{"id":"https://openalex.org/W2180167820","doi":"https://doi.org/10.1109/tr.2015.2464011","title":"A Low-Cost Unified Design Methodology for Secure Test and Intellectual Property Core Protection","display_name":"A Low-Cost Unified Design Methodology for Secure Test and Intellectual Property Core Protection","publication_year":2015,"publication_date":"2015-08-14","ids":{"openalex":"https://openalex.org/W2180167820","doi":"https://doi.org/10.1109/tr.2015.2464011","mag":"2180167820"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2015.2464011","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2015.2464011","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077777787","display_name":"Rishad Shafik","orcid":"https://orcid.org/0000-0001-5444-537X"},"institutions":[{"id":"https://openalex.org/I43439940","display_name":"University of Southampton","ror":"https://ror.org/01ryk1543","country_code":"GB","type":"education","lineage":["https://openalex.org/I43439940"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Rishad A. Shafik","raw_affiliation_strings":["University of Southampton, School of Electronics and Computer Science (ECS), UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Southampton, School of Electronics and Computer Science (ECS), UK","institution_ids":["https://openalex.org/I43439940"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081683515","display_name":"Jimson Mathew","orcid":"https://orcid.org/0000-0001-8247-9040"},"institutions":[{"id":"https://openalex.org/I36234482","display_name":"University of Bristol","ror":"https://ror.org/0524sp257","country_code":"GB","type":"education","lineage":["https://openalex.org/I36234482"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Jimson Mathew","raw_affiliation_strings":["Microelectronics Research Group in the Department of Computer Science, University of Bristol, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronics Research Group in the Department of Computer Science, University of Bristol, UK","institution_ids":["https://openalex.org/I36234482"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113458314","display_name":"Dhiraj K. Pradhan","orcid":null},"institutions":[{"id":"https://openalex.org/I36234482","display_name":"University of Bristol","ror":"https://ror.org/0524sp257","country_code":"GB","type":"education","lineage":["https://openalex.org/I36234482"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Dhiraj K. Pradhan","raw_affiliation_strings":["Microelectronics Research Group in the Department of Computer Science, University of Bristol, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronics Research Group in the Department of Computer Science, University of Bristol, UK","institution_ids":["https://openalex.org/I36234482"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9883,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.7693437,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"64","issue":"4","first_page":"1243","last_page":"1253"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6001702547073364},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.5345671772956848},{"id":"https://openalex.org/keywords/electronic-design-automation","display_name":"Electronic design automation","score":0.5316479802131653},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.51233971118927},{"id":"https://openalex.org/keywords/design-methods","display_name":"Design methods","score":0.4888879358768463},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.47919735312461853},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.45327556133270264},{"id":"https://openalex.org/keywords/advanced-encryption-standard","display_name":"Advanced Encryption Standard","score":0.44468769431114197},{"id":"https://openalex.org/keywords/encryption","display_name":"Encryption","score":0.4426320195198059},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.42059215903282166},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.4141746461391449},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.36692243814468384},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.2775932550430298},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24930569529533386}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6001702547073364},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.5345671772956848},{"id":"https://openalex.org/C64260653","wikidata":"https://www.wikidata.org/wiki/Q1194864","display_name":"Electronic design automation","level":2,"score":0.5316479802131653},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.51233971118927},{"id":"https://openalex.org/C138852830","wikidata":"https://www.wikidata.org/wiki/Q2292993","display_name":"Design methods","level":2,"score":0.4888879358768463},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.47919735312461853},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.45327556133270264},{"id":"https://openalex.org/C94520183","wikidata":"https://www.wikidata.org/wiki/Q190746","display_name":"Advanced Encryption