{"id":"https://openalex.org/W2342432233","doi":"https://doi.org/10.1109/tr.2015.2499964","title":"A Multivariate Log-Linear Model for Birnbaum-Saunders Distributions","display_name":"A Multivariate Log-Linear Model for Birnbaum-Saunders Distributions","publication_year":2015,"publication_date":"2015-12-25","ids":{"openalex":"https://openalex.org/W2342432233","doi":"https://doi.org/10.1109/tr.2015.2499964","mag":"2342432233"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2015.2499964","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2015.2499964","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068491224","display_name":"Carolina Marchant","orcid":"https://orcid.org/0000-0003-1832-4444"},"institutions":[{"id":"https://openalex.org/I25112270","display_name":"Universidade Federal de Pernambuco","ror":"https://ror.org/047908t24","country_code":"BR","type":"education","lineage":["https://openalex.org/I25112270"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"Carolina Marchant","raw_affiliation_strings":["Universidade Federal de Pernambuco, Brazil"],"affiliations":[{"raw_affiliation_string":"Universidade Federal de Pernambuco, Brazil","institution_ids":["https://openalex.org/I25112270"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037117333","display_name":"V\u00edctor Leiva","orcid":"https://orcid.org/0000-0003-4755-3270"},"institutions":[{"id":"https://openalex.org/I21067949","display_name":"Adolfo Ib\u00e1\u00f1ez University","ror":"https://ror.org/0326knt82","country_code":"CL","type":"education","lineage":["https://openalex.org/I21067949"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Victor Leiva","raw_affiliation_strings":["Faculty of Engineering and Sciences, Universidad Adolfo Ib\u00e1\u00f1ez, Chile"],"affiliations":[{"raw_affiliation_string":"Faculty of Engineering and Sciences, Universidad Adolfo Ib\u00e1\u00f1ez, Chile","institution_ids":["https://openalex.org/I21067949"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023095669","display_name":"Francisco Jos\u00e9 A. Cysneiros","orcid":"https://orcid.org/0000-0001-6757-6969"},"institutions":[{"id":"https://openalex.org/I25112270","display_name":"Universidade Federal de Pernambuco","ror":"https://ror.org/047908t24","country_code":"BR","type":"education","lineage":["https://openalex.org/I25112270"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Francisco Jose A. Cysneiros","raw_affiliation_strings":["Department of Statistics, Universidade Federal de Pernambuco, Brazil"],"affiliations":[{"raw_affiliation_string":"Department of Statistics, Universidade Federal de Pernambuco, Brazil","institution_ids":["https://openalex.org/I25112270"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5068491224"],"corresponding_institution_ids":["https://openalex.org/I25112270"],"apc_list":null,"apc_paid":null,"fwci":5.5934,"has_fulltext":false,"cited_by_count":62,"citation_normalized_percentile":{"value":0.97013726,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"65","issue":"2","first_page":"816","last_page":"827"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10396","display_name":"Fatigue and fracture mechanics","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/multivariate-statistics","display_name":"Multivariate statistics","score":0.8179246783256531},{"id":"https://openalex.org/keywords/univariate","display_name":"Univariate","score":0.7539188265800476},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.6113189458847046},{"id":"https://openalex.org/keywords/estimator","display_name":"Estimator","score":0.6001185774803162},{"id":"https://openalex.org/keywords/maximum-likelihood","display_name":"Maximum likelihood","score":0.5791442394256592},{"id":"https://openalex.org/keywords/maximum-likelihood-sequence-estimation","display_name":"Maximum likelihood sequence estimation","score":0.4862586259841919},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.48234933614730835},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.4823126792907715},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4245816171169281},{"id":"https://openalex.org/keywords/restricted-maximum-likelihood","display_name":"Restricted maximum likelihood","score":0.41787266731262207},{"id":"https://openalex.org/keywords/multivariate-analysis","display_name":"Multivariate analysis","score":0.41281378269195557},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4006779193878174},{"id":"https://openalex.org/keywords/econometrics","display_name":"Econometrics","score":0.3889407515525818},{"id":"https://openalex.org/keywords/applied-mathematics","display_name":"Applied mathematics","score":0.33699876070022583},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.15931165218353271}],"concepts":[{"id":"https://openalex.org/C161584116","wikidata":"https://www.wikidata.org/wiki/Q1952580","display_name":"Multivariate