{"id":"https://openalex.org/W2345145213","doi":"https://doi.org/10.1109/tr.2015.2513038","title":"Bivariate Analysis of Incomplete Degradation Observations Based on Inverse Gaussian Processes and Copulas","display_name":"Bivariate Analysis of Incomplete Degradation Observations Based on Inverse Gaussian Processes and Copulas","publication_year":2016,"publication_date":"2016-01-22","ids":{"openalex":"https://openalex.org/W2345145213","doi":"https://doi.org/10.1109/tr.2015.2513038","mag":"2345145213"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2015.2513038","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2015.2513038","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003022560","display_name":"Weiwen Peng","orcid":"https://orcid.org/0000-0001-9535-9187"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Weiwen Peng","raw_affiliation_strings":["Institute of Reliability Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China"],"affiliations":[{"raw_affiliation_string":"Institute of Reliability Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100653134","display_name":"Yan\u2010Feng Li","orcid":"https://orcid.org/0000-0002-9121-1465"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan-Feng Li","raw_affiliation_strings":["Institute of Reliability Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China"],"affiliations":[{"raw_affiliation_string":"Institute of Reliability Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101589277","display_name":"Yuan\u2010Jian Yang","orcid":"https://orcid.org/0000-0001-7113-1989"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuan-Jian Yang","raw_affiliation_strings":["Institute of Reliability Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China"],"affiliations":[{"raw_affiliation_string":"Institute of Reliability Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101473589","display_name":"Shun\u2010Peng Zhu","orcid":"https://orcid.org/0000-0003-2193-6484"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shun-Peng Zhu","raw_affiliation_strings":["Institute of Reliability Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China"],"affiliations":[{"raw_affiliation_string":"Institute of Reliability Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113467060","display_name":"Hong\u2010Zhong Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hong-Zhong Huang","raw_affiliation_strings":["Institute of Reliability Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China"],"affiliations":[{"raw_affiliation_string":"Institute of Reliability Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5003022560"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":null,"apc_paid":null,"fwci":30.9684,"has_fulltext":false,"cited_by_count":161,"citation_normalized_percentile":{"value":0.99899666,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"65","issue":"2","first_page":"624","last_page":"639"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9819999933242798,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9794999957084656,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bivariate-analysis","display_name":"Bivariate analysis","score":0.7818753123283386},{"id":"https://openalex.org/keywords/copula","display_name":"Copula (linguistics)","score":0.680101215839386},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.6014273762702942},{"id":"https://openalex.org/keywords/inference","display_name":"Inference","score":0.48664531111717224},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.481777161359787},{"id":"https://openalex.org/keywords/inverse-gaussian-distribution","display_name":"Inverse Gaussian distribution","score":0.47824230790138245},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45358043909072876},{"id":"https://openalex.org/keywords/gaussian-process","display_name":"Gaussian process","score":0.4456885755062103},{"id":"https://openalex.org/keywords/gaussian","display_name":"Gaussian","score":0.444539338350296},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3363344669342041},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3328169584274292},{"id":"https://openalex.org/keywords/econometrics","display_name":"Econometrics","score":0.28558164834976196},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2313975691795349},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.20333591103553772},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.19223827123641968},{"id":"https://openalex.org/keywords/distribution","display_name":"Distribution (mathematics)","score":0.08606576919555664},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07761788368225098}],"concepts":[{"id":"https://openalex.org/C64341305","wikidata":"https://www.wikidata.org/wiki/Q4919225","display_name":"Bivariate analysis","level":2,"score":0.7818753123283386},{"id":"https://openalex.org/C17618745","wikidata":"https://www.wikidata.org/wiki/Q207509","display_name":"Copula (linguistics)","level":2,"score":0.680101215839386},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6014273762702942},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.48664531111717224},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.481777161359787},{"id":"https://openalex.org/C132878287","wikidata":"https://www.wikidata.org/wiki/Q1671727","display_name":"Inverse