{"id":"https://openalex.org/W2780014678","doi":"https://doi.org/10.1109/tr.2017.2779322","title":"Evaluation of Reliability Function and Mean Residual Life for Degrading Systems Subject to Condition Monitoring and Random Failure","display_name":"Evaluation of Reliability Function and Mean Residual Life for Degrading Systems Subject to Condition Monitoring and Random Failure","publication_year":2017,"publication_date":"2017-12-25","ids":{"openalex":"https://openalex.org/W2780014678","doi":"https://doi.org/10.1109/tr.2017.2779322","mag":"2780014678"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2017.2779322","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2017.2779322","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060017621","display_name":"Shuai Zhao","orcid":"https://orcid.org/0000-0001-7441-5434"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]},{"id":"https://openalex.org/I185261750","display_name":"University of Toronto","ror":"https://ror.org/03dbr7087","country_code":"CA","type":"education","lineage":["https://openalex.org/I185261750"]}],"countries":["CA","CN"],"is_corresponding":true,"raw_author_name":"Shuai Zhao","raw_affiliation_strings":["Department of Mechanical and Industrial Engineering, University of Toronto, Toronto, Canada","School of Electronics and Information, Northwestern Polytechnical University, Xi\u2019an, China","Department of Mechanical and Industrial Engineering, University of Toronto, Toronto, Canada; School of Electronics and Information, Northwestern Polytechnical University, Xi\u2019an, China"],"raw_orcid":"https://orcid.org/0000-0001-7441-5434","affiliations":[{"raw_affiliation_string":"Department of Mechanical and Industrial Engineering, University of Toronto, Toronto, Canada","institution_ids":["https://openalex.org/I185261750"]},{"raw_affiliation_string":"School of Electronics and Information, Northwestern Polytechnical University, Xi\u2019an, China","institution_ids":["https://openalex.org/I17145004"]},{"raw_affiliation_string":"Department of Mechanical and Industrial Engineering, University of Toronto, Toronto, Canada; School of Electronics and Information, Northwestern Polytechnical University, Xi\u2019an, China","institution_ids":["https://openalex.org/I17145004","https://openalex.org/I185261750"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051675164","display_name":"Viliam Maki\u0161","orcid":"https://orcid.org/0000-0003-2892-6262"},"institutions":[{"id":"https://openalex.org/I185261750","display_name":"University of Toronto","ror":"https://ror.org/03dbr7087","country_code":"CA","type":"education","lineage":["https://openalex.org/I185261750"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Viliam Makis","raw_affiliation_strings":["Department of Mechanical and Industrial Engineering, University of Toronto, Toronto, Canada","Dept. of Mechanical & Industrial Engineering, University of Toronto, Toronto, Canada#TAB#"],"raw_orcid":"https://orcid.org/0000-0003-2892-6262","affiliations":[{"raw_affiliation_string":"Department of Mechanical and Industrial Engineering, University of Toronto, Toronto, Canada","institution_ids":["https://openalex.org/I185261750"]},{"raw_affiliation_string":"Dept. of Mechanical & Industrial Engineering, University of Toronto, Toronto, Canada#TAB#","institution_ids":["https://openalex.org/I185261750"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100604751","display_name":"Shaowei Chen","orcid":"https://orcid.org/0000-0002-6993-2987"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shaowei Chen","raw_affiliation_strings":["School of Electronics and Information, Northwestern Polytechnical University, Xi\u2019an, China","[School of Electronics and Information Northwestern Polytechnical University Xi'an, China]"],"raw_orcid":"https://orcid.org/0000-0002-6993-2987","affiliations":[{"raw_affiliation_string":"School of Electronics and Information, Northwestern Polytechnical University, Xi\u2019an, China","institution_ids":["https://openalex.org/I17145004"]},{"raw_affiliation_string":"[School of Electronics and Information Northwestern Polytechnical University Xi'an, China]","institution_ids":["https://openalex.org/I17145004"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100717118","display_name":"Yong Li","orcid":"https://orcid.org/0000-0003-0285-3069"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yong Li","raw_affiliation_strings":["School of Electronics and Information, Northwestern Polytechnical University, Xi\u2019an, China","[School of Electronics and Information Northwestern Polytechnical University Xi'an, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Information, Northwestern Polytechnical University, Xi\u2019an, China","institution_ids":["https://openalex.org/I17145004"]},{"raw_affiliation_string":"[School of Electronics and Information Northwestern Polytechnical University Xi'an, China]","institution_ids":["https://openalex.org/I17145004"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5060017621"],"corresponding_institution_ids":["https://openalex.org/I17145004","https://openalex.org/I185261750"],"apc_list":null,"apc_paid":null,"fwci":7.5723,"has_fulltext":false,"cited_by_count":49,"citation_normalized_percentile":{"value":0.97510947,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"67","issue":"1","first_page":"13","last_page":"25"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6795068979263306},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.6299977898597717},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5648233890533447},{"id":"https://openalex.org/keywords/markov-process","display_name":"Markov process","score":0.5296247601509094},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.5128074288368225},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47474604845046997},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.4743068218231201},{"id":"https://openalex.org/keywords/stochastic-process","display_name":"Stochastic