{"id":"https://openalex.org/W2019865872","doi":"https://doi.org/10.1109/tr.2015.2417171","title":"A New Degradation Indicator Based on a Statistical Anomaly Approach","display_name":"A New Degradation Indicator Based on a Statistical Anomaly Approach","publication_year":2015,"publication_date":"2015-04-22","ids":{"openalex":"https://openalex.org/W2019865872","doi":"https://doi.org/10.1109/tr.2015.2417171","mag":"2019865872"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2015.2417171","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2015.2417171","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060534675","display_name":"Jo\u00e3o P. P. Gomes","orcid":"https://orcid.org/0000-0003-1686-595X"},"institutions":[{"id":"https://openalex.org/I243754102","display_name":"Universidade Federal do Cear\u00e1","ror":"https://ror.org/03srtnf24","country_code":"BR","type":"education","lineage":["https://openalex.org/I243754102"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Joao Paulo Pordeus Gomes","raw_affiliation_strings":["Department of Computer Science, Universidade Federal do Cear\u00e1, Fortaleza, CE, Brazil","[Department of Computer Science, Universidade Federal do Cear\u00e1, Fortaleza, Brazil]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Universidade Federal do Cear\u00e1, Fortaleza, CE, Brazil","institution_ids":["https://openalex.org/I243754102"]},{"raw_affiliation_string":"[Department of Computer Science, Universidade Federal do Cear\u00e1, Fortaleza, Brazil]","institution_ids":["https://openalex.org/I243754102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027760931","display_name":"Roberto Kawakami Harrop Galv\u00e3o","orcid":"https://orcid.org/0000-0001-9794-8815"},"institutions":[{"id":"https://openalex.org/I107428990","display_name":"Instituto Tecnol\u00f3gico de Aeron\u00e1utica","ror":"https://ror.org/05vh67662","country_code":"BR","type":"education","lineage":["https://openalex.org/I107428990"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Roberto Kawakami Harrop Galvao","raw_affiliation_strings":["Department of Electronic Engineering, Instituto Tecnol\u00f3gico de Aeron\u00e1utica, SP, Brazil","Department of Electronic Engineering, Instituto Tecnol\u00f3gico de Aeron\u00e1utica, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Instituto Tecnol\u00f3gico de Aeron\u00e1utica, SP, Brazil","institution_ids":["https://openalex.org/I107428990"]},{"raw_affiliation_string":"Department of Electronic Engineering, Instituto Tecnol\u00f3gico de Aeron\u00e1utica, Brazil","institution_ids":["https://openalex.org/I107428990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007059703","display_name":"Takashi Yoneyama","orcid":"https://orcid.org/0000-0001-5375-1076"},"institutions":[{"id":"https://openalex.org/I107428990","display_name":"Instituto Tecnol\u00f3gico de Aeron\u00e1utica","ror":"https://ror.org/05vh67662","country_code":"BR","type":"education","lineage":["https://openalex.org/I107428990"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Takashi Yoneyama","raw_affiliation_strings":["Department of Electronic Engineering, Instituto Tecnol\u00f3gico de Aeron\u00e1utica, SP, Brazil","Department of Electronic Engineering, Instituto Tecnol\u00f3gico de Aeron\u00e1utica, S\u00e3o Jos\u00e9 dos Campos, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Instituto Tecnol\u00f3gico de Aeron\u00e1utica, SP, Brazil","institution_ids":["https://openalex.org/I107428990"]},{"raw_affiliation_string":"Department of Electronic Engineering, Instituto Tecnol\u00f3gico de Aeron\u00e1utica, S\u00e3o Jos\u00e9 dos Campos, Brazil","institution_ids":["https://openalex.org/I107428990"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108831088","display_name":"Bruno P. Le\u00e3o","orcid":null},"institutions":[{"id":"https://openalex.org/I4210134512","display_name":"GE Global Research (United States)","ror":"https://ror.org/03e06qt98","country_code":"US","type":"company","lineage":["https://openalex.org/I4210134512"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bruno P. Leao","raw_affiliation_strings":["GE Global Research, Brazil Technology Center, Rio de Janeiro, RJ, Brazil","GE Global Research, Brazil Technology Center, Rio de Janeiro, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"GE Global Research, Brazil Technology Center, Rio de Janeiro, RJ, Brazil","institution_ids":["https://openalex.org/I4210134512"]},{"raw_affiliation_string":"GE Global Research, Brazil Technology Center, Rio de Janeiro, Brazil","institution_ids":["https://openalex.org/I4210134512"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.7331,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.92129796,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"65","issue":"1","first_page":"326","last_page":"335"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.6488263010978699},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4708060026168823},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4416859447956085},{"id":"https://openalex.org/keywords/statistical-analysis","display_name":"Statistical