{"id":"https://openalex.org/W2809293408","doi":"https://doi.org/10.1109/tr.2018.2832022","title":"Reliability Analysis of Repairable Systems With Incomplete Failure Time Data","display_name":"Reliability Analysis of Repairable Systems With Incomplete Failure Time Data","publication_year":2018,"publication_date":"2018-06-20","ids":{"openalex":"https://openalex.org/W2809293408","doi":"https://doi.org/10.1109/tr.2018.2832022","mag":"2809293408"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2018.2832022","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2018.2832022","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078578952","display_name":"Wujun Si","orcid":"https://orcid.org/0000-0003-3450-3987"},"institutions":[{"id":"https://openalex.org/I185443292","display_name":"Wayne State University","ror":"https://ror.org/01070mq45","country_code":"US","type":"education","lineage":["https://openalex.org/I185443292"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Wujun Si","raw_affiliation_strings":["Department of Industrial and Systems Engineering, Wayne\u00a0State University, Detroit, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial and Systems Engineering, Wayne\u00a0State University, Detroit, MI, USA","institution_ids":["https://openalex.org/I185443292"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020802377","display_name":"Qingyu Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I185443292","display_name":"Wayne State University","ror":"https://ror.org/01070mq45","country_code":"US","type":"education","lineage":["https://openalex.org/I185443292"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Qingyu Yang","raw_affiliation_strings":["Department of Industrial and Systems Engineering, Wayne\u00a0State University, Detroit, MI, USA"],"raw_orcid":"https://orcid.org/0000-0002-9811-4393","affiliations":[{"raw_affiliation_string":"Department of Industrial and Systems Engineering, Wayne\u00a0State University, Detroit, MI, USA","institution_ids":["https://openalex.org/I185443292"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078748170","display_name":"Leslie Monplaisir","orcid":null},"institutions":[{"id":"https://openalex.org/I185443292","display_name":"Wayne State University","ror":"https://ror.org/01070mq45","country_code":"US","type":"education","lineage":["https://openalex.org/I185443292"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Leslie Monplaisir","raw_affiliation_strings":["Department of Industrial and Systems Engineering, Wayne\u00a0State University, Detroit, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial and Systems Engineering, Wayne\u00a0State University, Detroit, MI, USA","institution_ids":["https://openalex.org/I185443292"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103623899","display_name":"Yong Chen","orcid":"https://orcid.org/0009-0003-8041-814X"},"institutions":[{"id":"https://openalex.org/I126307644","display_name":"University of Iowa","ror":"https://ror.org/036jqmy94","country_code":"US","type":"education","lineage":["https://openalex.org/I126307644"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yong Chen","raw_affiliation_strings":["Department of Mechanical and Industrial Engineering, University of Iowa, Iowa City, IA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical and Industrial Engineering, University of Iowa, Iowa City, IA, USA","institution_ids":["https://openalex.org/I126307644"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5078578952"],"corresponding_institution_ids":["https://openalex.org/I185443292"],"apc_list":null,"apc_paid":null,"fwci":2.8843,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.89453095,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"67","issue":"3","first_page":"1043","last_page":"1059"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7289465665817261},{"id":"https://openalex.org/keywords/censoring","display_name":"Censoring (clinical trials)","score":0.7210184335708618},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6840470433235168},{"id":"https://openalex.org/keywords/missing-data","display_name":"Missing data","score":0.6655216217041016},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.6644010543823242},{"id":"https://openalex.org/keywords/inference","display_name":"Inference","score":0.5947126150131226},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.584558367729187},{"id":"https://openalex.org/keywords/maximum-likelihood","display_name":"Maximum likelihood","score":0.5322359204292297},{"id":"https://openalex.org/keywords/accelerated-life-testing","display_name":"Accelerated life testing","score":0.4653283953666687},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.3998482823371887},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3294532597064972},{"id":"https://openalex.org/keywords/weibull-distribution","display_name":"Weibull distribution","score":0.25098931789398193},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24022725224494934},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.24008682370185852},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.159138023853302},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11562192440032959},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.09913372993469238}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7289465665817261},{"id":"https://openalex.org/C137668524","wikidata":"https://www.wikidata.org/wiki/Q189813","display_name":"Censoring (clinical trials)","level":2,"score":0.7210184335708618},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6840470433235168},{"id":"https://openalex.org/C9357733","wikidata":"https://www.wikidata.org/wiki/Q6878417","display_name":"Missing