{"id":"https://openalex.org/W2805298066","doi":"https://doi.org/10.1109/tr.2018.2834828","title":"An Ensemble of Component-Based and Population-Based Self-Organizing Maps for the Identification of the Degradation State of Insulated-Gate Bipolar Transistors","display_name":"An Ensemble of Component-Based and Population-Based Self-Organizing Maps for the Identification of the Degradation State of Insulated-Gate Bipolar Transistors","publication_year":2018,"publication_date":"2018-05-30","ids":{"openalex":"https://openalex.org/W2805298066","doi":"https://doi.org/10.1109/tr.2018.2834828","mag":"2805298066"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2018.2834828","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2018.2834828","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057330323","display_name":"Marco Rigamonti","orcid":"https://orcid.org/0000-0002-8863-1063"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Marco Rigamonti","raw_affiliation_strings":["Politecnico di Milano, Milan, Italy"],"raw_orcid":"https://orcid.org/0000-0002-8863-1063","affiliations":[{"raw_affiliation_string":"Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048799305","display_name":"Piero Baraldi","orcid":"https://orcid.org/0000-0003-4232-4161"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Piero Baraldi","raw_affiliation_strings":["Politecnico di Milano, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034787888","display_name":"Allegra Alessi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127856","display_name":"Rolls-Royce (United States)","ror":"https://ror.org/03gwgww50","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127856"]},{"id":"https://openalex.org/I866009140","display_name":"Rolls-Royce (United Kingdom)","ror":"https://ror.org/04h08p482","country_code":"GB","type":"company","lineage":["https://openalex.org/I866009140"]}],"countries":["GB","US"],"is_corresponding":false,"raw_author_name":"Allegra Alessi","raw_affiliation_strings":["Rolls-Royce, Civil Aerospace Division, London, U.K"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rolls-Royce, Civil Aerospace Division, London, U.K","institution_ids":["https://openalex.org/I866009140","https://openalex.org/I4210127856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012431211","display_name":"Enrico Zio","orcid":"https://orcid.org/0000-0002-7108-637X"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Enrico Zio","raw_affiliation_strings":["Politecnico di Milano, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044805068","display_name":"Daniel Astigarraga","orcid":"https://orcid.org/0000-0002-6760-5018"},"institutions":[{"id":"https://openalex.org/I170828890","display_name":"Centro de Estudios e Investigaciones T\u00e9cnicas de Gipuzkoa","ror":"https://ror.org/022wqqf69","country_code":"ES","type":"nonprofit","lineage":["https://openalex.org/I170828890"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Daniel Astigarraga","raw_affiliation_strings":["Ceit-IK4, Sebastian, Spain"],"raw_orcid":"https://orcid.org/0000-0002-6760-5018","affiliations":[{"raw_affiliation_string":"Ceit-IK4, Sebastian, Spain","institution_ids":["https://openalex.org/I170828890"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022330048","display_name":"Ainhoa Galarza","orcid":"https://orcid.org/0000-0002-9584-9482"},"institutions":[{"id":"https://openalex.org/I170828890","display_name":"Centro de Estudios e Investigaciones T\u00e9cnicas de Gipuzkoa","ror":"https://ror.org/022wqqf69","country_code":"ES","type":"nonprofit","lineage":["https://openalex.org/I170828890"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Ainhoa Galarza","raw_affiliation_strings":["Ceit-IK4, Sebastian, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ceit-IK4, Sebastian, Spain","institution_ids":["https://openalex.org/I170828890"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5057330323"],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":null,"apc_paid":null,"fwci":1.178,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.79904182,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"67","issue":"3","first_page":"1304","last_page":"1313"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/unavailability","display_name":"Unavailability","score":0.8209046125411987},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.6902816295623779},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.6776842474937439},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.605843186378479},{"id":"https://openalex.org/keywords/population","display_name":"Population","score":0.5451445579528809},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5353017449378967},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5351022481918335},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.4395419955253601},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.43268436193466187},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.41215693950653076},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.40044137835502625},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3452242612838745},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3040434718132019},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2961955964565277},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.14844024181365967},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07590782642364502},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.06657776236534119}],"concepts":[{"id":"https://openalex.org/C2780505938","wikidata":"https://www.wikidata.org/wiki/Q17093282","display_name":"Unavailability","level