{"id":"https://openalex.org/W2044205497","doi":"https://doi.org/10.1109/tr.2014.2313707","title":"Goodness-of-Fit Tests for the Birnbaum-Saunders Distribution With Censored Reliability Data","display_name":"Goodness-of-Fit Tests for the Birnbaum-Saunders Distribution With Censored Reliability Data","publication_year":2014,"publication_date":"2014-04-08","ids":{"openalex":"https://openalex.org/W2044205497","doi":"https://doi.org/10.1109/tr.2014.2313707","mag":"2044205497"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2014.2313707","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2014.2313707","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://americanae.aecid.es/americanae/es/registros/registro.do?tipoRegistro=MTD&idBib=3261959","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075476183","display_name":"Michelli Barros","orcid":null},"institutions":[{"id":"https://openalex.org/I41455075","display_name":"Universidade Federal de Campina Grande","ror":"https://ror.org/00eftnx64","country_code":"BR","type":"education","lineage":["https://openalex.org/I41455075"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"Michelli Barros","raw_affiliation_strings":["Departamento de Estat\u0131\u00b4stica, Universidade Federal de Campina Grande, Brazil","[Departamento de Estat\u0131\u00b4stica, Universidade Federal de Campina Grande, Brazil]"],"affiliations":[{"raw_affiliation_string":"Departamento de Estat\u0131\u00b4stica, Universidade Federal de Campina Grande, Brazil","institution_ids":["https://openalex.org/I41455075"]},{"raw_affiliation_string":"[Departamento de Estat\u0131\u00b4stica, Universidade Federal de Campina Grande, Brazil]","institution_ids":["https://openalex.org/I41455075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037117333","display_name":"V\u00edctor Leiva","orcid":"https://orcid.org/0000-0003-4755-3270"},"institutions":[{"id":"https://openalex.org/I79274474","display_name":"University of Valpara\u00edso","ror":"https://ror.org/00h9jrb69","country_code":"CL","type":"education","lineage":["https://openalex.org/I79274474"]},{"id":"https://openalex.org/I10457146","display_name":"Universidad de Santiago de Chile","ror":"https://ror.org/02ma57s91","country_code":"CL","type":"education","lineage":["https://openalex.org/I10457146"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Victor Leiva","raw_affiliation_strings":["Departamento de Estad\u0131\u00b4stica, Universidad de Valpara\u0131\u00b4so, Valpara\u0131\u00b4so, Chile","Departamento de Estad\u0131\u00b4stica, Universidad de Valpara\u00bf\u00bfso, Valpara\u0131\u00b4so, Chile"],"affiliations":[{"raw_affiliation_string":"Departamento de Estad\u0131\u00b4stica, Universidad de Valpara\u0131\u00b4so, Valpara\u0131\u00b4so, Chile","institution_ids":["https://openalex.org/I10457146"]},{"raw_affiliation_string":"Departamento de Estad\u0131\u00b4stica, Universidad de Valpara\u00bf\u00bfso, Valpara\u0131\u00b4so, Chile","institution_ids":["https://openalex.org/I79274474"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078073624","display_name":"Raydonal Ospina","orcid":"https://orcid.org/0000-0002-9884-9090"},"institutions":[{"id":"https://openalex.org/I25112270","display_name":"Universidade Federal de Pernambuco","ror":"https://ror.org/047908t24","country_code":"BR","type":"education","lineage":["https://openalex.org/I25112270"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Raydonal Ospina","raw_affiliation_strings":["Departamento de Estat\u0131\u00b4stica, Universidade Federal de Pernambuco, Brazil","[Departamento de Estat\u0131\u00b4stica, Universidade Federal de Pernambuco, Brazil]"],"affiliations":[{"raw_affiliation_string":"Departamento de Estat\u0131\u00b4stica, Universidade Federal de Pernambuco, Brazil","institution_ids":["https://openalex.org/I25112270"]},{"raw_affiliation_string":"[Departamento de Estat\u0131\u00b4stica, Universidade Federal de Pernambuco, Brazil]","institution_ids":["https://openalex.org/I25112270"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013265332","display_name":"Aline Barbosa Tsuyuguchi","orcid":null},"institutions":[{"id":"https://openalex.org/I17974374","display_name":"Universidade de S\u00e3o Paulo","ror":"https://ror.org/036rp1748","country_code":"BR","type":"education","lineage":["https://openalex.org/I17974374"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Aline