{"id":"https://openalex.org/W2083518315","doi":"https://doi.org/10.1109/tr.2014.2315914","title":"Detection and Reliability Risks of Counterfeit Electrolytic Capacitors","display_name":"Detection and Reliability Risks of Counterfeit Electrolytic Capacitors","publication_year":2014,"publication_date":"2014-04-15","ids":{"openalex":"https://openalex.org/W2083518315","doi":"https://doi.org/10.1109/tr.2014.2315914","mag":"2083518315"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2014.2315914","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2014.2315914","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033098269","display_name":"Anshul Shrivastava","orcid":"https://orcid.org/0000-0002-4144-8528"},"institutions":[{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Anshul Shrivastava","raw_affiliation_strings":["CALCE, University of Maryland, College Park, MD, USA","CALCE, Center for Advanced Life Cycle Engineering, Mechanical Engineering Department, University of Maryland, College Park, MD, USA"],"affiliations":[{"raw_affiliation_string":"CALCE, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I66946132"]},{"raw_affiliation_string":"CALCE, Center for Advanced Life Cycle Engineering, Mechanical Engineering Department, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I66946132"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000848090","display_name":"Michael H. Azarian","orcid":"https://orcid.org/0000-0002-1434-6972"},"institutions":[{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael H. Azarian","raw_affiliation_strings":["CALCE, University of Maryland, College Park, MD, USA","CALCE, Center for Advanced Life Cycle Engineering, Mechanical Engineering Department, University of Maryland, College Park, MD, USA"],"affiliations":[{"raw_affiliation_string":"CALCE, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I66946132"]},{"raw_affiliation_string":"CALCE, Center for Advanced Life Cycle Engineering, Mechanical Engineering Department, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I66946132"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013254320","display_name":"Carlos Morillo","orcid":"https://orcid.org/0000-0001-5117-2716"},"institutions":[{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Carlos Morillo","raw_affiliation_strings":["CALCE, University of Maryland, College Park, MD, USA","CALCE, Center for Advanced Life Cycle Engineering, Mechanical Engineering Department, University of Maryland, College Park, MD, USA"],"affiliations":[{"raw_affiliation_string":"CALCE, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I66946132"]},{"raw_affiliation_string":"CALCE, Center for Advanced Life Cycle Engineering, Mechanical Engineering Department, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I66946132"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054938859","display_name":"Bhanu Sood","orcid":"https://orcid.org/0000-0002-0468-9074"},"institutions":[{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bhanu Sood","raw_affiliation_strings":["CALCE, University of Maryland, College Park, MD, USA","CALCE, Center for Advanced Life Cycle Engineering, Mechanical Engineering Department, University of Maryland, College Park, MD, USA"],"affiliations":[{"raw_affiliation_string":"CALCE, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I66946132"]},{"raw_affiliation_string":"CALCE, Center for Advanced Life Cycle Engineering, Mechanical Engineering Department, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I66946132"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013287421","display_name":"Michael Pecht","orcid":"https://orcid.org/0000-0003-1126-8662"},"institutions":[{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael Pecht","raw_affiliation_strings":["CALCE, University of Maryland, College Park, MD, USA","CALCE, Center for Advanced Life Cycle Engineering, Mechanical Engineering Department, University of Maryland, College Park, MD, USA"],"affiliations":[{"raw_affiliation_string":"CALCE, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I66946132"]},{"raw_affiliation_string":"CALCE, Center for Advanced Life Cycle Engineering, Mechanical Engineering Department, University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I66946132"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5033098269"],"corresponding_institution_ids":["https://openalex.org/I66946132"],"apc_list":null,"apc_paid":null,"fwci":4.3523,"has_fulltext":false,"cited_by_count":35,"citation_normalized_percentile":{"value":0.94238619,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"63","issue":"2","first_page":"468","last_page":"479"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9595000147819519,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.939300000667572,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/counterfeit","display_name":"Counterfeit","score":0.8471914529800415},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.7065205574035645},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5436223745346069},{"id":"https://openalex.org/keywords/electrolytic-capacitor","display_name":"Electrolytic capacitor","score":0.5194149017333984},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5159352421760559},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.47229841351509094},{"id":"https://openalex.org/keywords/electrolyte","display_name":"Electrolyte","score":0.4403547942638397},{"id":"https://openalex.org/keywords/process-engineering","display_name":"Process