{"id":"https://openalex.org/W2613273474","doi":"https://doi.org/10.1109/tr.2017.2696341","title":"Model Uncertainty in Accelerated Degradation Testing Analysis","display_name":"Model Uncertainty in Accelerated Degradation Testing Analysis","publication_year":2017,"publication_date":"2017-05-12","ids":{"openalex":"https://openalex.org/W2613273474","doi":"https://doi.org/10.1109/tr.2017.2696341","mag":"2613273474"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2017.2696341","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2017.2696341","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.science/hal-01652218","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069104881","display_name":"Le Liu","orcid":"https://orcid.org/0000-0002-8468-327X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Le Liu","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China","Science and Technology on Reliability and Environmental Engineering Laboratory, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Science and Technology on Reliability and Environmental Engineering Laboratory, Beijing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100606922","display_name":"Xiaoyang Li","orcid":"https://orcid.org/0000-0002-4046-2934"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiao-Yang Li","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China","Science and Technology on Reliability and Environmental Engineering Laboratory, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Science and Technology on Reliability and Environmental Engineering Laboratory, Beijing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012431211","display_name":"Enrico Zio","orcid":"https://orcid.org/0000-0002-7108-637X"},"institutions":[{"id":"https://openalex.org/I277688954","display_name":"Universit\u00e9 Paris-Saclay","ror":"https://ror.org/03xjwb503","country_code":"FR","type":"education","lineage":["https://openalex.org/I277688954"]},{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]},{"id":"https://openalex.org/I4210107720","display_name":"CentraleSup\u00e9lec","ror":"https://ror.org/019tcpt25","country_code":"FR","type":"facility","lineage":["https://openalex.org/I277688954","https://openalex.org/I4210107720"]},{"id":"https://openalex.org/I4210143116","display_name":"\u00c9lectricit\u00e9 de France (France)","ror":"https://ror.org/03wb8xz10","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210143116"]}],"countries":["FR","IT"],"is_corresponding":false,"raw_author_name":"Enrico Zio","raw_affiliation_strings":["Chair on System Science and the Energetic Challenge, Foundation Electricite de France, CentraleSupelec, Universite Paris-Saclay, Paris, France","Department of Energy, Politecnico di Milano, Milano, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chair on System Science and the Energetic Challenge, Foundation Electricite de France, CentraleSupelec, Universite Paris-Saclay, Paris, France","institution_ids":["https://openalex.org/I4210143116","https://openalex.org/I4210107720","https://openalex.org/I277688954"]},{"raw_affiliation_string":"Department of Energy, Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102026831","display_name":"Rui Kang","orcid":"https://orcid.org/0000-0002-4488-6574"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rui Kang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China","Science and Technology on Reliability and Environmental Engineering Laboratory, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Science and Technology on Reliability and Environmental Engineering Laboratory, Beijing, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110223717","display_name":"Tongmin Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tong-Min Jiang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5069104881"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":6.3125,"has_fulltext":false,"cited_by_count":53,"citation_normalized_percentile":{"value":0.96128438,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"66","issue":"3","first_page":"603","last_page":"615"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6325140595436096},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5662527680397034},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.47309401631355286},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.47060972452163696},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46228837966918945},{"id":"https://openalex.org/keywords/econometrics","display_name":"Econometrics","score":0.3413015902042389},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24614503979682922},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.22815966606140137},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17204180359840393},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09441620111465454}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6325140595436096},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5662527680397034},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.47309401631355286},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.47060972452163696},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46228837966918945},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.3413015902042389},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24614503979682922},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.22815966606140137},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17204180359840393},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09441620111465454},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tr.2017.2696341","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2017.2696341","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-01652218v1","is_oa":true,"landing_page_url":"https://hal.science/hal-01652218","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Reliability, 