Tsuyuguchi","raw_affiliation_strings":["Universidade de S\u00e3o Paulo, Brazil"],"affiliations":[{"raw_affiliation_string":"Universidade de S\u00e3o Paulo, Brazil","institution_ids":["https://openalex.org/I17974374"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5075476183"],"corresponding_institution_ids":["https://openalex.org/I41455075"],"apc_list":null,"apc_paid":null,"fwci":6.8366,"has_fulltext":false,"cited_by_count":41,"citation_normalized_percentile":{"value":0.97207202,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"63","issue":"2","first_page":"543","last_page":"554"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9801999926567078,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10243","display_name":"Statistical Methods and Bayesian Inference","score":0.9629999995231628,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/goodness-of-fit","display_name":"Goodness of fit","score":0.9018948674201965},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.680689811706543},{"id":"https://openalex.org/keywords/anderson\u2013darling-test","display_name":"Anderson\u2013Darling test","score":0.6436018943786621},{"id":"https://openalex.org/keywords/kolmogorov\u2013smirnov-test","display_name":"Kolmogorov\u2013Smirnov test","score":0.6060900688171387},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5686516165733337},{"id":"https://openalex.org/keywords/empirical-distribution-function","display_name":"Empirical distribution function","score":0.5047184228897095},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.49619632959365845},{"id":"https://openalex.org/keywords/econometrics","display_name":"Econometrics","score":0.4445369839668274},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.43787938356399536},{"id":"https://openalex.org/keywords/statistical-hypothesis-testing","display_name":"Statistical hypothesis testing","score":0.3582318425178528},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.16595420241355896}],"concepts":[{"id":"https://openalex.org/C132480984","wikidata":"https://www.wikidata.org/wiki/Q2034239","display_name":"Goodness of fit","level":2,"score":0.9018948674201965},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.680689811706543},{"id":"https://openalex.org/C187758679","wikidata":"https://www.wikidata.org/wiki/Q491401","display_name":"Anderson\u2013Darling test","level":4,"score":0.6436018943786621},{"id":"https://openalex.org/C82581908","wikidata":"https://www.wikidata.org/wiki/Q575766","display_name":"Kolmogorov\u2013Smirnov test","level":3,"score":0.6060900688171387},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5686516165733337},{"id":"https://openalex.org/C98385598","wikidata":"https://www.wikidata.org/wiki/Q1339385","display_name":"Empirical distribution function","level":2,"score":0.5047184228897095},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.49619632959365845},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.4445369839668274},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.43787938356399536},{"id":"https://openalex.org/C87007009","wikidata":"https://www.wikidata.org/wiki/Q210832","display_name":"Statistical hypothesis testing","level":2,"score":0.3582318425178528},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.16595420241355896},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tr.2014.2313707","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2014.2313707","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},{"id":"pmh:oai:americanae.aecid.es:3261959","is_oa":true,"landing_page_url":"http://americanae.aecid.es/americanae/es/registros/registro.do?tipoRegistro=MTD&idBib=3261959","pdf_url":null,"source":{"id":"https://openalex.org/S4306400786","display_name":"Americanae (AECID Library)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE TRANSACTIONS ON RELIABILITY","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:localhost:10533/136324","is_oa":true,"landing_page_url":"http://hdl.handle.net/10533/136324","pdf_url":null,"source":{"id":"https://openalex.org/S4306402641","display_name":"LA Referencia (Red Federada de Repositorios Institucionales de Publicaciones