{"id":"https://openalex.org/W2473844435","doi":"https://doi.org/10.1109/tr.2016.2570565","title":"Reliability Evaluation of Phased-Mission Systems Using Stochastic Computation","display_name":"Reliability Evaluation of Phased-Mission Systems Using Stochastic Computation","publication_year":2016,"publication_date":"2016-06-27","ids":{"openalex":"https://openalex.org/W2473844435","doi":"https://doi.org/10.1109/tr.2016.2570565","mag":"2473844435"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2016.2570565","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2016.2570565","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038915198","display_name":"Peican Zhu","orcid":"https://orcid.org/0000-0002-8389-1093"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peican Zhu","raw_affiliation_strings":["School of Computer Science and Technology, Northwestern Polytechnical University, Xi'an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Northwestern Polytechnical University, Xi'an, China","institution_ids":["https://openalex.org/I17145004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005550142","display_name":"Jie Han","orcid":"https://orcid.org/0000-0002-8849-4994"},"institutions":[{"id":"https://openalex.org/I154425047","display_name":"University of Alberta","ror":"https://ror.org/0160cpw27","country_code":"CA","type":"education","lineage":["https://openalex.org/I154425047"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Jie Han","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Alberta, Edmonton, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Alberta, Edmonton, Canada","institution_ids":["https://openalex.org/I154425047"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100358856","display_name":"Leibo Liu","orcid":"https://orcid.org/0000-0001-7548-4116"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Leibo Liu","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001979328","display_name":"Fabrizio Lombardi","orcid":"https://orcid.org/0000-0003-3152-3245"},"institutions":[{"id":"https://openalex.org/I12912129","display_name":"Northeastern University","ror":"https://ror.org/04t5xt781","country_code":"US","type":"education","lineage":["https://openalex.org/I12912129"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fabrizio Lombardi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA","institution_ids":["https://openalex.org/I12912129"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.5532,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.91353546,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":93,"max":98},"biblio":{"volume":"65","issue":"3","first_page":"1612","last_page":"1623"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/stochastic-computing","display_name":"Stochastic computing","score":0.7033125162124634},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6656213402748108},{"id":"https://openalex.org/keywords/network-topology","display_name":"Network topology","score":0.6023194789886475},{"id":"https://openalex.org/keywords/stochastic-process","display_name":"Stochastic process","score":0.602243185043335},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5834981799125671},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5685302019119263},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.515045166015625},{"id":"https://openalex.org/keywords/stochastic-modelling","display_name":"Stochastic modelling","score":0.4969501793384552},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.48535171151161194},{"id":"https://openalex.org/keywords/bernoullis-principle","display_name":"Bernoulli's principle","score":0.4720902144908905},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.4198175072669983},{"id":"https://openalex.org/keywords/bernoulli-trial","display_name":"Bernoulli trial","score":0.4169754087924957},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.364425390958786},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.3359431028366089},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2798358201980591},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.23606446385383606},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1622646450996399},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.09979197382926941}],"concepts":[{"id":"https://openalex.org/C2780971903","wikidata":"https://www.wikidata.org/wiki/Q2933705","display_name":"Stochastic computing","level":3,"score":0.7033125162124634},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6656213402748108},{"id":"https://openalex.org/C199845137","wikidata":"https://www.wikidata.org/wiki/Q145490","display_name":"Network topology","level":2,"score":0.6023194789886475},{"id":"https://openalex.org/C8272713","wikidata":"https://www.wikidata.org/wiki/Q176737","display_name":"Stochastic process","level":2,"score":0.602243185043335},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5834981799125671},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5685302019119263},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.515045166015625},{"id":"https://openalex.org/C127491075","wikidata":"https://www.wikidata.org/wiki/Q7617825","display_name":"Stochastic