{"id":"https://openalex.org/W2769582913","doi":"https://doi.org/10.1109/tr.2017.2765484","title":"The Impact of Soft Error Event Topography on the Reliability of Computer Memories","display_name":"The Impact of Soft Error Event Topography on the Reliability of Computer Memories","publication_year":2017,"publication_date":"2017-11-16","ids":{"openalex":"https://openalex.org/W2769582913","doi":"https://doi.org/10.1109/tr.2017.2765484","mag":"2769582913"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2017.2765484","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2017.2765484","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039169003","display_name":"Christopher Ogden","orcid":null},"institutions":[{"id":"https://openalex.org/I103163165","display_name":"Florida State University","ror":"https://ror.org/05g3dte14","country_code":"US","type":"education","lineage":["https://openalex.org/I103163165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Christopher Ogden","raw_affiliation_strings":["Department of Computer Science, Florida State University, Tallahassee, FL, USA"],"raw_orcid":"https://orcid.org/0000-0003-3186-3629","affiliations":[{"raw_affiliation_string":"Department of Computer Science, Florida State University, Tallahassee, FL, USA","institution_ids":["https://openalex.org/I103163165"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071387306","display_name":"Michael Mascagni","orcid":"https://orcid.org/0000-0003-3058-4580"},"institutions":[{"id":"https://openalex.org/I103163165","display_name":"Florida State University","ror":"https://ror.org/05g3dte14","country_code":"US","type":"education","lineage":["https://openalex.org/I103163165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael Mascagni","raw_affiliation_strings":["Department of Computer Science at FSU, Florida State University, Tallahassee, FL, USA"],"raw_orcid":"https://orcid.org/0000-0003-3058-4580","affiliations":[{"raw_affiliation_string":"Department of Computer Science at FSU, Florida State University, Tallahassee, FL, USA","institution_ids":["https://openalex.org/I103163165"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8771,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.76899348,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"66","issue":"4","first_page":"966","last_page":"979"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.8017585277557373},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6987098455429077},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6957762241363525},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.6937098503112793},{"id":"https://openalex.org/keywords/weibull-distribution","display_name":"Weibull distribution","score":0.6872976422309875},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.685637891292572},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6074401140213013},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.44630545377731323},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.4252665042877197},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.413576602935791},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20742911100387573},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.1952478587627411},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.16033583879470825},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.0904296338558197},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.08789166808128357}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.8017585277557373},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6987098455429077},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6957762241363525},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.6937098503112793},{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.6872976422309875},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.685637891292572},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6074401140213013},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.44630545377731323},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.4252665042877197},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.413576602935791},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20742911100387573},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.1952478587627411},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.16033583879470825},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0904296338558197},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.08789166808128357},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2017.2765484","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2017.2765484","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.49000000953674316,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W413878220","https://openalex.org/W1608692246","https://openalex