{"id":"https://openalex.org/W2749838743","doi":"https://doi.org/10.1109/tr.2017.2717190","title":"Nonparametric-Condition-Based Remaining Useful Life Prediction Incorporating External Factors","display_name":"Nonparametric-Condition-Based Remaining Useful Life Prediction Incorporating External Factors","publication_year":2017,"publication_date":"2017-08-21","ids":{"openalex":"https://openalex.org/W2749838743","doi":"https://doi.org/10.1109/tr.2017.2717190","mag":"2749838743"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2017.2717190","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2017.2717190","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075324117","display_name":"Raed Al Kontar","orcid":"https://orcid.org/0000-0002-4546-324X"},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Raed Kontar","raw_affiliation_strings":["Department of Industrial and Systems Engineering, University of Wisconsin-Madison, Madison, WI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial and Systems Engineering, University of Wisconsin-Madison, Madison, WI, USA","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000499123","display_name":"Shiyu Zhou","orcid":"https://orcid.org/0000-0002-5902-8812"},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shiyu Zhou","raw_affiliation_strings":["Department of Industrial and Systems Engineering, University of Wisconsin-Madison, Madison, WI, USA"],"raw_orcid":"https://orcid.org/0000-0002-5902-8812","affiliations":[{"raw_affiliation_string":"Department of Industrial and Systems Engineering, University of Wisconsin-Madison, Madison, WI, USA","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060404859","display_name":"Chaitanya Sankavaram","orcid":null},"institutions":[{"id":"https://openalex.org/I118136607","display_name":"General Motors (United States)","ror":"https://ror.org/05addee68","country_code":"US","type":"company","lineage":["https://openalex.org/I118136607"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chaitanya Sankavaram","raw_affiliation_strings":["General Motors Research and Development, Warren, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"General Motors Research and Development, Warren, MI, USA","institution_ids":["https://openalex.org/I118136607"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026131541","display_name":"Xinyu Du","orcid":"https://orcid.org/0000-0002-8863-7879"},"institutions":[{"id":"https://openalex.org/I118136607","display_name":"General Motors (United States)","ror":"https://ror.org/05addee68","country_code":"US","type":"company","lineage":["https://openalex.org/I118136607"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xinyu Du","raw_affiliation_strings":["General Motors Research and Development, Warren, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"General Motors Research and Development, Warren, MI, USA","institution_ids":["https://openalex.org/I118136607"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029812382","display_name":"Yilu Zhang","orcid":"https://orcid.org/0009-0000-2742-2922"},"institutions":[{"id":"https://openalex.org/I118136607","display_name":"General Motors (United States)","ror":"https://ror.org/05addee68","country_code":"US","type":"company","lineage":["https://openalex.org/I118136607"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yilu Zhang","raw_affiliation_strings":["General Motors Research and Development, Warren, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"General Motors Research and Development, Warren, MI, USA","institution_ids":["https://openalex.org/I118136607"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5075324117"],"corresponding_institution_ids":["https://openalex.org/I135310074"],"apc_list":null,"apc_paid":null,"fwci":2.841,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.89636826,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"67","issue":"1","first_page":"41","last_page":"52"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hypersphere","display_name":"Hypersphere","score":0.7673835754394531},{"id":"https://openalex.org/keywords/nonparametric-statistics","display_name":"Nonparametric statistics","score":0.684853196144104},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6209545731544495},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49568450450897217},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4140661358833313},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2903245687484741},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2561556100845337},{"id":"https://openalex.org/keywords/econometrics","display_name":"Econometrics","score":0.1253601610660553}],"concepts":[{"id":"https://openalex.org/C2776562905","wikidata":"https://www.wikidata.org/wiki/Q306610","display_name":"Hypersphere","level":2,"score":0.7673835754394531},{"id":"https://openalex.org/C102366305","wikidata":"https://www.wikidata.org/wiki/Q1097688","display_name":"Nonparametric