{"id":"https://openalex.org/W2018990633","doi":"https://doi.org/10.1109/tr.2014.2299673","title":"A New Efficient Approach to Search for All Multi-State Minimal Cuts","display_name":"A New Efficient Approach to Search for All Multi-State Minimal Cuts","publication_year":2014,"publication_date":"2014-02-27","ids":{"openalex":"https://openalex.org/W2018990633","doi":"https://doi.org/10.1109/tr.2014.2299673","mag":"2018990633"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2014.2299673","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2014.2299673","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089571289","display_name":"Majid Forghani-elahabad","orcid":"https://orcid.org/0000-0003-1691-7633"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Majid Forghani-elahabad","raw_affiliation_strings":["Faculty of Mathematical Sciences, Sharif University of Technology, Tehran, Iran","Fac. of Math. Sci., Sharif Univ. of Technol., Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Faculty of Mathematical Sciences, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]},{"raw_affiliation_string":"Fac. of Math. Sci., Sharif Univ. of Technol., Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062019109","display_name":"Nezam Mahdavi\u2010Amiri","orcid":"https://orcid.org/0000-0002-2763-4279"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Nezam Mahdavi-Amiri","raw_affiliation_strings":["Faculty of Mathematical Sciences, Sharif University of Technology, Tehran, Iran","Fac. of Math. Sci., Sharif Univ. of Technol., Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Faculty of Mathematical Sciences, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]},{"raw_affiliation_string":"Fac. of Math. Sci., Sharif Univ. of Technol., Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5089571289"],"corresponding_institution_ids":["https://openalex.org/I133529467"],"apc_list":null,"apc_paid":null,"fwci":14.7135,"has_fulltext":false,"cited_by_count":72,"citation_normalized_percentile":{"value":0.98943983,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"63","issue":"1","first_page":"154","last_page":"166"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7659862637519836},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5819127559661865},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5211524963378906},{"id":"https://openalex.org/keywords/computational-complexity-theory","display_name":"Computational complexity theory","score":0.5084952116012573},{"id":"https://openalex.org/keywords/terminal","display_name":"Terminal (telecommunication)","score":0.4866383969783783},{"id":"https://openalex.org/keywords/flow-network","display_name":"Flow network","score":0.465164452791214},{"id":"https://openalex.org/keywords/maximum-flow-problem","display_name":"Maximum flow problem","score":0.4615921974182129},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.4356754720211029},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.4103260934352875},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.3420841693878174},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.3347465991973877},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.29013222455978394},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.20655187964439392},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.11375612020492554},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1048622727394104}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7659862637519836},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5819127559661865},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5211524963378906},{"id":"https://openalex.org/C179799912","wikidata":"https://www.wikidata.org/wiki/Q205084","display_name":"Computational complexity theory","level":2,"score":0.5084952116012573},{"id":"https://openalex.org/C2779664074","wikidata":"https://www.wikidata.org/wiki/Q3518405","display_name":"Terminal (telecommunication)","level":2,"score":0.4866383969783783},{"id":"https://openalex.org/C114809511","wikidata":"https://www.wikidata.org/wiki/Q1412924","display_name":"Flow network","level":2,"score":0.465164452791214},{"id":"https://openalex.org/C157469704","wikidata":"https://www.wikidata.org/wiki/Q2585642","display_name":"Maximum flow problem","level":2,"score":0.4615921974182129},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.4356754720211029},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4103260934352875},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.3420841693878174},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.3347465991973877},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.29013222455978394},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.20655187964439392},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.11375612020492554},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1048622727394104},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2014.2299673","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2014.2299673","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities","score":0.8299999833106995}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321157","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1481156553","https://openalex.org/W1970251936","https://openalex.org/W1980381676","https://openalex.org/W1982620287","https://openalex.org/W1991536882","https://openalex.org/W2027665967","https://openalex.org/W2037982552","https://openalex.org/W2044153024","https://openalex.org/W2056788739","https://openalex.org/W2071273467","https://openalex.org/W2076716761","https://openalex.org/W2083592025","https://openalex.org/W2104109499","https://openalex.org/W2109998235","https://openalex.org/W2110308097","https://openalex.org/W2111525031","https://openalex.org/W2113136889","https://openalex.org/W2134858346","https://openalex.org/W2136093791","https://openalex.org/W2138390663","https://openalex.org/W2149454052","https://openalex.org/W2154173356","https://openalex.org/W2154288871","https://openalex.org/W2154580710","https://openalex.org/W2159461715","https://openalex.org/W2160702617","https://openalex.org/W2162375021","https://openalex.org/W2169845564","https://openalex.org/W2170346404","https://openalex.org/W2800297070","https://openalex.org/W3148070887","https://openalex.org/W3182208082","https://openalex.org/W4213060235","https://openalex.org/W6682412569"],"related_works":["https://openalex.org/W2375873432","https://openalex.org/W4206915070","https://openalex.org/W2531764854","https://openalex.org/W3161514703","https://openalex.org/W2141299097","https://openalex.org/W2138322984","https://openalex.org/W1851375266","https://openalex.org/W2610002854","https://openalex.org/W3141113327","https://openalex.org/W4206407367"],"abstract_inverted_index":{"There":[0],"are":[1,26,70,135],"several":[2],"exact":[3],"or":[4],"approximating":[5],"approaches":[6],"that":[7],"apply":[8],"d-MinCuts":[9],"(":[10],"d-MCs)":[11],"to":[12,48,73,119],"compute":[13],"multistate":[14],"two-terminal":[15],"reliability.":[16,31],"Searching":[17],"for":[18,28],"and":[19,38,89,147],"determining":[20],"d-MCs":[21,81,100],"in":[22,62,82,90,137],"a":[23,83,91,109],"stochastic-flow":[24],"network":[25,84,92,111],"important":[27],"computing":[29],"system":[30,106],"Here,":[32],"by":[33,102,114,145],"investigating":[34],"the":[35,51,56,76,80,99,103,105,115,121,125,138,141],"existing":[36,66],"methods":[37],"using":[39,98,124],"our":[40],"new":[41,57,126],"results,":[42],"an":[43],"efficient":[44],"algorithm":[45,58,77],"is":[46,112],"proposed":[47],"find":[49],"all":[50,79],"d-MCs.":[52],"The":[53],"complexity":[54],"of":[55,94,108,123,140],"illustrates":[59],"its":[60],"efficiency":[61],"comparison":[63],"with":[64,86],"other":[65],"algorithms.":[67],"Two":[68],"examples":[69],"worked":[71],"out":[72],"show":[74],"how":[75],"determines":[78],"flow":[85,93],"unreliable":[87],"nodes,":[88],"moderate":[95],"size.":[96],"Moreover,":[97],"found":[101],"algorithm,":[104],"reliability":[107],"sample":[110],"computed":[113],"inclusion-exclusion":[116],"method.":[117],"Finally,":[118],"illustrate":[120],"efficacy":[122],"presented":[127],"techniques,":[128],"computational":[129],"results":[130],"on":[131],"random":[132],"test":[133],"problems":[134],"provided":[136],"sense":[139],"performance":[142],"profile":[143],"introduced":[144],"Dolan":[146],"Mor\u00e9.":[148]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":7},{"year":2014,"cited_by_count":1}],"updated_date":"2026-03-17T09:09:15.849793","created_date":"2025-10-10T00:00:00"}