":2,"score":0.8209046125411987},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.6902816295623779},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.6776842474937439},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.605843186378479},{"id":"https://openalex.org/C2908647359","wikidata":"https://www.wikidata.org/wiki/Q2625603","display_name":"Population","level":2,"score":0.5451445579528809},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5353017449378967},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5351022481918335},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.4395419955253601},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.43268436193466187},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.41215693950653076},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.40044137835502625},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3452242612838745},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3040434718132019},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2961955964565277},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.14844024181365967},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07590782642364502},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.06657776236534119},{"id":"https://openalex.org/C149923435","wikidata":"https://www.wikidata.org/wiki/Q37732","display_name":"Demography","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tr.2018.2834828","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2018.2834828","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},{"id":"pmh:oai:re.public.polimi.it:11311/1077948","is_oa":false,"landing_page_url":"http://hdl.handle.net/11311/1077948","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":49,"referenced_works":["https://openalex.org/W1528955973","https://openalex.org/W1542619214","https://openalex.org/W1606275665","https://openalex.org/W1979861305","https://openalex.org/W1988790447","https://openalex.org/W1995450389","https://openalex.org/W1999959919","https://openalex.org/W2002590976","https://openalex.org/W2004206977","https://openalex.org/W2024758732","https://openalex.org/W2026677556","https://openalex.org/W2037516832","https://openalex.org/W2037838959","https://openalex.org/W2043281016","https://openalex.org/W2044309218","https://openalex.org/W2046079134","https://openalex.org/W2061708588","https://openalex.org/W2091204867","https://openalex.org/W2093567461","https://openalex.org/W2096947102","https://openalex.org/W2098154993","https://openalex.org/W2107074288","https://openalex.org/W2110498781","https://openalex.org/W2111511885","https://openalex.org/W2121434426","https://openalex.org/W2124983207","https://openalex.org/W2127264368","https://openalex.org/W2138263042","https://openalex.org/W2139772385","https://openalex.org/W2141188346","https://openalex.org/W2144331387","https://openalex.org/W2150763729","https://openalex.org/W2150884987","https://openalex.org/W2167917621","https://openalex.org/W2169304077","https://openalex.org/W2195802479","https://openalex.org/W2217442075","https://openalex.org/W2290910129","https://openalex.org/W2293873019","https://openalex.org/W2343467018","https://openalex.org/W2344362864","https://openalex.org/W2508495335","https://openalex.org/W2594197883","https://openalex.org/W2912934387","https://openalex.org/W2999052164","https://openalex.org/W4212883601","https://openalex.org/W4249919990","https://openalex.org/W6734280893","https://openalex.org/W6772408854"],"related_works":["https://openalex.org/W4376453582","https://openalex.org/W3147033875","https://openalex.org/W2764722704","https://openalex.org/W2067061907","https://openalex.org/W2094123434","https://openalex.org/W3149465034","https://openalex.org/W2073695023","https://openalex.org/W4376651802","https://openalex.org/W2357926952","https://openalex.org/W2768994168"],"abstract_inverted_index":{"The":[0,43,116],"development":[1],"of":[2,8,12,24,32,39,78,88,134,138,147],"data-driven":[3],"models":[4,91],"for":[5],"the":[6,9,22,30,36,40,47,61,86,89,103,112,132,135,148],"identification":[7,133],"degradation":[10,41,48,136],"state":[11,49,137],"industrial":[13],"components":[14,80,151],"is":[15],"challenged":[16],"by":[17,52,69],"several":[18],"issues,":[19],"such":[20],"as":[21,145],"unavailability":[23],"large":[25],"datasets":[26],"containing":[27],"historical":[28],"data,":[29],"presence":[31],"measurement":[33],"noise,":[34],"and":[35],"intrinsic":[37],"stochasticity":[38],"process.":[42],"proposed":[44,117],"method":[45,100],"merges":[46],"assessments":[50],"provided":[51,68],"self-organizing":[53],"maps":[54],"(SOMs)":[55],"trained":[56,71],"using":[57,72,95],"data":[58,73],"collected":[59,74],"from":[60,75],"component":[62],"under":[63,114],"test":[64],"(component-based)":[65],"with":[66,124],"that":[67],"SOMs":[70],"a":[76,96],"fleet":[77],"similar":[79,110],"(population-based).":[81],"Within":[82],"an":[83,127],"ensemble":[84,119],"approach,":[85],"outcomes":[87],"SOM":[90],"are":[92,143],"then":[93],"aggregated":[94],"dynamic":[97],"weights":[98],"proportional":[99],"based":[101],"on":[102],"individual":[104],"model":[105],"local":[106],"performances":[107],"in":[108,152],"situations":[109],"to":[111,126],"one":[113,146],"test.":[115],"SOM-based":[118],"approach":[120],"has":[121],"been":[122],"verified":[123],"respect":[125],"experimental":[128],"case":[129],"study":[130],"concerning":[131],"insulated-gate":[139],"bipolar":[140],"transistors,":[141],"which":[142],"known":[144],"most":[149],"critical":[150],"power":[153],"systems.":[154]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}