{"id":"https://openalex.org/W2094028369","doi":"https://doi.org/10.1109/tr.2014.2355514","title":"Effect of Failure Propagation on Cold vs. Hot Standby Tradeoff in Heterogeneous 1-Out-of-<formula formulatype=\"inline\"><tex Notation=\"TeX\">$N$</tex></formula>:G Systems","display_name":"Effect of Failure Propagation on Cold vs. Hot Standby Tradeoff in Heterogeneous 1-Out-of-<formula formulatype=\"inline\"><tex Notation=\"TeX\">$N$</tex></formula>:G Systems","publication_year":2014,"publication_date":"2014-09-11","ids":{"openalex":"https://openalex.org/W2094028369","doi":"https://doi.org/10.1109/tr.2014.2355514","mag":"2094028369"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2014.2355514","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2014.2355514","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022208409","display_name":"Gregory Levitin","orcid":"https://orcid.org/0000-0002-2107-8291"},"institutions":[{"id":"https://openalex.org/I80687555","display_name":"Israel Electric (Israel)","ror":"https://ror.org/01p8dnv11","country_code":"IL","type":"company","lineage":["https://openalex.org/I80687555"]},{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN","IL"],"is_corresponding":true,"raw_author_name":"Gregory Levitin","raw_affiliation_strings":["Collaborative Autonomic Computing Laboratory, University of Electronic Science and Technology of China","Israel Electric Corporation, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Collaborative Autonomic Computing Laboratory, University of Electronic Science and Technology of China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Israel Electric Corporation, Haifa, Israel","institution_ids":["https://openalex.org/I80687555"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114377940","display_name":"Liudong Xing","orcid":"https://orcid.org/0000-0003-1606-1644"},"institutions":[{"id":"https://openalex.org/I100633361","display_name":"University of Massachusetts Dartmouth","ror":"https://ror.org/00fzmm222","country_code":"US","type":"education","lineage":["https://openalex.org/I100633361"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Liudong Xing","raw_affiliation_strings":["University of Massachusetts, Dartmouth, MA, USA"],"affiliations":[{"raw_affiliation_string":"University of Massachusetts, Dartmouth, MA, USA","institution_ids":["https://openalex.org/I100633361"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034860356","display_name":"Hanoch Ben-Haim","orcid":null},"institutions":[{"id":"https://openalex.org/I80687555","display_name":"Israel Electric (Israel)","ror":"https://ror.org/01p8dnv11","country_code":"IL","type":"company","lineage":["https://openalex.org/I80687555"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Hanoch Ben-Haim","raw_affiliation_strings":["Israel Electric Corporation, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Israel Electric Corporation, Haifa, Israel","institution_ids":["https://openalex.org/I80687555"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113616242","display_name":"Yuanshun Dai","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanshun Dai","raw_affiliation_strings":["Collaborative Autonomic Computing Laboratory, University of Electronic Science and Technology of China"],"affiliations":[{"raw_affiliation_string":"Collaborative Autonomic Computing Laboratory, University of Electronic Science and Technology of China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5022208409"],"corresponding_institution_ids":["https://openalex.org/I150229711","https://openalex.org/I80687555"],"apc_list":null,"apc_paid":null,"fwci":6.5254,"has_fulltext":false,"cited_by_count":29,"citation_normalized_percentile":{"value":0.95999563,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"64","issue":"1","first_page":"410","last_page":"419"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7292155623435974},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6649551391601562},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5181373357772827},{"id":"https://openalex.org/keywords/optimization-problem","display_name":"Optimization problem","score":0.44369906187057495},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4155275523662567},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3947684168815613},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.19294846057891846},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.09703022241592407}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7292155623435974},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6649551391601562},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5181373357772827},{"id":"https://openalex.org/C137836250","wikidata":"https://www.wikidata.org/wiki/Q984063","display_name":"Optimization