{"id":"https://openalex.org/W2014702705","doi":"https://doi.org/10.1109/tr.2014.2315952","title":"Decision-Theoretical Model for Failures Which are Tackled by Countermeasures","display_name":"Decision-Theoretical Model for Failures Which are Tackled by Countermeasures","publication_year":2014,"publication_date":"2014-04-14","ids":{"openalex":"https://openalex.org/W2014702705","doi":"https://doi.org/10.1109/tr.2014.2315952","mag":"2014702705"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2014.2315952","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2014.2315952","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011963037","display_name":"Daniel Kurz","orcid":null},"institutions":[{"id":"https://openalex.org/I4210166741","display_name":"University of Klagenfurt","ror":"https://ror.org/05q9m0937","country_code":"AT","type":"education","lineage":["https://openalex.org/I4210166741"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Daniel Kurz","raw_affiliation_strings":["Department of Statistics, University of Klagenfurt, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Statistics, University of Klagenfurt, Austria","institution_ids":["https://openalex.org/I4210166741"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053273322","display_name":"Horst Lewitschnig","orcid":"https://orcid.org/0000-0002-5752-429X"},"institutions":[{"id":"https://openalex.org/I4210131793","display_name":"Infineon Technologies (Austria)","ror":"https://ror.org/03msng824","country_code":"AT","type":"company","lineage":["https://openalex.org/I137594350","https://openalex.org/I4210131793"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Horst Lewitschnig","raw_affiliation_strings":["Infineon Technologies Austria AG","Infineon Technologies, Austria AG"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Infineon Technologies Austria AG","institution_ids":["https://openalex.org/I4210131793"]},{"raw_affiliation_string":"Infineon Technologies, Austria AG","institution_ids":["https://openalex.org/I4210131793"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086682451","display_name":"J\u00fcrgen Pilz","orcid":"https://orcid.org/0000-0001-9365-4916"},"institutions":[{"id":"https://openalex.org/I4210166741","display_name":"University of Klagenfurt","ror":"https://ror.org/05q9m0937","country_code":"AT","type":"education","lineage":["https://openalex.org/I4210166741"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Jurgen Pilz","raw_affiliation_strings":["Department of Statistics, University of Klagenfurt, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Statistics, University of Klagenfurt, Austria","institution_ids":["https://openalex.org/I4210166741"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.4779,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.8545922,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"63","issue":"2","first_page":"583","last_page":"592"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/burn-in","display_name":"Burn-in","score":0.7513933181762695},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.751101016998291},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7062982320785522},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5767419338226318},{"id":"https://openalex.org/keywords/countermeasure","display_name":"Countermeasure","score":0.5642129182815552},{"id":"https://openalex.org/keywords/convolution","display_name":"Convolution (computer science)","score":0.4888138473033905},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4604334235191345},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26623132824897766},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.22137567400932312},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.08969807624816895}],"concepts":[{"id":"https://openalex.org/C179707776","wikidata":"https://www.wikidata.org/wiki/Q662895","display_name":"Burn-in","level":2,"score":0.7513933181762695},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.751101016998291},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7062982320785522},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5767419338226318},{"id":"https://openalex.org/C21593369","wikidata":"https://www.wikidata.org/wiki/Q1032176","display_name":"Countermeasure","level":2,"score":0.5642129182815552},{"id":"https://openalex.org/C45347329","wikidata":"https://www.wikidata.org/wiki/Q5166604","display_name":"Convolution (computer