{"id":"https://openalex.org/W2187147423","doi":"https://doi.org/10.1109/tr.2015.2451074","title":"A Hierarchical Model for Lithium-Ion Battery Degradation Prediction","display_name":"A Hierarchical Model for Lithium-Ion Battery Degradation Prediction","publication_year":2015,"publication_date":"2015-07-30","ids":{"openalex":"https://openalex.org/W2187147423","doi":"https://doi.org/10.1109/tr.2015.2451074","mag":"2187147423"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2015.2451074","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2015.2451074","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053112608","display_name":"Xin Xu","orcid":"https://orcid.org/0000-0003-3238-745X"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Xin Xu","raw_affiliation_strings":["Department of Industrial and Systems Engineering, National University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial and Systems Engineering, National University, Singapore","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100437412","display_name":"Zhiguo Li","orcid":"https://orcid.org/0000-0002-3834-9801"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhiguo Li","raw_affiliation_strings":["statistics and data science, IBM T. J. Watson Research Center"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"statistics and data science, IBM T. J. Watson Research Center","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100442866","display_name":"Nan Chen","orcid":"https://orcid.org/0000-0003-2495-5234"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Nan Chen","raw_affiliation_strings":["Department of Industrial and Systems Engineering, National University, Singapore"],"raw_orcid":"https://orcid.org/0000-0003-2495-5234","affiliations":[{"raw_affiliation_string":"Department of Industrial and Systems Engineering, National University, Singapore","institution_ids":["https://openalex.org/I165932596"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.3723,"has_fulltext":false,"cited_by_count":51,"citation_normalized_percentile":{"value":0.94290432,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"65","issue":"1","first_page":"310","last_page":"325"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10018","display_name":"Advancements in Battery Materials","score":0.9886000156402588,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.98580002784729,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/prognostics","display_name":"Prognostics","score":0.9121854305267334},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.7734256982803345},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6511768102645874},{"id":"https://openalex.org/keywords/battery","display_name":"Battery (electricity)","score":0.5953101515769958},{"id":"https://openalex.org/keywords/lithium","display_name":"Lithium (medication)","score":0.565345823764801},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5026061534881592},{"id":"https://openalex.org/keywords/lithium-ion-battery","display_name":"Lithium-ion battery","score":0.4549810290336609},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.45069676637649536},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28139692544937134},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1451621949672699},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07914173603057861},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.07109418511390686}],"concepts":[{"id":"https://openalex.org/C129364497","wikidata":"https://www.wikidata.org/wiki/Q3042561","display_name":"Prognostics","level":2,"score":0.9121854305267334},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7734256982803345},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6511768102645874},{"id":"https://openalex.org/C555008776","wikidata":"https://www.wikidata.org/wiki/Q267298","display_name":"Battery (electricity)","level":3,"score":0.5953101515769958},{"id":"https://openalex.org/C2778541603","wikidata":"https://www.wikidata.org/wiki/Q152763","display_name":"Lithium (medication)","level":2,"score":0.565345823764801},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5026061534881592},{"id":"https://openalex.org/C2779197387","wikidata":"https://www.wikidata.org/wiki/Q2822895","display_name":"Lithium-ion battery","level":4,"score":0.4549810290336609},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.45069676637649536},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28139692544937134},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1451621949672699},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07914173603057861},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.07109418511390686},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C134018914","wikidata":"https://www.wikidata.org/wiki/Q162606","display_name":"Endocrinology","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2015.2451074","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2015.2451074","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1483622599","https://openalex.org/W1536497620","https://openalex.org/W1981460882","https://openalex.org/W1997318672","https://openalex.org/W2007536021","https://openalex.org/W2007655149","https://openalex.org/W2007672025","https://openalex.org/W2017136542","https://openalex.org/W2020776245","https://openalex.org/W2037090498","https://openalex.org/W2070111889","https://openalex.org/W2078279667","https://openalex.org/W2085942406","https://openalex.org/W2105190347","https://openalex.org/W2126770114","https://openalex.org/W2127342270","https://openalex.org/W2144352195","https://openalex.org/W2157714590","https://openalex.org/W2165344987","https://openalex.org/W4206049327","https://openalex.org/W4236649012","https://openalex.org/W4395108399","https://openalex.org/W6864549258"],"related_works":["https://openalex.org/W2995074223","https://openalex.org/W2357719166","https://openalex.org/W4224246090","https://openalex.org/W3165173190","https://openalex.org/W4388039502","https://openalex.org/W2080384327","https://openalex.org/W2159458361","https://openalex.org/W3161330592","https://openalex.org/W2274723115","https://openalex.org/W3089487084"],"abstract_inverted_index":{"Developing":[0],"prognostics":[1],"and":[2,47,59,74],"health":[3],"management":[4],"(PHM)":[5],"approaches":[6],"for":[7],"lithium-ion":[8,26],"batteries":[9],"has":[10],"received":[11],"increasing":[12],"attention":[13],"in":[14,35,56],"recent":[15],"years.":[16],"This":[17],"paper":[18],"presents":[19],"a":[20,41,66],"new":[21],"modeling":[22],"framework":[23],"to":[24,50,70],"characterize":[25],"battery":[27],"degradation":[28,48],"by":[29],"examining":[30],"detailed":[31],"discharging":[32,37,45],"voltage":[33],"profiles":[34],"different":[36,57],"cycles.":[38],"We":[39,64],"propose":[40],"hierarchical":[42],"model,":[43],"combining":[44],"processes":[46],"processes,":[49],"predict":[51],"the":[52,72,78],"end":[53],"of":[54,77],"discharges":[55],"cycles":[58,62],"remaining":[60],"useful":[61],"integratively.":[63],"use":[65],"real":[67],"case":[68],"study":[69],"demonstrate":[71],"effectiveness":[73],"promising":[75],"features":[76],"proposed":[79],"framework.":[80]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":9},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}