{"id":"https://openalex.org/W2765637254","doi":"https://doi.org/10.1109/tr.2017.2761025","title":"Accelerated Degradation Tests Planning With Competing Failure Modes","display_name":"Accelerated Degradation Tests Planning With Competing Failure Modes","publication_year":2017,"publication_date":"2017-10-31","ids":{"openalex":"https://openalex.org/W2765637254","doi":"https://doi.org/10.1109/tr.2017.2761025","mag":"2765637254"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2017.2761025","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2017.2761025","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081162429","display_name":"Xiujie Zhao","orcid":"https://orcid.org/0000-0003-3450-5480"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":true,"raw_author_name":"Xiujie Zhao","raw_affiliation_strings":["Department of Systems Engineering and Engineering Management, City University of Hong Kong, Hong Kong"],"raw_orcid":"https://orcid.org/0000-0003-3450-5480","affiliations":[{"raw_affiliation_string":"Department of Systems Engineering and Engineering Management, City University of Hong Kong, Hong Kong","institution_ids":["https://openalex.org/I168719708"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101688363","display_name":"Jianyu Xu","orcid":"https://orcid.org/0000-0003-0976-5096"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]},{"id":"https://openalex.org/I4210105229","display_name":"City University of Hong Kong, Shenzhen Research Institute","ror":"https://ror.org/00xc0ma20","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210105229"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN","HK"],"is_corresponding":false,"raw_author_name":"Jianyu Xu","raw_affiliation_strings":["City University of Hong Kong, Shenzhen Research Institute, Shenzhen, China","University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-0976-5096","affiliations":[{"raw_affiliation_string":"City University of Hong Kong, Shenzhen Research Institute, Shenzhen, China","institution_ids":["https://openalex.org/I168719708","https://openalex.org/I4210105229"]},{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100395492","display_name":"Bin Liu","orcid":"https://orcid.org/0000-0002-3946-8124"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Bin Liu","raw_affiliation_strings":["Department of Systems Engineering and Engineering Management, City University of Hong Kong, Hong Kong"],"raw_orcid":"https://orcid.org/0000-0002-3946-8124","affiliations":[{"raw_affiliation_string":"Department of Systems Engineering and Engineering Management, City University of Hong Kong, Hong Kong","institution_ids":["https://openalex.org/I168719708"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5081162429"],"corresponding_institution_ids":["https://openalex.org/I168719708"],"apc_list":null,"apc_paid":null,"fwci":7.5759,"has_fulltext":false,"cited_by_count":44,"citation_normalized_percentile":{"value":0.97486314,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"67","issue":"1","first_page":"142","last_page":"155"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.5703617334365845},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5571738481521606},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5510467290878296},{"id":"https://openalex.org/keywords/equivalence","display_name":"Equivalence (formal languages)","score":0.5403324365615845},{"id":"https://openalex.org/keywords/wiener-process","display_name":"Wiener process","score":0.4630579650402069},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4602604806423187},{"id":"https://openalex.org/keywords/random-variable","display_name":"Random variable","score":0.45485758781433105},{"id":"https://openalex.org/keywords/test-plan","display_name":"Test plan","score":0.4485696852207184},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.43110862374305725},{"id":"https://openalex.org/keywords/stochastic-process","display_name":"Stochastic process","score":0.42960184812545776},{"id":"https://openalex.org/keywords/acceleration","display_name":"Acceleration","score":0.42653921246528625},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40828830003738403},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.34836235642433167},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3411480784416199},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.2861638069152832},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2160705029964447}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.5703617334365845},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5571738481521606},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5510467290878296},{"id":"https://openalex.org/C2780069185","wikidata":"https://www.wikidata.org/wiki/Q7977945","display_name":"Equivalence (formal languages)","level":2,"score":0.5403324365615845},{"id":"https://openalex.org/C60391097","wikidata":"https://www.wikidata.org/wiki/Q1056809","display_name":"Wiener process","level":2,"score":0.4630579650402069},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4602604806423187},{"id":"https://openalex.org/C122123141","wikidata":"https://www.wikidata.org/wiki/Q176623","display_name":"Random variable","level":2,"score":0.45485758781433105},{"id":"https://openalex.org/C12148698","wikidata":"https://www.wikidata.org/wiki/Q364651","display_name":"Test plan","level":3,"score":0.4485696852207184},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.43110862374305725},{"id":"https://openalex.org/C8272713","wikidata":"https://www.wikidata.org/wiki/Q176737","display_name":"Stochastic