Cient\u00edficas)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4383465926","host_organization_name":"LA Referencia","host_organization_lineage":["https://openalex.org/I4383465926"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE TRANSACTIONS ON RELIABILITY","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:americanae.aecid.es:3261959","is_oa":true,"landing_page_url":"http://americanae.aecid.es/americanae/es/registros/registro.do?tipoRegistro=MTD&idBib=3261959","pdf_url":null,"source":{"id":"https://openalex.org/S4306400786","display_name":"Americanae (AECID Library)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE TRANSACTIONS ON RELIABILITY","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[{"score":0.49000000953674316,"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16"},{"score":0.4399999976158142,"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":65,"referenced_works":["https://openalex.org/W193160530","https://openalex.org/W1963759348","https://openalex.org/W1968305370","https://openalex.org/W1975644945","https://openalex.org/W1978808358","https://openalex.org/W1982521883","https://openalex.org/W1984043109","https://openalex.org/W1991567646","https://openalex.org/W1994033230","https://openalex.org/W1998116117","https://openalex.org/W2005944024","https://openalex.org/W2006124372","https://openalex.org/W2006801420","https://openalex.org/W2009371792","https://openalex.org/W2010258135","https://openalex.org/W2014696951","https://openalex.org/W2018471006","https://openalex.org/W2020002779","https://openalex.org/W2020592468","https://openalex.org/W2025253718","https://openalex.org/W2033380481","https://openalex.org/W2034414512","https://openalex.org/W2038102608","https://openalex.org/W2039557825","https://openalex.org/W2042642822","https://openalex.org/W2051619945","https://openalex.org/W2055170967","https://openalex.org/W2055458890","https://openalex.org/W2059781142","https://openalex.org/W2060308631","https://openalex.org/W2062614551","https://openalex.org/W2063042325","https://openalex.org/W2063392136","https://openalex.org/W2070391491","https://openalex.org/W2078223516","https://openalex.org/W2085242246","https://openalex.org/W2092400191","https://openalex.org/W2093481047","https://openalex.org/W2103411940","https://openalex.org/W2115931340","https://openalex.org/W2116651711","https://openalex.org/W2120603381","https://openalex.org/W2123679406","https://openalex.org/W2125955937","https://openalex.org/W2126957488","https://openalex.org/W2133621969","https://openalex.org/W2146626342","https://openalex.org/W2150645435","https://openalex.org/W2151318425","https://openalex.org/W2152559857","https://openalex.org/W2154570857","https://openalex.org/W2165036375","https://openalex.org/W2165112171","https://openalex.org/W2166397424","https://openalex.org/W2169093352","https://openalex.org/W2181393575","https://openalex.org/W2796537448","https://openalex.org/W4234227668","https://openalex.org/W4235142304","https://openalex.org/W4243838499","https://openalex.org/W4252277490","https://openalex.org/W4252426897","https://openalex.org/W4254156697","https://openalex.org/W4298275894","https://openalex.org/W6678935497"],"related_works":["https://openalex.org/W2516851399","https://openalex.org/W1573082456","https://openalex.org/W2093676631","https://openalex.org/W1747521594","https://openalex.org/W2002322701","https://openalex.org/W2401682248","https://openalex.org/W3083497360","https://openalex.org/W2160552830","https://openalex.org/W2005913644","https://openalex.org/W2001582435"],"abstract_inverted_index":{"We":[0],"propose":[1],"goodness-of-fit":[2,13],"tests":[3,14],"for":[4],"Birnbaum-Saunders":[5],"distributions":[6],"with":[7],"type-II":[8],"right":[9],"censored":[10,30,47],"data.":[11,49],"Classical":[12],"based":[15],"on":[16],"the":[17],"empirical":[18],"distribution,":[19],"such":[20],"as":[21],"Anderson-Darling,":[22],"Cram\u00e9r-von":[23],"Misses,":[24],"and":[25,32],"Kolmogorov-Smirnov,":[26],"are":[27,43],"adapted":[28],"to":[29,45],"data,":[31],"evaluated":[33],"by":[34],"means":[35],"of":[36],"a":[37],"simulation":[38],"study.":[39],"The":[40],"obtained":[41],"results":[42],"applied":[44],"real-world":[46],"reliability":[48]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":12},{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}