data","level":2,"score":0.6655216217041016},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.6644010543823242},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.5947126150131226},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.584558367729187},{"id":"https://openalex.org/C49781872","wikidata":"https://www.wikidata.org/wiki/Q1045555","display_name":"Maximum likelihood","level":2,"score":0.5322359204292297},{"id":"https://openalex.org/C158379689","wikidata":"https://www.wikidata.org/wiki/Q3533504","display_name":"Accelerated life testing","level":3,"score":0.4653283953666687},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.3998482823371887},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3294532597064972},{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.25098931789398193},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24022725224494934},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.24008682370185852},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.159138023853302},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11562192440032959},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.09913372993469238},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2018.2832022","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2018.2832022","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8497098770","display_name":null,"funder_award_id":"CMMI-1404276","funder_id":"https://openalex.org/F4320335353","funder_display_name":"National Science Foundation of Sri Lanka"}],"funders":[{"id":"https://openalex.org/F4320309272","display_name":"Wayne State University","ror":"https://ror.org/01070mq45"},{"id":"https://openalex.org/F4320335353","display_name":"National Science Foundation of Sri Lanka","ror":"https://ror.org/010xaa060"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W117773111","https://openalex.org/W1423377715","https://openalex.org/W1524004264","https://openalex.org/W1548340427","https://openalex.org/W1907420209","https://openalex.org/W1968781527","https://openalex.org/W1969150846","https://openalex.org/W1982077216","https://openalex.org/W1989349427","https://openalex.org/W1994672023","https://openalex.org/W2009641913","https://openalex.org/W2010380019","https://openalex.org/W2015597353","https://openalex.org/W2015948720","https://openalex.org/W2017703656","https://openalex.org/W2021746604","https://openalex.org/W2028429555","https://openalex.org/W2036077279","https://openalex.org/W2055873761","https://openalex.org/W2060965436","https://openalex.org/W2067266460","https://openalex.org/W2076836388","https://openalex.org/W2087235954","https://openalex.org/W2092555596","https://openalex.org/W2094477489","https://openalex.org/W2103590861","https://openalex.org/W2107305576","https://openalex.org/W2116739230","https://openalex.org/W2125291718","https://openalex.org/W2126445794","https://openalex.org/W2130079087","https://openalex.org/W2146746218","https://openalex.org/W2156238897","https://openalex.org/W2209190522","https://openalex.org/W2477135716","https://openalex.org/W2529869754","https://openalex.org/W2551300962","https://openalex.org/W2557827229","https://openalex.org/W2606406444","https://openalex.org/W2612576158","https://openalex.org/W2621193011","https://openalex.org/W4234462378","https://openalex.org/W4251911815","https://openalex.org/W4253112101"],"related_works":["https://openalex.org/W2352398645","https://openalex.org/W4390736826","https://openalex.org/W4281786091","https://openalex.org/W2591193890","https://openalex.org/W2548637173","https://openalex.org/W2958724840","https://openalex.org/W3135412282","https://openalex.org/W2085667044","https://openalex.org/W2912548622","https://openalex.org/W2100951127"],"abstract_inverted_index":{"Reliability":[0],"analysis":[1,93],"of":[2,54,176],"repairable":[3,64,129],"systems":[4,65,130,152],"has":[5],"been":[6],"widely":[7],"conducted":[8,188],"based":[9],"on":[10,58,170],"collected":[11],"information":[12],"such":[13],"as":[14,84],"the":[15,24,48,70,79,96,110,166,171,177,191],"systems'":[16],"failure":[17,25,35,60,100,133,155],"counting":[18,26],"processes.":[19],"In":[20,47,116],"many":[21,86],"real-life":[22,184],"situations,":[23,88],"processes":[27],"may":[28],"not":[29,38],"be":[30],"completely":[31],"observed":[32,97],"when":[33],"some":[34],"times":[36,101,179],"are":[37,102,187],"recorded":[39],"or":[40,76],"missing":[41,59,178],"due":[42],"to":[43,119,154,164,189],"various":[44],"practical":[45],"reasons.":[46],"literature,":[49],"only":[50],"a":[51,106,125,147],"limited":[52],"number":[53],"reliability":[55,92,126],"studies":[56,186],"focus":[57],"time":[61,111,134],"data":[62,135],"for":[63,91,128,144],"with":[66,131],"an":[67],"assumption":[68],"that":[69,95],"system":[71,149],"repair":[72,80],"is":[73,82,142,162,180],"either":[74],"perfect":[75],"minimal.":[77],"When":[78],"effect":[81],"general":[83,137],"in":[85,94,105],"real-world":[87],"challenges":[89],"arise":[90],"and":[98,109,150,183],"unobserved":[99],"statistically":[103],"dependent":[104],"complex":[107],"manner,":[108],"censoring":[112],"problem":[113],"becomes":[114],"unconventional.":[115],"this":[117],"paper,":[118],"overcome":[120],"these":[121],"challenges,":[122],"we":[123],"propose":[124],"model":[127,141,167],"incomplete":[132],"under":[136],"repair.":[138],"The":[139],"proposed":[140,172],"suitable":[143],"modeling":[145],"both":[146],"single":[148],"multiple":[151],"subject":[153],"heterogeneity.":[156],"A":[157],"maximum":[158],"likelihood":[159],"estimation":[160],"method":[161],"developed":[163,192],"estimate":[165],"parameters.":[168],"Based":[169],"model,":[173],"statistical":[174],"inference":[175],"developed.":[181],"Simulation":[182],"case":[185],"verify":[190],"methods.":[193]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}