780695315","wikidata":"https://www.wikidata.org/wiki/Q3799040","display_name":"Unobservable","level":2,"score":0.8383175134658813},{"id":"https://openalex.org/C19768560","wikidata":"https://www.wikidata.org/wiki/Q320727","display_name":"Dependency (UML)","level":2,"score":0.683473527431488},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5821059942245483},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.5573769211769104},{"id":"https://openalex.org/C2781300812","wikidata":"https://www.wikidata.org/wiki/Q178061","display_name":"Shock (circulatory)","level":2,"score":0.5533522963523865},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5291916131973267},{"id":"https://openalex.org/C52421305","wikidata":"https://www.wikidata.org/wiki/Q1151499","display_name":"Particle filter","level":3,"score":0.45646512508392334},{"id":"https://openalex.org/C8272713","wikidata":"https://www.wikidata.org/wiki/Q176737","display_name":"Stochastic process","level":2,"score":0.4244103729724884},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3825734257698059},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.358828604221344},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24223628640174866},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21876651048660278},{"id":"https://openalex.org/C157286648","wikidata":"https://www.wikidata.org/wiki/Q846780","display_name":"Kalman filter","level":2,"score":0.2040589451789856},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.19545426964759827},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.18375274538993835},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1539098024368286},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/tr.2018.2874459","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2018.2874459","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-01988945v1","is_oa":true,"landing_page_url":"https://hal.science/hal-01988945","pdf_url":"https://hal.science/hal-01988945/document","source":{"id":"https://openalex.org/S4406922466","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Reliability, 2018, pp.1-13. ⟨10.1109/tr.2018.2874459⟩","raw_type":"Journal articles"},{"id":"pmh:oai:lilloa.univ-lille.fr:20.500.12210/123012","is_oa":true,"landing_page_url":"http://hdl.handle.net/20.500.12210/123012","pdf_url":null,"source":{"id":"https://openalex.org/S4306402203","display_name":"LillOA (Universit\u00e9 de Lille (University Of Lille))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210123514","host_organization_name":"Centre d'Etudes en Civilisations, Langues et Litt\u00e9ratures Etrang\u00e8res","host_organization_lineage":["https://openalex.org/I4210123514"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:re.public.polimi.it:11311/1077972","is_oa":true,"landing_page_url":"http://hdl.handle.net/11311/1077972","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-01988945v1","is_oa":true,"landing_page_url":"https://hal.science/hal-01988945","pdf_url":"https://hal.science/hal-01988945/document","source":{"id":"https://openalex.org/S4406922466","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Reliability, 2018, pp.1-13. ⟨10.1109/tr.2018.2874459⟩","raw_type":"Journal articles"},"sustainable_development_goals":[{"score":0.550000011920929,"display_name":"Responsible consumption and production","id":"https://metadata.un.org/sdg/12"}],"awards":[{"id":"https://openalex.org/G1023919524","display_name":null,"funder_award_id":", Grant","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G1231421488","display_name":null,"funder_award_id":"under","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G1497472705","display_name":null,"funder_award_id":"71601010","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2087396116","display_name":null,"funder_award_id":"China","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3009418347","display_name":null,"funder_award_id":"61573043","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3216677882","display_name":null,"funder_award_id":"201606","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3317480652","display_name":null,"funder_award_id":"Science","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G384178317","display_name":null,"funder_award_id":"02008","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G391238517","display_name":null,"funder_award_id":", and","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4765606963","display_name":null,"funder_award_id":"201606020082","funder_id":"https://openalex.org/F4320322725","funder_display_name":"China Scholarship