statistics","level":2,"score":0.8179246783256531},{"id":"https://openalex.org/C199163554","wikidata":"https://www.wikidata.org/wiki/Q1681619","display_name":"Univariate","level":3,"score":0.7539188265800476},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.6113189458847046},{"id":"https://openalex.org/C185429906","wikidata":"https://www.wikidata.org/wiki/Q1130160","display_name":"Estimator","level":2,"score":0.6001185774803162},{"id":"https://openalex.org/C49781872","wikidata":"https://www.wikidata.org/wiki/Q1045555","display_name":"Maximum likelihood","level":2,"score":0.5791442394256592},{"id":"https://openalex.org/C191462741","wikidata":"https://www.wikidata.org/wiki/Q6795902","display_name":"Maximum likelihood sequence estimation","level":3,"score":0.4862586259841919},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.48234933614730835},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4823126792907715},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4245816171169281},{"id":"https://openalex.org/C61420037","wikidata":"https://www.wikidata.org/wiki/Q7316301","display_name":"Restricted maximum likelihood","level":3,"score":0.41787266731262207},{"id":"https://openalex.org/C38180746","wikidata":"https://www.wikidata.org/wiki/Q1952580","display_name":"Multivariate analysis","level":2,"score":0.41281378269195557},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4006779193878174},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.3889407515525818},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.33699876070022583},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.15931165218353271},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2015.2499964","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2015.2499964","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322642","display_name":"Universidad de Valpara\u00edso","ror":"https://ror.org/00h9jrb69"},{"id":"https://openalex.org/F4320324901","display_name":"Universidade Federal de Pernambuco","ror":"https://ror.org/047908t24"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":48,"referenced_works":["https://openalex.org/W244508629","https://openalex.org/W568214519","https://openalex.org/W1643300034","https://openalex.org/W1684486532","https://openalex.org/W1963490947","https://openalex.org/W1967639437","https://openalex.org/W1968564236","https://openalex.org/W1969946501","https://openalex.org/W1975644945","https://openalex.org/W1979379786","https://openalex.org/W1985075348","https://openalex.org/W1991567646","https://openalex.org/W2012562551","https://openalex.org/W2020561376","https://openalex.org/W2038102608","https://openalex.org/W2038641100","https://openalex.org/W2040025757","https://openalex.org/W2044205497","https://openalex.org/W2054429985","https://openalex.org/W2055170967","https://openalex.org/W2057166994","https://openalex.org/W2058339967","https://openalex.org/W2060308631","https://openalex.org/W2065391558","https://openalex.org/W2067342226","https://openalex.org/W2072856720","https://openalex.org/W2081156485","https://openalex.org/W2084940370","https://openalex.org/W2092400191","https://openalex.org/W2094524716","https://openalex.org/W2103411940","https://openalex.org/W2107377701","https://openalex.org/W2115931340","https://openalex.org/W2117853077","https://openalex.org/W2118522007","https://openalex.org/W2125955937","https://openalex.org/W2142270948","https://openalex.org/W2146626342","https://openalex.org/W2154570857","https://openalex.org/W2166397424","https://openalex.org/W2416030412","https://openalex.org/W3121970376","https://openalex.org/W4211128380","https://openalex.org/W4231625102","https://openalex.org/W4293775970","https://openalex.org/W4300060217","https://openalex.org/W4300246981","https://openalex.org/W6678935497"],"related_works":["https://openalex.org/W2808306767","https://openalex.org/W1547579891","https://openalex.org/W2965351525","https://openalex.org/W4243231361","https://openalex.org/W2886057590","https://openalex.org/W2068113462","https://openalex.org/W2149783974","https://openalex.org/W2518129906","https://openalex.org/W2349757313","https://openalex.org/W4246901729"],"abstract_inverted_index":{"Univariate":[0],"Birnbaum-Saunders":[1,31],"models":[2,68],"have":[3],"been":[4],"widely":[5],"applied":[6],"to":[7,44,54],"fatigue":[8,12,72],"studies.":[9],"Calculation":[10],"of":[11,15,22,58],"life":[13],"is":[14],"great":[16],"importance":[17],"in":[18],"determining":[19],"the":[20,36,41,56,59,66],"reliability":[21],"materials.":[23],"We":[24,34,48,64],"propose":[25],"and":[26,40],"derive":[27],"new":[28,67],"multivariate":[29,71],"generalized":[30],"regression":[32],"models.":[33],"use":[35],"maximum":[37,61],"likelihood":[38,62],"method":[39],"EM":[42],"algorithm":[43],"estimate":[45],"their":[46],"parameters.":[47],"carry":[49],"out":[50],"a":[51],"simulation":[52],"study":[53],"evaluate":[55],"performance":[57],"corresponding":[60],"estimators.":[63],"illustrate":[65],"with":[69],"real-world":[70],"data.":[73]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":10},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":6}],"updated_date":"2026-04-17T18:11:37.981687","created_date":"2025-10-10T00:00:00"}