{"id":"https://openalex.org/W2792505784","doi":"https://doi.org/10.1109/tr.2018.2801474","title":"On Reliability Analysis of <inline-formula> <tex-math notation=\"LaTeX\">$k$</tex-math> </inline-formula> -Out-of-<inline-formula> <tex-math notation=\"LaTeX\">$n$</tex-math> </inline-formula>:<inline-formula> <tex-math notation=\"LaTeX\">$F$</tex-math> </inline-formula> Systems Equipped With a Single Cold Standby Component Under Degradation Performance","display_name":"On Reliability Analysis of <inline-formula> <tex-math notation=\"LaTeX\">$k$</tex-math> </inline-formula> -Out-of-<inline-formula> <tex-math notation=\"LaTeX\">$n$</tex-math> </inline-formula>:<inline-formula> <tex-math notation=\"LaTeX\">$F$</tex-math> </inline-formula> Systems Equipped With a Single Cold Standby Component Under Degradation Performance","publication_year":2018,"publication_date":"2018-03-19","ids":{"openalex":"https://openalex.org/W2792505784","doi":"https://doi.org/10.1109/tr.2018.2801474","mag":"2792505784"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2018.2801474","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2018.2801474","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040273709","display_name":"Ensiyeh Nezakati","orcid":"https://orcid.org/0000-0001-6383-3569"},"institutions":[{"id":"https://openalex.org/I86958956","display_name":"Ferdowsi University of Mashhad","ror":"https://ror.org/00g6ka752","country_code":"IR","type":"education","lineage":["https://openalex.org/I86958956"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Ensiyeh Nezakati","raw_affiliation_strings":["Department of Statistics, Ferdowsi University of Mashhad, Mashhad, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Statistics, Ferdowsi University of Mashhad, Mashhad, Iran","institution_ids":["https://openalex.org/I86958956"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058633122","display_name":"Mostafa Razmkhah","orcid":"https://orcid.org/0000-0002-6661-2822"},"institutions":[{"id":"https://openalex.org/I86958956","display_name":"Ferdowsi University of Mashhad","ror":"https://ror.org/00g6ka752","country_code":"IR","type":"education","lineage":["https://openalex.org/I86958956"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Mostafa Razmkhah","raw_affiliation_strings":["Department of Statistics, Ferdowsi University of Mashhad, Mashhad, Iran"],"raw_orcid":"https://orcid.org/0000-0002-6661-2822","affiliations":[{"raw_affiliation_string":"Department of Statistics, Ferdowsi University of Mashhad, Mashhad, Iran","institution_ids":["https://openalex.org/I86958956"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5040273709"],"corresponding_institution_ids":["https://openalex.org/I86958956"],"apc_list":null,"apc_paid":null,"fwci":1.8355,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.83562169,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"67","issue":"2","first_page":"678","last_page":"687"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9850000143051147,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/estimator","display_name":"Estimator","score":0.707761287689209},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6864336729049683},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.6542870998382568},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.5438007712364197},{"id":"https://openalex.org/keywords/confidence-interval","display_name":"Confidence interval","score":0.4846844971179962},{"id":"https://openalex.org/keywords/applied-mathematics","display_name":"Applied mathematics","score":0.4410057067871094},{"id":"https://openalex.org/keywords/interval","display_name":"Interval (graph theory)","score":0.432227224111557},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.42681312561035156},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3925037384033203},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.37019583582878113},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.2648850381374359},{"id":"https://openalex.org/keywords/combinatorics","display_name":"Combinatorics","score":0.1941458284854889},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1266160011291504},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.07678177952766418},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.06352370977401733}],"concepts":[{"id":"https://openalex.org/C185429906","wikidata":"https://www.wikidata.org/wiki/Q1130160","display_name":"Estimator","level":2,"score":0.707761287689209},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6864336729049683},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.6542870998382568},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.5438007712364197},{"id":"https://openalex.org/C44249647","wikidata":"https://www.wikidata.org/wiki/Q208498","display_name":"Confidence interval","level":2,"score":0.4846844971179962},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.4410057067871094},{"id":"https://openalex.org/C2778067643","wikidata":"https://www.wikidata.org/wiki/Q166507","display_name":"Interval (graph theory)","level":2,"score":0.432227224111557},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.42681312561035156},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3925037384033203},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.37019583582878113},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.2648850381374359},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.1941458284854889},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1266160011291504},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.07678177952766418},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.06352370977401733},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2018.2801474","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2018.2801474","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321722","display_name":"Ferdowsi University of Mashhad","ror":"https://ror.org/00g6ka752"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W176292746","https://openalex.org/W961491129","https://openalex.org/W1480614548","https://openalex.org/W1490229695","https://openalex.org/W1542919909","https://openalex.org/W1586421637","https://openalex.org/W1783042937","https://openalex.org/W1837985488","https://openalex.org/W1907420209","https://openalex.org/W1964043198","https://openalex.org/W1977551002","https://openalex.org/W1995723008","https://openalex.org/W2004061654","https://openalex.org/W2008825253","https://openalex.org/W2028994726","https://openalex.org/W2043129860","https://openalex.org/W2044611694","https://openalex.org/W2066322331","https://openalex.org/W2073614095","https://openalex.org/W2073855294","https://openalex.org/W2090749763","https://openalex.org/W2091162106","https://openalex.org/W2121230460","https://openalex.org/W2138375970","https://openalex.org/W2147920417","https://openalex.org/W2181238135","https://openalex.org/W2227583147","https://openalex.org/W4239218596","https://openalex.org/W4240458502","https://openalex.org/W6689176940"],"related_works":["https://openalex.org/W4287880334","https://openalex.org/W4366700029","https://openalex.org/W4285230481","https://openalex.org/W4385769873","https://openalex.org/W2015759683","https://openalex.org/W4281634296","https://openalex.org/W4319161863","https://openalex.org/W2371687270","https://openalex.org/W4307819175","https://openalex.org/W4311888330"],"abstract_inverted_index":{"A":[0,30],"k-out-of-n:F":[1],"system":[2,55,71],"is":[3,8,23,33,52],"considered,":[4],"and":[5,27,39,42,49,61],"its":[6],"reliability":[7,28,68],"studied":[9,53],"under":[10],"degradation":[11,36,82],"performance.":[12],"The":[13,57],"effect":[14,44],"of":[15,18,37,45,69],"the":[16,43,47,63,70,75],"presence":[17],"a":[19,80],"cold":[20],"standby":[21,40],"component":[22],"investigated":[24],"on":[25,54],"likelihood":[26,59],"functions.":[29],"Gamma":[31],"process":[32],"assumed":[34],"for":[35,67],"active":[38],"components,":[41],"varying":[46],"shape":[48],"scale":[50],"parameters":[51],"reliability.":[56],"maximum":[58],"estimator":[60],"also":[62],"asymptotic":[64],"confidence":[65],"interval":[66],"are":[72,77],"investigated.":[73],"Finally,":[74],"results":[76],"illustrated":[78],"via":[79],"real":[81],"dataset.":[83]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":5},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2018-03-29T00:00:00"}