problem","level":2,"score":0.44369906187057495},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4155275523662567},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3947684168815613},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.19294846057891846},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.09703022241592407},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2014.2355514","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2014.2355514","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6200000047683716,"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1523087909","https://openalex.org/W1972933745","https://openalex.org/W1977551002","https://openalex.org/W1985188459","https://openalex.org/W2006838288","https://openalex.org/W2014500386","https://openalex.org/W2027404203","https://openalex.org/W2028837311","https://openalex.org/W2033724226","https://openalex.org/W2033997465","https://openalex.org/W2039110805","https://openalex.org/W2051289505","https://openalex.org/W2067708377","https://openalex.org/W2068321037","https://openalex.org/W2076191301","https://openalex.org/W2082839354","https://openalex.org/W2087696187","https://openalex.org/W2088702111","https://openalex.org/W2093551656","https://openalex.org/W2099235649","https://openalex.org/W2116827549","https://openalex.org/W2123608693","https://openalex.org/W2129734500","https://openalex.org/W2132032636","https://openalex.org/W2133118104","https://openalex.org/W2148606018","https://openalex.org/W2165046421","https://openalex.org/W2166197433","https://openalex.org/W2312852230","https://openalex.org/W3023540311"],"related_works":["https://openalex.org/W2374901194","https://openalex.org/W2033512842","https://openalex.org/W2994319598","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3116237489","https://openalex.org/W1607054433"],"abstract_inverted_index":{"This":[0],"paper":[1],"considers":[2],"1-out-of-":[3,126],"N:G":[4,127],"heterogeneous":[5],"fault-tolerant":[6],"systems":[7,128],"that":[8,85,195],"are":[9,41,144,233,260],"designed":[10],"with":[11,129],"a":[12,88,114,193,207,240],"mix":[13],"of":[14,29,53,96,125,152,164,202,210,215,244],"hot":[15,44,131,168],"and":[16,26,45,49,65,79,121,132,136,157],"cold":[17,46,56,133,173],"standby":[18,30,47,57,76,169,174,257],"redundancies":[19],"to":[20,72,104,192],"achieve":[21],"the":[22,35,39,50,55,62,74,94,102,105,119,150,154,162,187,198,203,211,216,221,230,245,255,264,270],"tradeoff":[23,242],"between":[24,43],"restoration":[25],"operation":[27],"costs":[28],"elements.":[31,175],"In":[32,108],"such":[33],"systems,":[34,247],"way":[36],"in":[37,87,250],"which":[38,100],"elements":[40,58,170],"distributed":[42],"groups":[48],"initiation":[51],"sequence":[52],"all":[54,153],"can":[59,91,196,238],"greatly":[60],"affect":[61],"system":[63,89,98,155,204,212,222],"reliability":[64,120],"mission":[66,123,200,225],"cost.":[67],"Therefore,":[68],"it":[69],"is":[70,179],"significant":[71],"solve":[73],"optimal":[75,251],"element":[77,90,147,159],"distributing":[78],"sequencing":[80],"problem":[81,266],"(SE-DSP).":[82],"The":[83,235],"failure":[84,141,148,160,217],"occurs":[86],"propagate,":[92],"causing":[93,149,161],"outage":[95,151,163],"other":[97],"elements,":[99,156],"complicates":[101],"solution":[103,194,272],"SE-DSP":[106,189],"problem.":[107],"this":[109],"paper,":[110],"we":[111],"first":[112],"propose":[113],"numerical":[115],"method":[116],"for":[117,185,262],"evaluating":[118],"expected":[122,199,224],"cost":[124,201],"mixed":[130],"redundancy":[134],"types":[135],"propagated":[137],"failures.":[138],"Two":[139],"different":[140],"propagation":[142,218],"modes":[143],"considered:":[145],"an":[146,158,182],"only":[165],"working":[166],"or":[167],"but":[171],"not":[172],"A":[176],"genetic":[177],"algorithm":[178],"utilized":[180],"as":[181,227,229,267,269],"optimization":[183,231],"tool":[184],"solving":[186],"formulated":[188],"problem,":[190],"leading":[191],"minimize":[197],"while":[205],"providing":[206],"desired":[208],"level":[209],"reliability.":[213],"Effects":[214],"probability":[219],"on":[220],"reliability,":[223],"cost,":[226],"well":[228,268],"results":[232],"investigated.":[234],"suggested":[236],"methodology":[237],"facilitate":[239],"reliability-cost":[241],"study":[243],"considered":[246,265],"thus":[248],"assisting":[249],"decision":[252],"making":[253],"regarding":[254],"system's":[256],"policy.":[258],"Examples":[259],"provided":[261],"illustrating":[263],"proposed":[271],"methodology.":[273]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}