{"id":"https://openalex.org/W2734058813","doi":"https://doi.org/10.1109/tr.2017.2714172","title":"Uncertainty Sensitivity Analysis for Reliability Problems with Parametric Distributions","display_name":"Uncertainty Sensitivity Analysis for Reliability Problems with Parametric Distributions","publication_year":2017,"publication_date":"2017-06-28","ids":{"openalex":"https://openalex.org/W2734058813","doi":"https://doi.org/10.1109/tr.2017.2714172","mag":"2734058813"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2017.2714172","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2017.2714172","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047693161","display_name":"Jingjing He","orcid":"https://orcid.org/0000-0003-2236-254X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jingjing He","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China","Sch. of Reliability & Syst. Eng., BeiHang Univ., Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Sch. of Reliability & Syst. Eng., BeiHang Univ., Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007911718","display_name":"Xuefei Guan","orcid":"https://orcid.org/0000-0002-5928-3039"},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xuefei Guan","raw_affiliation_strings":["Siemens Corporation, Corporate Technology, Princeton, NJ, USA","[Siemens Corporation, Corporate Technology, Princeton NJ, USA]"],"affiliations":[{"raw_affiliation_string":"Siemens Corporation, Corporate Technology, Princeton, NJ, USA","institution_ids":["https://openalex.org/I4210137693"]},{"raw_affiliation_string":"[Siemens Corporation, Corporate Technology, Princeton NJ, USA]","institution_ids":["https://openalex.org/I4210137693"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5047693161"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":1.26,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.82052821,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"66","issue":"3","first_page":"712","last_page":"721"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10396","display_name":"Fatigue and fracture mechanics","score":0.9848999977111816,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13923","display_name":"Nuclear and radioactivity studies","score":0.983299970626831,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6937651634216309},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.6594830751419067},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5904766321182251},{"id":"https://openalex.org/keywords/estimator","display_name":"Estimator","score":0.5768774747848511},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.5654838681221008},{"id":"https://openalex.org/keywords/variance-based-sensitivity-analysis","display_name":"Variance-based sensitivity analysis","score":0.5455976128578186},{"id":"https://openalex.org/keywords/importance-sampling","display_name":"Importance sampling","score":0.5197550654411316},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.44855743646621704},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.44169536232948303},{"id":"https://openalex.org/keywords/applied-mathematics","display_name":"Applied mathematics","score":0.4372531771659851},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4342663586139679},{"id":"https://openalex.org/keywords/variance","display_name":"Variance (accounting)","score":0.41103121638298035},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.10838967561721802},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09434542059898376},{"id":"https://openalex.org/keywords/one-way-analysis-of-variance","display_name":"One-way analysis of variance","score":0.081401526927948},{"id":"https://openalex.org/keywords/analysis-of-variance","display_name":"Analysis of variance","score":0.07505032420158386}],"concepts":[{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6937651634216309},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.6594830751419067},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5904766321182251},{"id":"https://openalex.org/C185429906","wikidata":"https://www.wikidata.org/wiki/Q1130160","display_name":"Estimator","level":2,"score":0.5768774747848511},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.5654838681221008},{"id":"https://openalex.org/C108311543","wikidata":"https://www.wikidata.org/wiki/Q7915756","display_name":"Variance-based sensitivity analysis","level":4,"score":0.5455976128578186},{"id":"https://openalex.org/C52740198","wikidata":"https://www.wikidata.org/wiki/Q1539564","display_name":"Importance sampling","level":3,"score":0.5197550654411316},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.44855743646621704},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.44169536232948303},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.4372531771659851},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4342663586139679},{"id":"https://openalex.org/C196083921","wikidata":"https://www.wikidata.org/wiki/Q7915758","display_name":"Variance (accounting)","level":2,"score":0.41103121638298035},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.10838967561721802},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09434542059898376},{"id":"https://openalex.org/C152587130","wikidata":"https://www.wikidata.org/wiki/Q7092351","display_name":"One-way analysis of variance","level":3,"score":0.081401526927948},{"id":"https://openalex.org/C99476002","wikidata":"https://www.wikidata.org/wiki/Q42297","display_name":"Analysis of variance","level":2,"score":0.07505032420158386},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.0},{"id":"https://openalex.org/C121955636","wikidata":"https://www.wikidata.org/wiki/Q4116214","display_name":"Accounting","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2017.2714172","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2017.2714172","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.7799999713897705,"display_name":"Peace, Justice and strong institutions"}],"awards":[{"id":"https://openalex.org/G8642908042","display_name":null,"funder_award_id":"3163037","funder_id":"https://openalex.org/F4320322919","funder_display_name":"Natural Science Foundation of Beijing Municipality"}],"funders":[{"id":"https://openalex.org/F4320322919","display_name":"Natural Science Foundation of Beijing Municipality","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W100464641","https://openalex.org/W652869688","https://openalex.org/W819928789","https://openalex.org/W1538501087","https://openalex.org/W1604506244","https://openalex.org/W1940221094","https://openalex.org/W1966667501","https://openalex.org/W1973546808","https://openalex.org/W1984300728","https://openalex.org/W1996980905","https://openalex.org/W1998998358","https://openalex.org/W2000626830","https://openalex.org/W2006037565","https://openalex.org/W2006772343","https://openalex.org/W2011151964","https://openalex.org/W2026645785","https://openalex.org/W2027714334","https://openalex.org/W2032751439","https://openalex.org/W2043419861","https://openalex.org/W2046600410","https://openalex.org/W2078765362","https://openalex.org/W2080332334","https://openalex.org/W2086747238","https://openalex.org/W2088765131","https://openalex.org/W2101589741","https://openalex.org/W2131562456","https://openalex.org/W2141804799","https://openalex.org/W2150010209","https://openalex.org/W2155117533","https://openalex.org/W2158596264","https://openalex.org/W2162262334","https://openalex.org/W2165421784","https://openalex.org/W2170832294","https://openalex.org/W2525082097","https://openalex.org/W4231559319","https://openalex.org/W4235092540","https://openalex.org/W4300580367","https://openalex.org/W6632120195","https://openalex.org/W6684017535"],"related_works":["https://openalex.org/W2025175130","https://openalex.org/W2109135198","https://openalex.org/W2173022174","https://openalex.org/W2746366400","https://openalex.org/W4251128056","https://openalex.org/W1994910710","https://openalex.org/W2182921069","https://openalex.org/W3097926108","https://openalex.org/W858226471","https://openalex.org/W2358844358"],"abstract_inverted_index":{"A":[0],"method":[1,87,126],"of":[2,28,39,55,68,74,97,116],"uncertainty":[3,20],"sensitivity":[4,21,70,108],"modeling":[5],"and":[6,88,93,113],"assessment":[7],"for":[8,66,71],"reliability":[9],"problems":[10],"involving":[11],"parametric":[12],"distributions":[13],"is":[14,22,47,57,91,102,111,122,127],"presented":[15],"in":[16],"the":[17,25,29,35,61,69,84,94,98,106,114,120],"paper.":[18],"The":[19,81,124],"quantified":[23],"as":[24,49],"first-order":[26],"derivative":[27],"response":[30],"function":[31],"with":[32],"respect":[33],"to":[34,59],"distribution":[36,75,117],"parameters":[37,76,118],"instead":[38],"uncertain":[40],"variables":[41],"themselves.":[42],"Monte":[43],"Carlo":[44],"(MC)":[45],"simulation":[46],"employed":[48],"a":[50],"universal":[51],"evaluation":[52,67],"method.":[53],"Change":[54],"measure":[56],"proposed":[58],"formulate":[60],"likelihood":[62,85],"ratio":[63,86],"estimator,":[64],"allowing":[65],"multiple":[72],"values":[73],"using":[77,129],"one-pass":[78],"MC":[79,100],"simulations.":[80],"relation":[82],"between":[83],"importance":[89],"sampling":[90],"discussed,":[92],"bounded":[95],"variance":[96],"unbiased":[99],"estimator":[101],"derived.":[103],"In":[104],"addition,":[105],"analysis-assisted":[107],"reduction":[109],"procedure":[110],"outlined,":[112],"influence":[115],"on":[119],"decisionmaking":[121],"discussed.":[123],"overall":[125],"demonstrated":[128],"examples.":[130]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}