analysis","score":0.43700024485588074},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.33510518074035645},{"id":"https://openalex.org/keywords/statistical-physics","display_name":"Statistical physics","score":0.32361388206481934},{"id":"https://openalex.org/keywords/environmental-science","display_name":"Environmental science","score":0.32269689440727234},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23896202445030212},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2326584756374359},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.143449604511261}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6488263010978699},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4708060026168823},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4416859447956085},{"id":"https://openalex.org/C2986587452","wikidata":"https://www.wikidata.org/wiki/Q938438","display_name":"Statistical analysis","level":2,"score":0.43700024485588074},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.33510518074035645},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.32361388206481934},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.32269689440727234},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23896202445030212},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2326584756374359},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.143449604511261},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2015.2417171","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2015.2417171","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/12","score":0.47999998927116394,"display_name":"Responsible consumption and production"}],"awards":[{"id":"https://openalex.org/G4811884565","display_name":null,"funder_award_id":"2011/17610-0","funder_id":"https://openalex.org/F4320320997","funder_display_name":"Funda\u00e7\u00e3o de Amparo \u00e0 Pesquisa do Estado de S\u00e3o Paulo"}],"funders":[{"id":"https://openalex.org/F4320320997","display_name":"Funda\u00e7\u00e3o de Amparo \u00e0 Pesquisa do Estado de S\u00e3o Paulo","ror":"https://ror.org/02ddkpn78"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W53502161","https://openalex.org/W341626899","https://openalex.org/W591732527","https://openalex.org/W1990894243","https://openalex.org/W2004929978","https://openalex.org/W2022715465","https://openalex.org/W2031366272","https://openalex.org/W2033550732","https://openalex.org/W2035866593","https://openalex.org/W2039509757","https://openalex.org/W2049633694","https://openalex.org/W2065336287","https://openalex.org/W2071128523","https://openalex.org/W2079441011","https://openalex.org/W2083512854","https://openalex.org/W2094979765","https://openalex.org/W2119683791","https://openalex.org/W2127918592","https://openalex.org/W2157825442","https://openalex.org/W2166042538","https://openalex.org/W2168175751","https://openalex.org/W2168453764","https://openalex.org/W2397632067","https://openalex.org/W2470483478","https://openalex.org/W3143636389","https://openalex.org/W4238805501","https://openalex.org/W4249625715","https://openalex.org/W4251645482","https://openalex.org/W4298266977","https://openalex.org/W6712439010","https://openalex.org/W6792692314"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W4289655666","https://openalex.org/W2152540334","https://openalex.org/W1991904898","https://openalex.org/W2359257129","https://openalex.org/W2163134521","https://openalex.org/W2360594331","https://openalex.org/W2352135202","https://openalex.org/W2141669750","https://openalex.org/W2579783051"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,11,73,80,113],"new":[4],"method":[5,115,126],"for":[6,14,44,67,139],"combining":[7],"measured":[8],"parameters":[9],"into":[10,35],"single":[12],"indicator":[13],"monitoring":[15,71],"the":[16,28,45,70,124,128],"condition":[17],"of":[18,30,47,72,118,133],"systems":[19],"subjected":[20],"to":[21,53],"degradation":[22,54,91],"effects.":[23],"The":[24],"proposed":[25,125],"approach":[26],"integrates":[27],"use":[29],"nonparametric":[31,114],"density":[32],"estimation":[33],"techniques":[34],"Runger's":[36,104],"U":[37,105],"<sup":[38,100,106],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[39,101,107],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[40,102,108],"method,":[41],"which":[42,58],"allows":[43],"separation":[46,117],"variables":[48],"that":[49],"are":[50,59,65,93],"directly":[51],"related":[52],"effects":[55],"from":[56],"those":[57],"not.":[60],"Two":[61],"simulated":[62],"case":[63,122],"studies":[64],"presented":[66],"illustration,":[68],"namely,":[69],"flap":[74],"extension":[75],"and":[76,79,103,137],"retraction":[77],"system,":[78],"gas":[81],"turbine":[82],"employed":[83],"as":[84,110,112],"an":[85],"auxiliary":[86],"power":[87],"unit.":[88],"For":[89],"comparison,":[90],"indicators":[92],"also":[94],"calculated":[95],"by":[96],"using":[97],"Hotteling's":[98],"T":[99],"methods,":[109],"well":[111],"without":[116],"variables.":[119],"In":[120],"both":[121],"studies,":[123],"provided":[127],"best":[129],"results":[130],"in":[131],"terms":[132],"fault":[134],"detection":[135],"performance":[136],"suitability":[138],"remaining":[140],"useful":[141],"life":[142],"prediction.":[143]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}