Standard","level":3,"score":0.44468769431114197},{"id":"https://openalex.org/C148730421","wikidata":"https://www.wikidata.org/wiki/Q141090","display_name":"Encryption","level":2,"score":0.4426320195198059},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.42059215903282166},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.4141746461391449},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.36692243814468384},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.2775932550430298},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24930569529533386},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tr.2015.2464011","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2015.2464011","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},{"id":"pmh:oai:research-information.bris.ac.uk:openaire_cris_publications/86bed452-5651-418a-a11b-e801c6afa5a3","is_oa":false,"landing_page_url":"https://research-information.bris.ac.uk/en/publications/86bed452-5651-418a-a11b-e801c6afa5a3","pdf_url":null,"source":{"id":"https://openalex.org/S7407055359","display_name":"Explore Bristol Research","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Shafik, R A, Mathew, J & Pradhan, D K 2015, 'A Low-Cost Unified Design Methodology for Secure Test and Intellectual Property Core Protection', IEEE Transactions on Reliability, vol. 64, no. 4, pp. 1243-1253. https://doi.org/10.1109/TR.2015.2464011","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:eprints.soton.ac.uk:371898","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306401019","display_name":"ePrints Soton (University of Southampton)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I43439940","host_organization_name":"University of Southampton","host_organization_lineage":["https://openalex.org/I43439940"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6899999976158142,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G1960348712","display_name":null,"funder_award_id":"EP/F030991/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1613874182","https://openalex.org/W1664227763","https://openalex.org/W1760668579","https://openalex.org/W1829732909","https://openalex.org/W1951557763","https://openalex.org/W1968452000","https://openalex.org/W1978060422","https://openalex.org/W1988381220","https://openalex.org/W2000179366","https://openalex.org/W2010903499","https://openalex.org/W2012725064","https://openalex.org/W2101017779","https://openalex.org/W2106409910","https://openalex.org/W2108987401","https://openalex.org/W2135211381","https://openalex.org/W2142537526","https://openalex.org/W2143180464","https://openalex.org/W2147767253","https://openalex.org/W2154909745","https://openalex.org/W2156692142","https://openalex.org/W2166778460","https://openalex.org/W2167621131","https://openalex.org/W2247495430","https://openalex.org/W2285620640","https://openalex.org/W2767699775","https://openalex.org/W3146245284","https://openalex.org/W6636388380","https://openalex.org/W6641082672","https://openalex.org/W6675186622","https://openalex.org/W6675797392","https://openalex.org/W6681113282","https://openalex.org/W6684544287","https://openalex.org/W6745699319"],"related_works":["https://openalex.org/W3011978806","https://openalex.org/W2743305891","https://openalex.org/W3205162826","https://openalex.org/W2059530328","https://openalex.org/W3207169898","https://openalex.org/W2489638043","https://openalex.org/W2951650892","https://openalex.org/W2331259470","https://openalex.org/W1596716095","https://openalex.org/W2009503188"],"abstract_inverted_index":{"On-chip":[0],"security":[1],"is":[2,20,92,109],"an":[3,115],"emerging":[4],"challenge":[5,19],"in":[6,42,111],"the":[7,77,98,112,126,135,171],"design":[8,25,29,33,50,63,100,117,128,140,159,163,184],"of":[9,31,80,137,145,173],"embedded":[10],"systems":[11,150],"with":[12,27,165,182],"intellectual":[13],"property":[14],"(IP)":[15],"cores.":[16],"Traditionally":[17],"this":[18,43,57,90],"addressed":[21],"using":[22],"ad":[23],"hoc":[24],"techniques":[26],"separate":[28],"objectives":[30],"secure":[32,85],"for":[34],"testability":[35],"(DfT),":[36],"and":[37,68,84,168,176],"IP":[38,69,81],"core":[39,70,82],"protection.":[40],"However,":[41],"paper,":[44],"we":[45,59],"will":[46],"argue":[47],"that":[48,89,156],"such":[49],"approaches":[51],"can":[52,121],"incur":[53],"high":[54,166],"costs.":[55],"Underpinning":[56],"argument,":[58],"propose":[60],"a":[61,95],"novel":[62],"methodology,":[64],"called":[65],"Secure":[66],"TEst":[67],"Protection":[71],"(STEP),":[72],"which":[73,120],"aims":[74],"to":[75],"address":[76],"joint":[78],"objective":[79,91],"protection":[83,169],"testing.":[86],"To":[87],"ensure":[88],"achieved":[93],"at":[94,170],"low":[96,174],"cost,":[97],"STEP":[99],"methodology":[101,141,160],"employs":[102],"common":[103],"key":[104],"integrated":[105],"hardware.":[106],"This":[107],"hardware":[108],"incorporated":[110],"system":[113],"through":[114],"automated":[116],"conversion":[118],"technique,":[119],"be":[122],"easily":[123],"merged":[124],"into":[125],"electronic":[127],"automation":[129,164],"(EDA)":[130],"tool":[131],"chain.":[132],"We":[133,154],"evaluate":[134],"effectiveness":[136],"our":[138,157],"proposed":[139,158],"considering":[142],"various":[143],"implementations":[144],"advanced":[146],"encryption":[147],"standard":[148],"(AES)":[149],"as":[151],"case":[152],"studies.":[153],"show":[155],"benefits":[161],"from":[162],"security,":[167],"cost":[172],"area,":[175],"power":[177],"consumption":[178],"overheads,":[179],"when":[180],"compared":[181],"traditional":[183],"methodologies.":[185]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}