process","score":0.4414747655391693},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.41663509607315063},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.41607749462127686},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.34071865677833557},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.3355594277381897},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3258175253868103},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25072231888771057},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.23875311017036438}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6795068979263306},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.6299977898597717},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5648233890533447},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.5296247601509094},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.5128074288368225},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47474604845046997},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.4743068218231201},{"id":"https://openalex.org/C8272713","wikidata":"https://www.wikidata.org/wiki/Q176737","display_name":"Stochastic process","level":2,"score":0.4414747655391693},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.41663509607315063},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.41607749462127686},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.34071865677833557},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.3355594277381897},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3258175253868103},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25072231888771057},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.23875311017036438},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2017.2779322","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2017.2779322","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4103400252","display_name":null,"funder_award_id":"RGPIN 121384-11","funder_id":"https://openalex.org/F4320334593","funder_display_name":"Natural Sciences and Engineering Research Council of Canada"},{"id":"https://openalex.org/G8150517577","display_name":null,"funder_award_id":"20155553039","funder_id":"https://openalex.org/F4320322857","funder_display_name":"Aeronautical Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320322725","display_name":"China Scholarship Council","ror":"https://ror.org/04atp4p48"},{"id":"https://openalex.org/F4320322857","display_name":"Aeronautical Science Foundation of China","ror":"https://ror.org/02wq41p38"},{"id":"https://openalex.org/F4320334593","display_name":"Natural Sciences and Engineering Research Council of Canada","ror":"https://ror.org/01h531d29"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1556221693","https://openalex.org/W1580788756","https://openalex.org/W1964168151","https://openalex.org/W1966747607","https://openalex.org/W1967372803","https://openalex.org/W1969180310","https://openalex.org/W1993220529","https://openalex.org/W2012369294","https://openalex.org/W2045186954","https://openalex.org/W2055873761","https://openalex.org/W2056821499","https://openalex.org/W2061659083","https://openalex.org/W2086471648","https://openalex.org/W2088378662","https://openalex.org/W2106687296","https://openalex.org/W2107605812","https://openalex.org/W2107951460","https://openalex.org/W2123795621","https://openalex.org/W2126371856","https://openalex.org/W2133749571","https://openalex.org/W2201689600","https://openalex.org/W2399793648","https://openalex.org/W2407278551","https://openalex.org/W2613107311","https://openalex.org/W2657416937","https://openalex.org/W2734888906","https://openalex.org/W2735432884","https://openalex.org/W2996059456","https://openalex.org/W3147894994","https://openalex.org/W4299370734"],"related_works":["https://openalex.org/W2355087198","https://openalex.org/W1567439243","https://openalex.org/W2042729523","https://openalex.org/W1993731165","https://openalex.org/W2074277294","https://openalex.org/W2417472025","https://openalex.org/W1989738468","https://openalex.org/W2146720862","https://openalex.org/W2138734817","https://openalex.org/W2095860056"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,40,54,81,97,162],"new":[4],"general":[5,98,172,192],"method":[6,72,89,158],"for":[7,80,110,145],"evaluating":[8],"the":[9,13,28,31,35,49,60,64,70,87,94,104,119,139,147,154,157,168,175,190],"reliability":[10,112,136],"function":[11],"and":[12,24,131,153,165],"mean":[14],"residual":[15],"life":[16],"of":[17,34,63,84,92,100,118,138,156],"degrading":[18],"systems":[19],"subject":[20,141],"to":[21,58,66,133,142,182,188],"condition":[22,143],"monitoring":[23,144],"random":[25],"failure.":[26,68],"In":[27],"proposed":[29,88,125],"method,":[30],"degradation":[32,85,101,176],"process":[33,57],"system":[36,67,140],"is":[37,45,77,90,128,185],"characterized":[38],"by":[39,161],"continuous-time":[41],"Markov":[42],"chain,":[43],"which":[44,76],"then":[46],"incorporated":[47],"into":[48],"proportional":[50],"hazards":[51],"model":[52],"as":[53],"stochastic":[55],"covariate":[56],"describe":[59],"hazard":[61],"rate":[62],"time":[65],"Unlike":[69],"conventional":[71,169],"based":[73],"on":[74],"conditioning,":[75],"applicable":[78],"only":[79],"small":[82],"number":[83,99],"states,":[86],"capable":[91],"tackling":[93],"case":[95,173],"with":[96,167],"states.":[102],"Using":[103],"developed":[105],"approximation":[106],"techniques,":[107],"closed-form":[108],"formulas":[109],"related":[111],"characteristics":[113],"are":[114,159],"obtained":[115],"in":[116],"terms":[117],"appropriate":[120],"transition":[121],"probability":[122],"matrix.":[123],"The":[124,151],"evaluation":[126],"algorithm":[127],"computationally":[129],"efficient":[130],"embeddable":[132],"support":[134],"real-time":[135],"assessment":[137],"developing":[146],"optimal":[148],"maintenance":[149],"policy.":[150],"effectiveness":[152],"accuracy":[155],"validated":[160],"numerical":[163],"study":[164],"compared":[166],"method.":[170],"A":[171],"where":[174],"path":[177],"can":[178],"be":[179],"discretized":[180],"up":[181],"ten":[183],"states":[184],"also":[186],"studied":[187],"illustrate":[189],"appealing":[191],"features.":[193]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":14},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":5}],"updated_date":"2026-05-12T08:28:47.272897","created_date":"2025-10-10T00:00:00"}