{"id":"https://openalex.org/W2342898371","doi":"https://doi.org/10.1109/tr.2015.2503751","title":"System Reliability Under Cascading Failure Models","display_name":"System Reliability Under Cascading Failure Models","publication_year":2015,"publication_date":"2015-12-21","ids":{"openalex":"https://openalex.org/W2342898371","doi":"https://doi.org/10.1109/tr.2015.2503751","mag":"2342898371"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2015.2503751","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2015.2503751","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103009552","display_name":"Hui Dong","orcid":"https://orcid.org/0009-0005-7806-3727"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hui Dong","raw_affiliation_strings":["School of Mathematics and Statistics, Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Mathematics and Statistics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068547916","display_name":"Lirong Cui","orcid":"https://orcid.org/0000-0002-8987-4307"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lirong Cui","raw_affiliation_strings":["School of Mathematics and Statistics, Beijing Institute of Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Mathematics and Statistics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5103009552"],"corresponding_institution_ids":["https://openalex.org/I125839683"],"apc_list":null,"apc_paid":null,"fwci":6.2305,"has_fulltext":false,"cited_by_count":65,"citation_normalized_percentile":{"value":0.95738302,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"65","issue":"2","first_page":"929","last_page":"940"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11807","display_name":"Infrastructure Resilience and Vulnerability Analysis","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10917","display_name":"Smart Grid Security and Resilience","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cascading-failure","display_name":"Cascading failure","score":0.9547233581542969},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7464945316314697},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7385250926017761},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.5432149171829224},{"id":"https://openalex.org/keywords/cascade","display_name":"Cascade","score":0.520179271697998},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.5144317746162415},{"id":"https://openalex.org/keywords/power-system-protection","display_name":"Power-system protection","score":0.43730130791664124},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43562036752700806},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3433000445365906},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2780359983444214},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.21679523587226868},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0945349633693695}],"concepts":[{"id":"https://openalex.org/C119323957","wikidata":"https://www.wikidata.org/wiki/Q5048226","display_name":"Cascading failure","level":4,"score":0.9547233581542969},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7464945316314697},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7385250926017761},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.5432149171829224},{"id":"https://openalex.org/C34146451","wikidata":"https://www.wikidata.org/wiki/Q5048094","display_name":"Cascade","level":2,"score":0.520179271697998},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.5144317746162415},{"id":"https://openalex.org/C38361682","wikidata":"https://www.wikidata.org/wiki/Q1756067","display_name":"Power-system protection","level":4,"score":0.43730130791664124},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43562036752700806},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3433000445365906},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2780359983444214},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.21679523587226868},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0945349633693695},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2015.2503751","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2015.2503751","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Good health and well-being","id":"https://metadata.un.org/sdg/3","score":0.8500000238418579}],"awards":[],"funders":[{"id":"https://openalex.org/F4320333881","display_name":"Power Systems Engineering Research Center","ror":"https://ror.org/04dam5e61"},{"id":"https://openalex.org/F4320338287","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1981712011","https://openalex.org/W2004750445","https://openalex.org/W2018564483","https://openalex.org/W2033348671","https://openalex.org/W2048786482","https://openalex.org/W2054000184","https://openalex.org/W2054228203","https://openalex.org/W2066074156","https://openalex.org/W2097771670","https://openalex.org/W2106253517","https://openalex.org/W2106716847","https://openalex.org/W2115434812","https://openalex.org/W2122286097","https://openalex.org/W2142702648","https://openalex.org/W2167165818","https://openalex.org/W2169338999","https://openalex.org/W2313171746","https://openalex.org/W2332135664","https://openalex.org/W2382624753","https://openalex.org/W3098782156","https://openalex.org/W6664081038"],"related_works":["https://openalex.org/W2045160738","https://openalex.org/W4321437978","https://openalex.org/W2545853327","https://openalex.org/W2532099551","https://openalex.org/W2336056369","https://openalex.org/W1991416024","https://openalex.org/W2093765635","https://openalex.org/W2050292684","https://openalex.org/W2805537460","https://openalex.org/W4376481015"],"abstract_inverted_index":{"Cascading":[0],"failure":[1,23,60],"models":[2,24],"have":[3],"been":[4],"studied":[5],"more":[6],"recently":[7],"as":[8],"for":[9],"electric":[10],"power":[11],"systems,":[12,50],"epidemics,":[13],"and":[14,63,72],"interdependent":[15],"networks.":[16],"The":[17,37],"current":[18],"paper":[19],"presents":[20],"three":[21],"cascading":[22,59],"in":[25],"the":[26,33,73],"point-view":[27],"of":[28,49,52,55,58],"system":[29,39,45],"reliability":[30,40],"based":[31],"on":[32],"normalized":[34],"CASCADE":[35],"model.":[36],"corresponding":[38],"indices":[41],"are":[42,70,75],"developed":[43],"including":[44],"reliability,":[46],"expectation":[47],"lifetimes":[48],"distributions":[51,57],"total":[53],"number":[54],"failures,":[56],"propagation":[61],"generations,":[62],"other":[64],"related":[65],"probabilities.":[66],"Two":[67],"numerical":[68],"examples":[69],"discussed,":[71],"conclusions":[74],"summarized.":[76]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":11},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":8},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":1}],"updated_date":"2026-03-28T08:17:26.163206","created_date":"2025-10-10T00:00:00"}