statistics","level":2,"score":0.684853196144104},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6209545731544495},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49568450450897217},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4140661358833313},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2903245687484741},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2561556100845337},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.1253601610660553},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2017.2717190","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2017.2717190","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Responsible consumption and production","score":0.5600000023841858,"id":"https://metadata.un.org/sdg/12"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":57,"referenced_works":["https://openalex.org/W34929345","https://openalex.org/W1515826176","https://openalex.org/W1534349507","https://openalex.org/W1585926113","https://openalex.org/W1964490787","https://openalex.org/W1967513204","https://openalex.org/W1975862629","https://openalex.org/W1977007306","https://openalex.org/W1978056375","https://openalex.org/W1982286208","https://openalex.org/W1985780394","https://openalex.org/W1993230770","https://openalex.org/W1995496685","https://openalex.org/W2005753608","https://openalex.org/W2012369294","https://openalex.org/W2013264478","https://openalex.org/W2018044188","https://openalex.org/W2026757872","https://openalex.org/W2032758468","https://openalex.org/W2040932457","https://openalex.org/W2041429597","https://openalex.org/W2043129860","https://openalex.org/W2044776561","https://openalex.org/W2046495656","https://openalex.org/W2047022943","https://openalex.org/W2049045003","https://openalex.org/W2054215027","https://openalex.org/W2055873761","https://openalex.org/W2059503552","https://openalex.org/W2060496771","https://openalex.org/W2064228310","https://openalex.org/W2065128376","https://openalex.org/W2080202623","https://openalex.org/W2094009285","https://openalex.org/W2096731208","https://openalex.org/W2098608159","https://openalex.org/W2106687296","https://openalex.org/W2110007571","https://openalex.org/W2118808071","https://openalex.org/W2126445794","https://openalex.org/W2144148350","https://openalex.org/W2146611938","https://openalex.org/W2149956719","https://openalex.org/W2150396615","https://openalex.org/W2156614992","https://openalex.org/W2157883849","https://openalex.org/W2159733781","https://openalex.org/W2160118356","https://openalex.org/W2167503371","https://openalex.org/W2325689984","https://openalex.org/W2558515677","https://openalex.org/W2756837310","https://openalex.org/W2795854098","https://openalex.org/W3098718910","https://openalex.org/W3121687142","https://openalex.org/W4206212643","https://openalex.org/W6601447099"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2099702253","https://openalex.org/W2059484267","https://openalex.org/W1970780628","https://openalex.org/W2069017679","https://openalex.org/W2133653616","https://openalex.org/W2921850681","https://openalex.org/W2079494444","https://openalex.org/W4389755575","https://openalex.org/W2466608391"],"abstract_inverted_index":{"The":[0,74],"use":[1],"of":[2,13,44,67,77,99,126,134],"condition":[3],"monitoring":[4],"(CM)":[5],"signals":[6,28,69,91,136],"to":[7,95],"predict":[8],"the":[9,42,65,97,123,132],"remaining":[10],"useful":[11],"life":[12],"in-service":[14],"units":[15],"plays":[16],"a":[17,60,103,114],"critical":[18],"role":[19],"in":[20,52],"reliability":[21],"engineering.":[22],"Many":[23],"models":[24],"assume":[25,85],"that":[26,35,81],"CM":[27,68,90,135],"behave":[29],"under":[30,70],"similar":[31],"external":[32,36,72,100,140],"conditions":[33],"or":[34],"factors":[37,101],"have":[38],"no":[39],"effect":[40,98],"on":[41,117],"evolution":[43,66,133],"these":[45],"signals.":[46],"These":[47],"assumptions":[48],"might":[49],"not":[50,84],"hold":[51],"real-life":[53],"applications.":[54],"In":[55],"this":[56],"paper,":[57],"we":[58,121],"propose":[59],"nonparametric":[61],"framework":[62],"for":[63,89],"modeling":[64],"different":[71],"factors.":[73,141],"unique":[75],"feature":[76],"our":[78,127],"model":[79],"is":[80,93,137],"it":[82],"does":[83],"any":[86],"functional":[87],"form":[88],"and":[92,113],"able":[94],"incorporate":[96],"through":[102],"reparametrization":[104],"technique":[105],"called":[106],"hypersphere":[107],"decomposition.":[108],"Through":[109],"extensive":[110],"numerical":[111],"studies":[112],"case":[115],"study":[116],"automotive":[118],"lead-acid":[119],"batteries,":[120],"demonstrate":[122],"advantageous":[124],"features":[125],"proposed":[128],"method":[129],"specifically":[130],"when":[131],"impacted":[138],"by":[139]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}