{"id":"https://openalex.org/W2020772053","doi":"https://doi.org/10.1109/tr.2014.2313807","title":"Modeling Dependence Between Two Multi-State Components via Copulas","display_name":"Modeling Dependence Between Two Multi-State Components via Copulas","publication_year":2014,"publication_date":"2014-04-07","ids":{"openalex":"https://openalex.org/W2020772053","doi":"https://doi.org/10.1109/tr.2014.2313807","mag":"2020772053"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2014.2313807","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2014.2313807","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062887905","display_name":"Serkan Ery\u0131lmaz","orcid":"https://orcid.org/0000-0002-2108-1781"},"institutions":[{"id":"https://openalex.org/I45542416","display_name":"Atilim University","ror":"https://ror.org/04pd3v454","country_code":"TR","type":"education","lineage":["https://openalex.org/I45542416"]}],"countries":["TR"],"is_corresponding":true,"raw_author_name":"Serkan Eryilmaz","raw_affiliation_strings":["Department of Industrial Engineering, Atilim University, Incek, Ankara, Turkey","Dept. of Ind. Eng., Atilim Univ., Ankara, Turkey"],"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, Atilim University, Incek, Ankara, Turkey","institution_ids":["https://openalex.org/I45542416"]},{"raw_affiliation_string":"Dept. of Ind. Eng., Atilim Univ., Ankara, Turkey","institution_ids":["https://openalex.org/I45542416"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5062887905"],"corresponding_institution_ids":["https://openalex.org/I45542416"],"apc_list":null,"apc_paid":null,"fwci":5.8003,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.95088141,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"63","issue":"3","first_page":"715","last_page":"720"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.6400448083877563},{"id":"https://openalex.org/keywords/markov-process","display_name":"Markov process","score":0.6017078161239624},{"id":"https://openalex.org/keywords/binary-number","display_name":"Binary number","score":0.5657111406326294},{"id":"https://openalex.org/keywords/copula","display_name":"Copula (linguistics)","score":0.5514675974845886},{"id":"https://openalex.org/keywords/statistical-physics","display_name":"Statistical physics","score":0.5436988472938538},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49771955609321594},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.48734578490257263},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.4669448137283325},{"id":"https://openalex.org/keywords/systems-modeling","display_name":"Systems modeling","score":0.41701504588127136},{"id":"https://openalex.org/keywords/applied-mathematics","display_name":"Applied mathematics","score":0.36717522144317627},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.36469778418540955},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3182169795036316},{"id":"https://openalex.org/keywords/econometrics","display_name":"Econometrics","score":0.1908976137638092},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.17935305833816528},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.15258657932281494},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.1367219090461731},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13549348711967468},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11418569087982178},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.09059372544288635}],"concepts":[{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.6400448083877563},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.6017078161239624},{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.5657111406326294},{"id":"https://openalex.org/C17618745","wikidata":"https://www.wikidata.org/wiki/Q207509","display_name":"Copula (linguistics)","level":2,"score":0.5514675974845886},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.5436988472938538},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49771955609321594},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.48734578490257263},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.4669448137283325},{"id":"https://openalex.org/C110963975","wikidata":"https://www.wikidata.org/wiki/Q12070446","display_name":"Systems modeling","level":2,"score":0.41701504588127136},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.36717522144317627},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.36469778418540955},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3182169795036316},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.1908976137638092},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.17935305833816528},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.15258657932281494},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.1367219090461731},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13549348711967468},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11418569087982178},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.09059372544288635},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2014.2313807","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2014.2313807","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1979592658","https://openalex.org/W1995373625","https://openalex.org/W2004839758","https://openalex.org/W2030246750","https://openalex.org/W2031812418","https://openalex.org/W2037723443","https://openalex.org/W2053937352","https://openalex.org/W2064170826","https://openalex.org/W2076007999","https://openalex.org/W2079252038","https://openalex.org/W2096708537","https://openalex.org/W2111878440","https://openalex.org/W2126162328","https://openalex.org/W2144519710","https://openalex.org/W2164910408","https://openalex.org/W4229663176","https://openalex.org/W6649074157"],"related_works":["https://openalex.org/W4254184784","https://openalex.org/W2379651310","https://openalex.org/W2113019827","https://openalex.org/W1541249122","https://openalex.org/W2413828414","https://openalex.org/W2367222340","https://openalex.org/W1989738468","https://openalex.org/W2096344948","https://openalex.org/W647171128","https://openalex.org/W2168579407"],"abstract_inverted_index":{"Modeling":[0],"statistical":[1],"dependence":[2],"between":[3,38],"two":[4,39,68],"systems":[5,24],"or":[6],"components":[7,82],"is":[8,44],"an":[9],"important":[10],"problem":[11,17],"in":[12,80],"reliability":[13],"theory.":[14],"Such":[15],"a":[16,33,84],"has":[18],"been":[19],"well":[20],"studied":[21],"for":[22,35,55,61,74],"binary":[23],"and":[25,70],"components.":[26,41],"In":[27],"the":[28,47,62,67,72,75,78],"present":[29],"paper,":[30],"we":[31],"provide":[32],"way":[34],"modeling":[36,56],"s-dependence":[37],"multi-state":[40],"Our":[42],"method":[43],"based":[45],"on":[46],"use":[48],"of":[49,66],"copulas":[50],"which":[51],"are":[52],"very":[53],"popular":[54],"s-dependence.":[57],"We":[58],"obtain":[59],"expressions":[60],"joint":[63],"state":[64],"probabilities":[65],"components,":[69],"illustrate":[71],"results":[73],"case":[76],"when":[77],"degradation":[79],"both":[81],"follows":[83],"Markov":[85],"process.":[86]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}