Council"},{"id":"https://openalex.org/G5797785011","display_name":null,"funder_award_id":"16010","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5994120800","display_name":null,"funder_award_id":"Natural","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G752714931","display_name":null,"funder_award_id":"71671009","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8589651859","display_name":null,"funder_award_id":"China","funder_id":"https://openalex.org/F4320322725","funder_display_name":"China Scholarship Council"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322725","display_name":"China Scholarship Council","ror":"https://ror.org/04atp4p48"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2900929163.pdf","grobid_xml":"https://content.openalex.org/works/W2900929163.grobid-xml"},"referenced_works_count":40,"referenced_works":["https://openalex.org/W1970244919","https://openalex.org/W1976625337","https://openalex.org/W1988264848","https://openalex.org/W1988482885","https://openalex.org/W1990728043","https://openalex.org/W2001074797","https://openalex.org/W2016248941","https://openalex.org/W2031294592","https://openalex.org/W2032606617","https://openalex.org/W2040896388","https://openalex.org/W2048227639","https://openalex.org/W2055873761","https://openalex.org/W2088078669","https://openalex.org/W2088555868","https://openalex.org/W2110554687","https://openalex.org/W2114087231","https://openalex.org/W2131820609","https://openalex.org/W2132049856","https://openalex.org/W2137951154","https://openalex.org/W2149823865","https://openalex.org/W2160337655","https://openalex.org/W2161463361","https://openalex.org/W2165609874","https://openalex.org/W2170542765","https://openalex.org/W2515914268","https://openalex.org/W2538479000","https://openalex.org/W2557573737","https://openalex.org/W2591396985","https://openalex.org/W2599868532","https://openalex.org/W2611848954","https://openalex.org/W2614684151","https://openalex.org/W2620871799","https://openalex.org/W2622261553","https://openalex.org/W2625670148","https://openalex.org/W2760606386","https://openalex.org/W2776759394","https://openalex.org/W4242360587","https://openalex.org/W4251960031","https://openalex.org/W4388297583","https://openalex.org/W6744650589"],"related_works":["https://openalex.org/W2614563012","https://openalex.org/W4293337373","https://openalex.org/W1968533609","https://openalex.org/W1984270607","https://openalex.org/W2349333549","https://openalex.org/W2486803649","https://openalex.org/W2116445905","https://openalex.org/W3140685204","https://openalex.org/W2151842462","https://openalex.org/W1121825224"],"abstract_inverted_index":{"A":[0],"sequential":[1],"Bayesian":[2],"approach":[3],"is":[4,82,176],"presented":[5],"for":[6,166,178],"remaining":[7],"useful":[8],"life":[9],"(RUL)":[10],"prediction":[11],"of":[12,22,119,158],"dependent":[13],"competing":[14],"failure":[15,24,31,145],"processes":[16,25,32,48,58,98,123],"(DCFP).":[17],"The":[18,148],"DCFP":[19,196],"considered":[20,165],"comprises":[21],"soft":[23],"due":[26,33,40],"to":[27,34,41,45,66,95,154,190],"degradation":[28,47,97,107,135],"and":[29,72,136,139,169],"hard":[30,144],"random":[35,52,56,121],"shocks,":[36],"where":[37],"dependency":[38,132],"arises":[39],"the":[42,46,51,69,74,77,80,90,96,106,114,117,120,127,131,134,140,156,159,184,193],"abrupt":[43],"changes":[44],"brought":[49],"by":[50],"shocks.":[53],"In":[54,76],"practice,":[55],"shock":[57,70,122,137],"are":[59,99,124,164],"often":[60],"unobservable,":[61],"which":[62],"makes":[63],"it":[64],"difficult":[65],"accurately":[67,191],"estimate":[68],"intensities":[71,118],"predict":[73,155,192],"RUL.":[75],"proposed":[78,185],"method,":[79],"problem":[81],"solved":[83],"recursively":[84],"in":[85,89,113,195],"a":[86,170],"two-stage":[87],"framework:":[88],"first":[91],"stage,":[92,116],"parameters":[93,150],"related":[94],"updated":[100,125,149],"using":[101,126],"particle":[102],"filtering,":[103],"based":[104],"on":[105],"data":[108],"observed":[109],"through":[110],"condition":[111],"monitoring;":[112],"second":[115],"Metropolis-Hastings":[128],"algorithm,":[129],"considering":[130],"between":[133],"processes,":[138],"fact":[141],"that":[142,183],"no":[143],"has":[146],"occurred.":[147],"are,":[151],"then,":[152],"used":[153,177,189],"RUL":[157,194],"system.":[160],"Two":[161],"numerical":[162],"examples":[163],"demonstration":[167],"purposes":[168],"real":[171],"dataset":[172],"from":[173],"milling":[174],"machines":[175],"application":[179],"purposes.":[180],"Results":[181],"show":[182],"method":[186],"can":[187],"be":[188],"conditions.":[197]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":8}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}