.org/W1986722376","https://openalex.org/W2032096459","https://openalex.org/W2104886115","https://openalex.org/W2138815251","https://openalex.org/W2149288978","https://openalex.org/W2150182783","https://openalex.org/W2151529344","https://openalex.org/W2154784930","https://openalex.org/W2156941526","https://openalex.org/W2534897901","https://openalex.org/W2548582980","https://openalex.org/W4236024374"],"related_works":["https://openalex.org/W4290647047","https://openalex.org/W2622269177","https://openalex.org/W2612366884","https://openalex.org/W2363504003","https://openalex.org/W2066033226","https://openalex.org/W1523508240","https://openalex.org/W2548582980","https://openalex.org/W2065552285","https://openalex.org/W1500230652","https://openalex.org/W3208260600"],"abstract_inverted_index":{"The":[0,57,119,194,250,297,345],"frequency,":[1],"nature,":[2],"and":[3,103,150,173,207,215,226,292,305,361,364,387],"scope":[4],"of":[5,31,64,77,84,95,110,113,136,202,211,221,245,259,272,283,355,367,375,389],"Soft":[6,123,162],"Error":[7,124,163],"Events":[8],"(SEEs)":[9],"is":[10],"becoming":[11],"an":[12,246],"increasingly":[13],"significant":[14,44,380],"reliability":[15,109,178,227,271,362,388],"concern":[16],"as":[17,99,101,132,218],"transistors":[18],"continuously":[19],"scale":[20],"down":[21],"into":[22],"ever":[23],"smaller":[24],"nanometer":[25],"memory":[26,188,234,343,393],"chip":[27],"geometries.":[28],"As":[29],"part":[30],"the":[32,50,62,75,108,153,157,213,216,238,243,257,270,280,302,306,316,321,325,329,340,356,365,368,373,383],"on-going":[33],"research":[34,45,51,59,252],"efforts":[35],"required":[36],"to":[37,74,92,152,237,255,312],"address":[38],"this":[39,55,130,137,348],"steadily":[40],"developing":[41],"situation,":[42],"two":[43,326,357],"questions":[46],"were":[47,145,309],"addressed":[48,61],"by":[49,156,200,208,285,324],"work":[52,346],"presented":[53],"within":[54,129,347],"paper.":[56],"first":[58],"question":[60,253],"possibility":[63],"crafting":[65],"a":[66,111,133,183,191,203,219,263,379],"novel":[67,138],"methodology":[68,139],"whose":[69],"application":[70,135],"would":[71,90],"consistently":[72],"lead":[73],"creation":[76],"viable":[78],"Monte":[79,86],"Carlo":[80,87],"SEE":[81,88,240,260,338],"Simulators.":[82],"Each":[83],"these":[85],"Simulators":[89],"need":[91],"be":[93],"capable":[94],"adequately":[96],"profiling":[97],"SEEs":[98,284,376],"well":[100],"simulating":[102],"modeling":[104],"their":[105,222],"impacts":[106,241,282],"on":[107,229,269,382],"variety":[112],"simulated":[114,232,273,341],"45-nm":[115,185,230,274,390],"SRAM":[116,186,231,275,391],"computer":[117,187,233,276,342,392],"memories.":[118],"Standard":[120],"2-Parameter":[121],"Weibull":[122,160],"Event":[125],"(S2P-WSE)":[126],"Simulator":[127,196,304,308],"proposed":[128],"paper":[131,349],"direct":[134,209,353],"successfully":[140,350],"produced":[141],"simulation":[142,248,298],"results":[143,154,228,322,363,366],"that":[144,314,372],"comparatively":[146],"equivalent":[147],"both":[148,212,301],"directly":[149],"statistically":[151],"calculated":[155],"empirically":[158,174],"validated":[159,175,199],"Row-Clustered":[161],"Reliability":[164],"(WRCSER)":[165],"model.":[166],"This":[167],"WRCSER":[168],"Model":[169],"was":[170,198,328],"independently":[171],"developed":[172],"against":[176],"proprietary":[177],"datasets":[179],"obtained":[180],"from":[181,279],"testing":[182],"CISCO":[184],"device":[189],"in":[190],"laboratory":[192],"setting.":[193],"S2P-WSE":[195,303],"itself":[197],"means":[201],"Kruskal-Wallis":[204,369],"ANOVA":[205,370],"test":[206],"comparison":[210],"model":[214],"simulator":[217],"function":[220],"respective":[223],"failure":[224,359,385],"probability":[225,360,386],"devices":[235],"subjected":[236],"same":[239],"over":[242],"course":[244],"entire":[247],"run.":[249],"second":[251],"sought":[254],"determine":[256],"significance":[258],"topography":[261,374],"versus":[262],"Row-Depth-Only":[264],"bit":[265],"error":[266],"severity":[267],"assumption":[268],"memories":[277],"shielded":[278],"accumulating":[281],"variable":[286],"error-correction":[287],"codes,":[288],"row-depth":[289],"interleaving":[290],"distances,":[291],"periodic":[293],"scrubbing":[294],"time":[295],"intervals.":[296],"runs":[299],"for":[300,336],"T2P-WSE":[307,330],"carefully":[310],"setup":[311],"ensure":[313],"only":[315],"potentially":[317],"divergent":[318],"factor":[319],"between":[320],"generated":[323],"simulators":[327],"Simulator's":[331],"stochastically":[332],"estimated":[333],"topographical":[334],"shape":[335],"each":[337],"impacting":[339],"device.":[344],"demonstrated":[351],"through":[352],"plots":[354],"simulators'":[358],"tests":[371],"does":[377],"represent":[378],"impact":[381],"overall":[384],"devices.":[394]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}