{"id":"https://openalex.org/W2804356433","doi":"https://doi.org/10.1109/tr.2018.2829081","title":"A Diameter-Constrained Approximation Algorithm of Multistate Two-Terminal Reliability","display_name":"A Diameter-Constrained Approximation Algorithm of Multistate Two-Terminal Reliability","publication_year":2018,"publication_date":"2018-05-23","ids":{"openalex":"https://openalex.org/W2804356433","doi":"https://doi.org/10.1109/tr.2018.2829081","mag":"2804356433"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2018.2829081","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2018.2829081","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004425960","display_name":"Zuyuan Zhang","orcid":"https://orcid.org/0000-0001-5795-9771"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Zuyuan Zhang","raw_affiliation_strings":["School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ, USA"],"raw_orcid":"https://orcid.org/0000-0001-5795-9771","affiliations":[{"raw_affiliation_string":"School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101784781","display_name":"Fangming Shao","orcid":"https://orcid.org/0000-0002-1196-6324"},"institutions":[{"id":"https://openalex.org/I143593769","display_name":"East China University of Science and Technology","ror":"https://ror.org/01vyrm377","country_code":"CN","type":"education","lineage":["https://openalex.org/I143593769"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fangming Shao","raw_affiliation_strings":["School of Sciences, East China University of Science and Technology, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-1196-6324","affiliations":[{"raw_affiliation_string":"School of Sciences, East China University of Science and Technology, Shanghai, China","institution_ids":["https://openalex.org/I143593769"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5004425960"],"corresponding_institution_ids":["https://openalex.org/I55732556"],"apc_list":null,"apc_paid":null,"fwci":2.3599,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.86906497,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"67","issue":"3","first_page":"1249","last_page":"1260"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6943641901016235},{"id":"https://openalex.org/keywords/constraint","display_name":"Constraint (computer-aided design)","score":0.6044718623161316},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5492798686027527},{"id":"https://openalex.org/keywords/terminal","display_name":"Terminal (telecommunication)","score":0.5488664507865906},{"id":"https://openalex.org/keywords/approximation-algorithm","display_name":"Approximation algorithm","score":0.5331892967224121},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5194941759109497},{"id":"https://openalex.org/keywords/flow-network","display_name":"Flow network","score":0.5125727653503418},{"id":"https://openalex.org/keywords/maximum-flow-problem","display_name":"Maximum flow problem","score":0.48329928517341614},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.4778963327407837},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.4611082673072815},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.45155537128448486},{"id":"https://openalex.org/keywords/directed-acyclic-graph","display_name":"Directed acyclic graph","score":0.42403554916381836},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3398481607437134},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11000660061836243},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.08191835880279541},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.07260105013847351}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6943641901016235},{"id":"https://openalex.org/C2776036281","wikidata":"https://www.wikidata.org/wiki/Q48769818","display_name":"Constraint (computer-aided design)","level":2,"score":0.6044718623161316},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5492798686027527},{"id":"https://openalex.org/C2779664074","wikidata":"https://www.wikidata.org/wiki/Q3518405","display_name":"Terminal (telecommunication)","level":2,"score":0.5488664507865906},{"id":"https://openalex.org/C148764684","wikidata":"https://www.wikidata.org/wiki/Q621751","display_name":"Approximation algorithm","level":2,"score":0.5331892967224121},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5194941759109497},{"id":"https://openalex.org/C114809511","wikidata":"https://www.wikidata.org/wiki/Q1412924","display_name":"Flow