process","level":2,"score":0.42960184812545776},{"id":"https://openalex.org/C117896860","wikidata":"https://www.wikidata.org/wiki/Q11376","display_name":"Acceleration","level":2,"score":0.42653921246528625},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40828830003738403},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.34836235642433167},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3411480784416199},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2861638069152832},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2160705029964447},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C118615104","wikidata":"https://www.wikidata.org/wiki/Q121416","display_name":"Discrete mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tr.2017.2761025","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2017.2761025","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},{"id":"pmh:oai:strathprints.strath.ac.uk:66873","is_oa":false,"landing_page_url":"https://strathprints.strath.ac.uk/view/author/1214809.html>","pdf_url":null,"source":{"id":"https://openalex.org/S4306402226","display_name":"Strathprints: The University of Strathclyde institutional repository (University of Strathclyde)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I181647926","host_organization_name":"University of Strathclyde","host_organization_lineage":["https://openalex.org/I181647926"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Life in Land","score":0.5799999833106995,"id":"https://metadata.un.org/sdg/15"}],"awards":[{"id":"https://openalex.org/G391295929","display_name":null,"funder_award_id":"71532008","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W126918794","https://openalex.org/W1480614548","https://openalex.org/W1911248739","https://openalex.org/W1932372884","https://openalex.org/W1966750990","https://openalex.org/W1968175476","https://openalex.org/W1968656346","https://openalex.org/W1977650879","https://openalex.org/W1998406957","https://openalex.org/W2000730771","https://openalex.org/W2006266687","https://openalex.org/W2008825253","https://openalex.org/W2019925718","https://openalex.org/W2032606617","https://openalex.org/W2044430831","https://openalex.org/W2048310729","https://openalex.org/W2052304942","https://openalex.org/W2067266460","https://openalex.org/W2068829531","https://openalex.org/W2069719474","https://openalex.org/W2077464341","https://openalex.org/W2096731208","https://openalex.org/W2105849708","https://openalex.org/W2107139289","https://openalex.org/W2113143073","https://openalex.org/W2115913995","https://openalex.org/W2124898302","https://openalex.org/W2169170605","https://openalex.org/W2295843656","https://openalex.org/W2466195431","https://openalex.org/W2523713720","https://openalex.org/W2529983832","https://openalex.org/W2554877487","https://openalex.org/W2595738845","https://openalex.org/W2599868532","https://openalex.org/W2795854098","https://openalex.org/W2904339734","https://openalex.org/W4212767417","https://openalex.org/W4233921518","https://openalex.org/W4255498299","https://openalex.org/W6678503845"],"related_works":["https://openalex.org/W2366918244","https://openalex.org/W2905005544","https://openalex.org/W3130066450","https://openalex.org/W2150527492","https://openalex.org/W2077464341","https://openalex.org/W248085065","https://openalex.org/W4362503538","https://openalex.org/W2180914804","https://openalex.org/W2127279947","https://openalex.org/W2977026895"],"abstract_inverted_index":{"Accelerated":[0],"degradation":[1,26,49,75,82],"tests":[2],"(ADT)":[3],"have":[4],"been":[5],"widely":[6],"used":[7],"to":[8,58,102,117,136,171,184,215,225],"assess":[9],"the":[10,31,48,94,121,129,138,167,173,186,193,198,206,217,226],"reliability":[11,59],"of":[12,33,97,109,145,176,200,219],"products":[13,71],"with":[14,223],"long":[15],"lifetime.":[16],"For":[17],"many":[18],"products,":[19],"environmental":[20],"stress":[21,92],"not":[22],"only":[23],"accelerates":[24],"their":[25],"rate":[27],"but":[28],"also":[29],"elevates":[30],"probability":[32],"traumatic":[34,38],"shocks.":[35],"When":[36],"random":[37,78,98,201],"shocks":[39,99,202],"occur":[40],"during":[41],"an":[42,66],"ADT,":[43],"it":[44],"is":[45,84,100,182,212],"possible":[46],"that":[47,192],"measurements":[50],"cannot":[51],"be":[52,118],"taken":[53],"afterward,":[54],"which":[55],"brings":[56],"challenges":[57],"assessment.":[60],"In":[61],"this":[62],"paper,":[63],"we":[64],"propose":[65],"ADT":[67,139,158,177,195,208,221],"optimization":[68],"approach":[69],"for":[70,112],"suffering":[72],"from":[73,120,205],"both":[74,113],"failures":[76],"and":[77,134,148,155],"shock":[79],"failures.":[80],"The":[81,189],"path":[83],"modeled":[85],"by":[86,162],"a":[87,104,142,149],"Wiener":[88],"process.":[89,107],"Under":[90],"various":[91],"levels,":[93],"arrival":[95],"process":[96],"assumed":[101],"follow":[103],"nonhomogeneous":[105],"Poisson":[106],"Parameters":[108],"acceleration":[110],"models":[111],"failure":[114],"modes":[115],"need":[116],"estimated":[119],"ADT.":[122],"Three":[123],"common":[124],"optimality":[125,175],"criteria":[126],"based":[127],"on":[128],"Fisher":[130],"information":[131],"are":[132,160],"considered":[133],"compared":[135],"optimize":[137],"plan":[140],"under":[141],"given":[143],"number":[144],"test":[146,151],"units":[147],"predetermined":[150],"duration.":[152],"Optimal":[153],"two-":[154],"three-level":[156],"optimal":[157,194,220],"plans":[159,196,222],"obtained":[161],"numerical":[163,180],"methods.":[164,188],"We":[165],"use":[166],"general":[168],"equivalence":[169],"theorems":[170],"verify":[172],"global":[174],"plans.":[178,209],"A":[179],"example":[181],"presented":[183],"illustrate":[185],"proposed":[187],"result":[190],"shows":[191],"in":[197,228],"presence":[199],"differ":[203],"significantly":[204],"traditional":[207],"Sensitivity":[210],"analysis":[211],"carried":[213],"out":[214],"study":[216],"robustness":[218],"respect":[224],"changes":[227],"planning":[229],"input.":[230]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":8},{"year":2019,"cited_by_count":8},{"year":2018,"cited_by_count":8}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}