engineering","score":0.36914515495300293},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3499426543712616},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2925633192062378},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20013338327407837},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.1136462390422821},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.0746217668056488},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.05855739116668701},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.05805632472038269},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.05681702494621277}],"concepts":[{"id":"https://openalex.org/C2779356469","wikidata":"https://www.wikidata.org/wiki/Q502918","display_name":"Counterfeit","level":2,"score":0.8471914529800415},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.7065205574035645},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5436223745346069},{"id":"https://openalex.org/C79100374","wikidata":"https://www.wikidata.org/wiki/Q1326992","display_name":"Electrolytic capacitor","level":4,"score":0.5194149017333984},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5159352421760559},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.47229841351509094},{"id":"https://openalex.org/C68801617","wikidata":"https://www.wikidata.org/wiki/Q162908","display_name":"Electrolyte","level":3,"score":0.4403547942638397},{"id":"https://openalex.org/C21880701","wikidata":"https://www.wikidata.org/wiki/Q2144042","display_name":"Process engineering","level":1,"score":0.36914515495300293},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3499426543712616},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2925633192062378},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20013338327407837},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.1136462390422821},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0746217668056488},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.05855739116668701},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.05805632472038269},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.05681702494621277},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2014.2315914","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2014.2315914","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5400000214576721}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1504675529","https://openalex.org/W1555158165","https://openalex.org/W1597979459","https://openalex.org/W2020248850","https://openalex.org/W2076539064","https://openalex.org/W2096221993","https://openalex.org/W2106049364","https://openalex.org/W2153430703","https://openalex.org/W2164152592","https://openalex.org/W2344868634","https://openalex.org/W4246862236"],"related_works":["https://openalex.org/W1988437325","https://openalex.org/W1969544509","https://openalex.org/W2939139470","https://openalex.org/W2536788144","https://openalex.org/W2377409801","https://openalex.org/W2167108869","https://openalex.org/W2007755361","https://openalex.org/W2039437343","https://openalex.org/W2317423517","https://openalex.org/W2087200768"],"abstract_inverted_index":{"Counterfeit":[0],"electronics":[1,32],"have":[2],"been":[3],"reported":[4],"in":[5,30,76,80,86,168],"a":[6,22,114,162],"wide":[7],"range":[8],"of":[9,138,165,180,208,215],"products,":[10],"including":[11],"computers,":[12],"medical":[13,81],"equipment,":[14],"automobiles,":[15],"avionics,":[16],"and":[17,41,49,63,83,96,113,135,153,195,202,218,224],"military":[18],"systems.":[19],"Counterfeiting":[20],"is":[21],"growing":[23],"concern":[24],"for":[25,119,187,191,234],"original":[26],"equipment":[27],"manufacturers":[28],"(OEMs)":[29],"the":[31,87,91,139,149,169,174,178,192,200,216,222],"industry.":[33],"Even":[34],"inexpensive":[35],"passive":[36],"components":[37,93],"such":[38],"as":[39],"capacitors":[40,71],"resistors":[42],"are":[43],"frequently":[44],"found":[45],"to":[46,100,147,160,232],"be":[47,229],"counterfeit,":[48],"their":[50,97],"incorporation":[51],"into":[52],"electronic":[53],"assemblies":[54],"can":[55,228],"cause":[56],"early":[57],"failures":[58],"with":[59],"potentially":[60],"serious":[61],"economic":[62],"safety":[64],"implications.":[65],"This":[66,105],"study":[67],"examines":[68],"counterfeit":[69,92,116,170,188,235],"electrolytic":[70,120,236],"that":[72],"were":[73,94,206],"unknowingly":[74],"assembled":[75],"power":[77],"supplies":[78],"used":[79],"devices,":[82],"then":[84],"failed":[85],"field.":[88],"Upon":[89],"analysis,":[90],"identified,":[95],"reliability":[98,110,154],"relative":[99],"genuine":[101],"parts":[102,189],"was":[103,157,185],"assessed.":[104],"paper":[106],"presents":[107],"an":[108],"offline":[109],"assessment":[111],"methodology":[112,118],"systematic":[115],"detection":[117],"capacitors,":[121],"which":[122],"include":[123],"optical":[124],"inspection,":[125],"X-Ray":[126],"examination,":[127],"weight":[128],"measurement,":[129,177],"electrical":[130,175,197,219],"parameter":[131],"measurement":[132],"over":[133],"temperature,":[134,227],"chemical":[136],"characterization":[137],"electrolyte":[140,217],"using":[141],"Fourier":[142],"Transform":[143],"Infrared":[144],"Spectroscopy":[145],"(FTIR)":[146],"assess":[148],"failure":[150],"modes,":[151],"mechanisms,":[152],"risks.":[155],"FTIR":[156,213],"successfully":[158],"able":[159],"detect":[161],"lower":[163],"concentration":[164],"ethylene":[166],"glycol":[167],"capacitor":[171],"electrolyte.":[172],"In":[173],"properties":[176],"distribution":[179],"values":[181],"at":[182,199,221],"room":[183],"temperature":[184],"broader":[186],"than":[190],"authentic":[193],"parts,":[194],"some":[196],"parameters":[198],"maximum":[201],"minimum":[203],"rated":[204,226],"temperatures":[205],"out":[207],"specifications.":[209],"These":[210],"techniques,":[211],"particularly":[212],"analysis":[214],"measurements":[220],"lowest":[223],"highest":[225],"very":[230],"effective":[231],"screen":[233],"capacitors.":[237]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2020,"cited_by_count":8},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}