science)","level":3,"score":0.4888138473033905},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4604334235191345},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26623132824897766},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.22137567400932312},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.08969807624816895},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2014.2315952","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2014.2315952","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5,"id":"https://metadata.un.org/sdg/12","display_name":"Responsible consumption and production"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W25396208","https://openalex.org/W199690121","https://openalex.org/W318177599","https://openalex.org/W378528803","https://openalex.org/W1523141340","https://openalex.org/W1524800038","https://openalex.org/W1786463175","https://openalex.org/W1966188272","https://openalex.org/W1983276518","https://openalex.org/W1988520084","https://openalex.org/W2039018341","https://openalex.org/W2070552259","https://openalex.org/W2097073560","https://openalex.org/W2102673935","https://openalex.org/W2106290576","https://openalex.org/W2106578604","https://openalex.org/W2108202086","https://openalex.org/W2112546215","https://openalex.org/W2115954415","https://openalex.org/W2122191042","https://openalex.org/W2127913861","https://openalex.org/W2137591261","https://openalex.org/W2149917222","https://openalex.org/W2150551164","https://openalex.org/W2727420541","https://openalex.org/W2949662823","https://openalex.org/W2981300593","https://openalex.org/W4205461305","https://openalex.org/W4240069651","https://openalex.org/W4242360587","https://openalex.org/W4245448682"],"related_works":["https://openalex.org/W2127913861","https://openalex.org/W4231423517","https://openalex.org/W2010735430","https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598"],"abstract_inverted_index":{"In":[0,42,68,101],"semiconductor":[1],"manufacturing,":[2],"it":[3],"is":[4,52,97,160,168,239],"necessary":[5],"to":[6,17,39,92,170,241,247,254],"guarantee":[7],"the":[8,11,28,35,40,49,59,83,87,111,119,126,129,134,142,157,202,221,229,236,243,249,256,261],"reliability":[9],"of":[10,23,48,61,118,122,128,150,156,176,196,207,216,263],"produced":[12],"devices.":[13],"Latent":[14],"defects":[15],"have":[16],"be":[18,93,138],"screened":[19],"out":[20],"by":[21,99,146,214],"means":[22,215],"burn-in":[24,44,55,75,88,144,158,244,257],"(that":[25],"is,":[26],"stressing":[27],"devices":[29,51],"under":[30],"accelerated":[31],"life":[32],"conditions)":[33],"before":[34],"items":[36],"are":[37,72,80,181,212,233],"delivered":[38],"customers.":[41],"a":[43,46,63,106,147,154,185,193],"study,":[45],"sample":[47,251],"stressed":[50],"investigated":[53],"on":[54,132,228],"relevant":[56],"failures":[57,71,77,124],"with":[58,173],"aim":[60],"proving":[62],"target":[64,135],"failure":[65,113,264],"probability":[66,114],"level.":[67],"general,":[69],"zero":[70],"required;":[73],"if":[74],"related":[76],"occur,":[78],"countermeasures":[79,172],"implemented":[81],"in":[82,205,260],"production":[84],"process,":[85],"and":[86,246],"study":[89,145,159],"actually":[90],"has":[91],"restarted.":[94],"Countermeasure":[95],"effectiveness":[96,209],"assessed":[98],"experts.":[100],"this":[102],"paper,":[103],"we":[104,200],"propose":[105],"statistical":[107],"model":[108,167,238],"for":[109,192],"assessing":[110],"devices'":[112],"level,":[115],"taking":[116],"account":[117],"reduced":[120,148],"risk":[121],"early":[123],"after":[125],"implementation":[127],"countermeasures.":[130],"Based":[131],"that,":[133],"ppm-level":[136],"can":[137],"proven":[139],"when":[140],"extending":[141],"running":[143],"number":[149,195],"additional":[151,250],"inspections.":[152],"Therefore,":[153],"restart":[155],"no":[161],"longer":[162],"required.":[163],"A":[164],"Generalized":[165],"Binomial":[166],"applied":[169,240],"handle":[171],"different":[174],"amounts":[175],"effectiveness.":[177],"The":[178],"corresponding":[179],"probabilities":[180],"efficiently":[182],"computed,":[183],"exploiting":[184],"sequential":[186],"convolution":[187],"algorithm,":[188],"which":[189,211],"also":[190,259],"works":[191],"larger":[194],"possible":[197],"failures.":[198],"Furthermore,":[199],"discuss":[201],"modifications":[203],"needed":[204,253],"case":[206,262],"uncertain":[208],"values,":[210],"modeled":[213],"Beta":[217],"expert":[218],"distributions.":[219],"For":[220],"more":[222],"mathematically":[223],"inclined":[224],"reader,":[225],"some":[226],"details":[227],"model's":[230],"decision-theoretical":[231],"background":[232],"provided.":[234],"Finally,":[235],"proposed":[237],"reduce":[242],"time,":[245],"plan":[248],"size":[252],"continue":[255],"studies":[258],"occurrences.":[265]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}