Gaussian distribution","level":3,"score":0.47824230790138245},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45358043909072876},{"id":"https://openalex.org/C61326573","wikidata":"https://www.wikidata.org/wiki/Q1496376","display_name":"Gaussian process","level":3,"score":0.4456885755062103},{"id":"https://openalex.org/C163716315","wikidata":"https://www.wikidata.org/wiki/Q901177","display_name":"Gaussian","level":2,"score":0.444539338350296},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3363344669342041},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3328169584274292},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.28558164834976196},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2313975691795349},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.20333591103553772},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.19223827123641968},{"id":"https://openalex.org/C110121322","wikidata":"https://www.wikidata.org/wiki/Q865811","display_name":"Distribution (mathematics)","level":2,"score":0.08606576919555664},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07761788368225098},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2015.2513038","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2015.2513038","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W1568780066","https://openalex.org/W1570262350","https://openalex.org/W1601826958","https://openalex.org/W1967372803","https://openalex.org/W1972882514","https://openalex.org/W1974635664","https://openalex.org/W1974741912","https://openalex.org/W1982286208","https://openalex.org/W1985827874","https://openalex.org/W1988286714","https://openalex.org/W1995373625","https://openalex.org/W2004839758","https://openalex.org/W2020891120","https://openalex.org/W2021683013","https://openalex.org/W2023083702","https://openalex.org/W2029536321","https://openalex.org/W2037531178","https://openalex.org/W2040287221","https://openalex.org/W2051406062","https://openalex.org/W2055873761","https://openalex.org/W2059401976","https://openalex.org/W2067266460","https://openalex.org/W2081628790","https://openalex.org/W2088490356","https://openalex.org/W2098917156","https://openalex.org/W2107680533","https://openalex.org/W2112935810","https://openalex.org/W2119436275","https://openalex.org/W2120614393","https://openalex.org/W2124000105","https://openalex.org/W2137297477","https://openalex.org/W2149359935","https://openalex.org/W2151038992","https://openalex.org/W2175473154","https://openalex.org/W2176539232","https://openalex.org/W2479980505","https://openalex.org/W2494873755"],"related_works":["https://openalex.org/W2202466617","https://openalex.org/W2990837948","https://openalex.org/W3127236696","https://openalex.org/W2080551413","https://openalex.org/W2756923888","https://openalex.org/W2767176313","https://openalex.org/W4287838929","https://openalex.org/W2359012312","https://openalex.org/W4288017135","https://openalex.org/W2800558361"],"abstract_inverted_index":{"Modern":[0],"engineering":[1],"systems":[2,20],"are":[3,9,109],"generally":[4,34],"composed":[5],"of":[6,18,25,61,120,127,137,143],"multicomponents":[7],"and":[8,15,39,70,94,104,124,140],"characterized":[10],"as":[11],"multifunctional.":[12],"Condition":[13],"monitoring":[14],"health":[16],"management":[17],"these":[19],"often":[21],"confronts":[22],"the":[23,85,91,118,121,128],"difficulty":[24],"degradation":[26,63,87,92,125,135],"analysis":[27,51,136],"with":[28,52],"multiple":[29,48],"performance":[30],"characteristics.":[31],"Degradation":[32,98],"observations":[33],"exhibit":[35],"an":[36],"s-dependent":[37,49],"nature":[38],"sometimes":[40],"experience":[41],"incomplete":[42,53,149],"measurements.":[43],"These":[44],"issues":[45],"necessitate":[46],"investigating":[47],"degradations":[50],"observations.":[54],"In":[55],"this":[56],"paper,":[57],"a":[58,133],"new":[59],"type":[60],"bivariate":[62,86,134],"model":[64,88],"based":[65],"on":[66],"inverse":[67],"Gaussian":[68],"processes":[69,93],"copulas":[71],"is":[72,78,114,151],"proposed.":[73],"A":[74,111],"two-stage":[75],"Bayesian":[76],"method":[77],"introduced":[79],"to":[80,116,148],"implement":[81],"parameter":[82],"estimation":[83],"for":[84,100,105],"by":[89],"treating":[90],"copula":[95],"function":[96],"separately.":[97],"inferences":[99],"missing":[101],"observation":[102,107],"points,":[103],"future":[106],"points":[108],"investigated.":[110],"simulation":[112],"study":[113,117],"presented":[115],"effectiveness":[119],"dependence":[122],"modeling":[123],"inference":[126],"proposed":[129],"method.":[130],"For":[131],"demonstration,":[132],"positioning":[138],"accuracy":[139],"output":[141],"power":[142],"heavy":[144],"machine":[145],"tools":[146],"subject":[147],"measurements":[150],"provided.":[152]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":13},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":18},{"year":2021,"cited_by_count":15},{"year":2020,"cited_by_count":25},{"year":2019,"cited_by_count":17},{"year":2018,"cited_by_count":27},{"year":2017,"cited_by_count":21},{"year":2016,"cited_by_count":4},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-02T15:55:50.835912","created_date":"2025-10-10T00:00:00"}