network","level":2,"score":0.5125727653503418},{"id":"https://openalex.org/C157469704","wikidata":"https://www.wikidata.org/wiki/Q2585642","display_name":"Maximum flow problem","level":2,"score":0.48329928517341614},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.4778963327407837},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.4611082673072815},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.45155537128448486},{"id":"https://openalex.org/C74197172","wikidata":"https://www.wikidata.org/wiki/Q1195339","display_name":"Directed acyclic graph","level":2,"score":0.42403554916381836},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3398481607437134},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11000660061836243},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.08191835880279541},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07260105013847351},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2018.2829081","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2018.2829081","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W792146970","https://openalex.org/W1493227459","https://openalex.org/W1550064664","https://openalex.org/W1769918925","https://openalex.org/W1968780791","https://openalex.org/W1971863084","https://openalex.org/W1982620287","https://openalex.org/W1985342141","https://openalex.org/W1993210728","https://openalex.org/W2000126734","https://openalex.org/W2008750370","https://openalex.org/W2010893759","https://openalex.org/W2014677841","https://openalex.org/W2033004949","https://openalex.org/W2064123903","https://openalex.org/W2076716761","https://openalex.org/W2079195483","https://openalex.org/W2080875657","https://openalex.org/W2083592025","https://openalex.org/W2090039005","https://openalex.org/W2093357058","https://openalex.org/W2102375886","https://openalex.org/W2105503739","https://openalex.org/W2109998235","https://openalex.org/W2118382442","https://openalex.org/W2132118327","https://openalex.org/W2163067248","https://openalex.org/W2169528473","https://openalex.org/W2418160670","https://openalex.org/W2487237297","https://openalex.org/W2496413842","https://openalex.org/W2508705241","https://openalex.org/W2611246976","https://openalex.org/W2616764743","https://openalex.org/W2735045397","https://openalex.org/W6629441125"],"related_works":["https://openalex.org/W2375873432","https://openalex.org/W4206915070","https://openalex.org/W2531764854","https://openalex.org/W3161514703","https://openalex.org/W2141299097","https://openalex.org/W1851375266","https://openalex.org/W2610002854","https://openalex.org/W3141113327","https://openalex.org/W4206407367","https://openalex.org/W3035974271"],"abstract_inverted_index":{"Multistate":[0],"two-terminal":[1,102],"reliability":[2,61,89,103,138],"is":[3,24,34,46,57,142],"the":[4,15,19,41,60,83,88,97,108,129,135,137,149,156,161],"probability":[5],"that":[6,82],"d":[7],"units":[8],"of":[9,43,62,85,100,107,131,151,160],"flow":[10,29,64,73],"can":[11],"be":[12],"transmitted":[13],"from":[14],"source":[16],"nodes":[17],"to":[18,87,118,146],"sink":[20],"node":[21],"t.":[22],"It":[23],"an":[25,54,76,124],"important":[26],"index":[27],"fora":[28],"network,":[30],"and":[31,80,115,122,158],"its":[32],"value":[33,130],"based":[35],"on":[36],"minpaths":[37,45,86],"or":[38],"mincuts.":[39],"However,":[40],"enumeration":[42],"all":[44],"not":[47],"feasible":[48],"in":[49],"large":[50],"networks.":[51,65],"Hence,":[52],"designing":[53],"approximation":[55,98,125],"algorithm":[56,126],"valuable":[58],"for":[59],"multistate":[63,72,101],"In":[66,134],"this":[67],"paper,":[68],"we":[69,95,111],"model":[70],"a":[71,113,144],"network":[74],"as":[75],"acyclic":[77],"directed":[78],"graph":[79],"find":[81],"contribution":[84],"changes":[90],"with":[91,139],"their":[92],"lengths,":[93],"so":[94],"consider":[96],"solution":[99],"by":[104,127],"constraining":[105],"diameter":[106,132,140],"network.":[109,152],"Furthermore,":[110],"give":[112],"sufficient":[114],"necessary":[116],"condition":[117],"detect":[119],"irrelevant":[120],"arcs":[121],"propose":[123],"controlling":[128],"constraint.":[133],"meantime,":[136],"constraint":[141],"also":[143],"parameter":[145],"partially":[147],"reflect":[148],"performance":[150],"The":[153],"experiments":[154],"demonstrate":[155],"effectiveness":[157],"efficiency":[159],"algorithm.":[162]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}