2017, 66 (3), pp.603 - 615. ⟨10.1109/TR.2017.2696341⟩","raw_type":"Journal articles"},{"id":"pmh:oai:re.public.polimi.it:11311/1053211","is_oa":false,"landing_page_url":"http://hdl.handle.net/11311/1053211","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-01652218v1","is_oa":true,"landing_page_url":"https://hal.science/hal-01652218","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Reliability, 2017, 66 (3), pp.603 - 615. ⟨10.1109/TR.2017.2696341⟩","raw_type":"Journal articles"},"sustainable_development_goals":[{"display_name":"Life in Land","id":"https://metadata.un.org/sdg/15","score":0.4000000059604645}],"awards":[{"id":"https://openalex.org/G117853525","display_name":null,"funder_award_id":"YWF-16-JCTD-A-02-06","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G2026434780","display_name":null,"funder_award_id":"61104182","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3009418347","display_name":null,"funder_award_id":"61573043","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G92370711","display_name":null,"funder_award_id":"61603018","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":58,"referenced_works":["https://openalex.org/W176292746","https://openalex.org/W1585926113","https://openalex.org/W1603903339","https://openalex.org/W1800261609","https://openalex.org/W1905550580","https://openalex.org/W1932372884","https://openalex.org/W1968656346","https://openalex.org/W1972565400","https://openalex.org/W1974193422","https://openalex.org/W1977963437","https://openalex.org/W1985827874","https://openalex.org/W1988617574","https://openalex.org/W1989569109","https://openalex.org/W1989801228","https://openalex.org/W1990912241","https://openalex.org/W1995410731","https://openalex.org/W1995723008","https://openalex.org/W2005683107","https://openalex.org/W2006287597","https://openalex.org/W2010378328","https://openalex.org/W2011679445","https://openalex.org/W2023083702","https://openalex.org/W2026273825","https://openalex.org/W2027892644","https://openalex.org/W2046772954","https://openalex.org/W2051617744","https://openalex.org/W2052304942","https://openalex.org/W2057331441","https://openalex.org/W2072999804","https://openalex.org/W2077983750","https://openalex.org/W2081462963","https://openalex.org/W2081779205","https://openalex.org/W2082804449","https://openalex.org/W2085014394","https://openalex.org/W2092156670","https://openalex.org/W2092650206","https://openalex.org/W2094054248","https://openalex.org/W2094438648","https://openalex.org/W2096731208","https://openalex.org/W2106675691","https://openalex.org/W2112935810","https://openalex.org/W2126445794","https://openalex.org/W2127755978","https://openalex.org/W2129531883","https://openalex.org/W2139655178","https://openalex.org/W2151038992","https://openalex.org/W2152933101","https://openalex.org/W2170884511","https://openalex.org/W2190410581","https://openalex.org/W2498809433","https://openalex.org/W2603565600","https://openalex.org/W2792036420","https://openalex.org/W2795854098","https://openalex.org/W3098336475","https://openalex.org/W4233921518","https://openalex.org/W4289257608","https://openalex.org/W4299419703","https://openalex.org/W4300223101"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W1815542355","https://openalex.org/W4233600955","https://openalex.org/W4322734194","https://openalex.org/W3116237489","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935"],"abstract_inverted_index":{"In":[0,31,55],"accelerated":[1],"degradation":[2,37,102],"testing":[3],"(ADT),":[4],"test":[5],"data":[6,79],"from":[7],"higher":[8],"than":[9],"normal":[10],"stress":[11,72,76],"conditions":[12],"are":[13,80],"used":[14],"to":[15,43,52,70,88],"find":[16],"stochastic":[17],"models":[18],"of":[19,35],"degradation,":[20],"e.g.,":[21],"Wiener":[22],"process,":[23,25],"Gamma":[24],"and":[26,47,62,96,127],"inverse":[27],"Gaussian":[28],"process":[29],"models.":[30],"general,":[32],"the":[33,36,64,90,109,113,133],"selection":[34],"model":[38,53,66,95,103],"is":[39,50],"made":[40],"with":[41,132],"reference":[42],"one":[44],"specific":[45],"product":[46],"no":[48],"consideration":[49],"given":[51],"uncertainty.":[54],"this":[56,60,125],"paper,":[57],"we":[58],"address":[59],"issue":[61],"apply":[63],"Bayesian":[65],"averaging":[67],"(BMA)":[68],"method":[69],"constant":[71],"ADT.":[73],"For":[74],"illustration,":[75],"relaxation":[77],"ADT":[78],"analyzed.":[81],"We":[82],"also":[83],"make":[84],"a":[85],"simulation":[86],"study":[87],"compare":[89],"s-credibility":[91,130],"intervals":[92,131],"for":[93,117],"single":[94],"BMA.":[97],"The":[98,120],"results":[99],"show":[100],"that":[101],"uncertainty":[104,126],"has":[105],"significant":[106],"effects":[107],"on":[108],"p-quantile":[110],"lifetime":[111],"at":[112,137],"use":[114],"conditions,":[115],"especially":[116],"extreme":[118],"quantiles.":[119],"BMA":[121],"can":[122],"well":[123],"capture":[124],"compute":[128],"compromise":[129],"highest":[134],"coverage":[135],"probability":[136],"each":[138],"quantile.":[139]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":10},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":8},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":11},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1}],"updated_date":"2026-05-27T09:02:27.158192","created_date":"2025-10-10T00:00:00"}