modelling","level":2,"score":0.4969501793384552},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.48535171151161194},{"id":"https://openalex.org/C152361515","wikidata":"https://www.wikidata.org/wiki/Q181328","display_name":"Bernoulli's principle","level":2,"score":0.4720902144908905},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4198175072669983},{"id":"https://openalex.org/C46802686","wikidata":"https://www.wikidata.org/wiki/Q1077800","display_name":"Bernoulli trial","level":2,"score":0.4169754087924957},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.364425390958786},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.3359431028366089},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2798358201980591},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.23606446385383606},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1622646450996399},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09979197382926941},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2016.2570565","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2016.2570565","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W205347261","https://openalex.org/W761781649","https://openalex.org/W1480489012","https://openalex.org/W1826950235","https://openalex.org/W1968010872","https://openalex.org/W2003558009","https://openalex.org/W2032292266","https://openalex.org/W2052140935","https://openalex.org/W2055653169","https://openalex.org/W2061867886","https://openalex.org/W2063656926","https://openalex.org/W2065226915","https://openalex.org/W2071310017","https://openalex.org/W2074897389","https://openalex.org/W2075558682","https://openalex.org/W2083843789","https://openalex.org/W2084198549","https://openalex.org/W2087642242","https://openalex.org/W2093711428","https://openalex.org/W2098470668","https://openalex.org/W2100583107","https://openalex.org/W2110084489","https://openalex.org/W2110269451","https://openalex.org/W2115105639","https://openalex.org/W2117383855","https://openalex.org/W2121563668","https://openalex.org/W2124192075","https://openalex.org/W2129664585","https://openalex.org/W2132180878","https://openalex.org/W2134748083","https://openalex.org/W2139272526","https://openalex.org/W2149690743","https://openalex.org/W2611793981","https://openalex.org/W4231282956","https://openalex.org/W6622422786"],"related_works":["https://openalex.org/W2050627475","https://openalex.org/W4366387587","https://openalex.org/W2798179247","https://openalex.org/W2151924611","https://openalex.org/W2151706800","https://openalex.org/W4324123865","https://openalex.org/W4301279896","https://openalex.org/W1993705380","https://openalex.org/W2066682508","https://openalex.org/W972852616"],"abstract_inverted_index":{"A":[0],"phased-mission":[1],"system":[2,51,145],"(PMS)":[3],"usually":[4],"consists":[5],"of":[6,10,33,60,74,99,108,114,150,168,179,187,215],"several":[7],"nonoverlapping":[8],"phases":[9,13,41],"tasks.":[11],"All":[12],"are":[14,81,103,160],"required":[15],"to":[16,44,83,126,162],"be":[17,27,124,154],"accomplished":[18],"sequentially":[19],"for":[20,53,69,139],"a":[21,34,45,63,75,128,174,203],"successful":[22],"mission.":[23],"Different":[24],"features":[25],"must":[26],"considered":[28],"in":[29,88,212],"the":[30,37,40,49,54,58,72,85,89,93,96,100,119,135,140,144,147,151,164,169,177,180,185,188,196,208,213],"reliability":[31,73],"evaluation":[32],"PMS,":[35],"including":[36],"dependence":[38],"among":[39],"with":[42,111,173,184],"respect":[43],"common":[46,86],"component":[47],"and":[48,116,143,166],"different":[50,90],"topologies":[52],"phases.":[55,91],"To":[56],"overcome":[57],"limitation":[59],"existing":[61],"approaches,":[62],"stochastic":[64,94,121,137,170,181,189,197],"computational":[65],"approach":[66,122],"is":[67,193,199],"proposed":[68,82,120],"efficiently":[70,155],"analyzing":[71],"nonrepairable":[76],"PMS.":[77],"Stochastic":[78],"logic":[79],"models":[80],"analyze":[84],"components":[87,102,142],"In":[92],"analysis,":[95,176],"signal":[97],"probabilities":[98],"basic":[101,141],"encoded":[104],"as":[105],"non-Bernoulli":[106],"sequences":[107,138],"random":[109],"permutations":[110],"fixed":[112],"numbers":[113],"1s":[115],"0s.":[117],"Thus,":[118],"can":[123,153],"used":[125],"evaluate":[127],"PMS":[129,152],"under":[130],"any":[131],"distribution.":[132],"Based":[133],"on":[134],"generated":[136],"topology,":[146],"failure":[148],"probability":[149],"predicted.":[156],"Several":[157],"case":[158],"studies":[159],"evaluated":[161],"show":[163],"accuracy":[165,178],"efficiency":[167],"approach.":[171],"Compared":[172],"combinatorial":[175],"analysis":[182,198],"varies":[183],"length":[186],"sequences.":[190],"However,":[191],"it":[192],"shown":[194],"that":[195],"more":[200],"efficient":[201],"than":[202],"Monte":[204],"Carlo":[205],"simulation":[206],"at":[207],"same":[209],"execution":[210],"complexity":[211],"number":[214],"runs.":[216]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}